Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry
A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electron microscopy and X-ray diffractometry has been performed. It has been established that the...
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| Veröffentlicht in: | Technical physics letters 2021-12, Vol.47 (12), p.893-896 |
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| container_issue | 12 |
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| container_title | Technical physics letters |
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| creator | Sorokin, L. M. Kyutt, R. N. Ratnikov, V. V. Kalmykov, A. E. |
| description | A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electron microscopy and X-ray diffractometry has been performed. It has been established that the superlattice is in a pseudomorphic state and a lateral inhomogeneity with a fragment size of 10–40 nm has been found. The reason for the broadening of the main and satellite peaks of the superlattice on the diffraction curve (111) has been elucidated. |
| doi_str_mv | 10.1134/S1063785021080125 |
| format | Article |
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M. ; Kyutt, R. N. ; Ratnikov, V. V. ; Kalmykov, A. E.</creator><creatorcontrib>Sorokin, L. M. ; Kyutt, R. N. ; Ratnikov, V. V. ; Kalmykov, A. E.</creatorcontrib><description>A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electron microscopy and X-ray diffractometry has been performed. It has been established that the superlattice is in a pseudomorphic state and a lateral inhomogeneity with a fragment size of 10–40 nm has been found. The reason for the broadening of the main and satellite peaks of the superlattice on the diffraction curve (111) has been elucidated.</description><identifier>ISSN: 1063-7850</identifier><identifier>EISSN: 1090-6533</identifier><identifier>DOI: 10.1134/S1063785021080125</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Cadmium fluorides ; Calcium fluoride ; Classical and Continuum Physics ; Diffraction ; Electron microscopes ; Epitaxial growth ; Fluorides ; Heterostructures ; Inhomogeneity ; Molecular beam epitaxy ; Physics ; Physics and Astronomy ; Silicon substrates ; Structural analysis ; Superlattices ; Transmission electron microscopy</subject><ispartof>Technical physics letters, 2021-12, Vol.47 (12), p.893-896</ispartof><rights>Pleiades Publishing, Ltd. 2021. ISSN 1063-7850, Technical Physics Letters, 2021, Vol. 47, No. 12, pp. 893–896. © Pleiades Publishing, Ltd., 2021. 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E.</creatorcontrib><title>Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry</title><title>Technical physics letters</title><addtitle>Tech. Phys. Lett</addtitle><description>A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electron microscopy and X-ray diffractometry has been performed. It has been established that the superlattice is in a pseudomorphic state and a lateral inhomogeneity with a fragment size of 10–40 nm has been found. The reason for the broadening of the main and satellite peaks of the superlattice on the diffraction curve (111) has been elucidated.</description><subject>Cadmium fluorides</subject><subject>Calcium fluoride</subject><subject>Classical and Continuum Physics</subject><subject>Diffraction</subject><subject>Electron microscopes</subject><subject>Epitaxial growth</subject><subject>Fluorides</subject><subject>Heterostructures</subject><subject>Inhomogeneity</subject><subject>Molecular beam epitaxy</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Silicon substrates</subject><subject>Structural analysis</subject><subject>Superlattices</subject><subject>Transmission electron microscopy</subject><issn>1063-7850</issn><issn>1090-6533</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp1kUFPwyAUxxujiTr9AN5IvOih-oBCx1HrpiYajdXEW8MouC5bmUAP9QP5OaXZEg_GC7zA7__jkZckJxguMKbZZYmB03zMgGAYAyZsJznAICDljNLdoeY0He73k0PvFwAwJkwcJN9lcJ0KnZNLVMylkypo13zJ0NgWWYMkKufWhfQ5ntoald1au6UMoVEaXUuvaxS5MNeoqKfkspBxKZszjPE5utNRZf3Wr9GsR69Otn7VeD_YJ0utgovFY6Mip-y6R7Kt0Xv6Int00xgzdGNXOrj-KNkzcun18XYfJW_TyWtxlz483d4XVw-pInwcUjETxIhM5FwyoXJNefwlp0ZlmInaCM5qiusMGGEGgANWgmd4llOWMUmB0lFyuvGunf3stA_VwnaujU9WhMccE5DxSOENNfTtnTbV2jUr6foKQzWMo_ozjpghm4yPbPuh3a_5_9APHh6L4g</recordid><startdate>20211201</startdate><enddate>20211201</enddate><creator>Sorokin, L. 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Lett</stitle><date>2021-12-01</date><risdate>2021</risdate><volume>47</volume><issue>12</issue><spage>893</spage><epage>896</epage><pages>893-896</pages><issn>1063-7850</issn><eissn>1090-6533</eissn><abstract>A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electron microscopy and X-ray diffractometry has been performed. It has been established that the superlattice is in a pseudomorphic state and a lateral inhomogeneity with a fragment size of 10–40 nm has been found. The reason for the broadening of the main and satellite peaks of the superlattice on the diffraction curve (111) has been elucidated.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063785021080125</doi><tpages>4</tpages></addata></record> |
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| ispartof | Technical physics letters, 2021-12, Vol.47 (12), p.893-896 |
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| source | Springer Nature - Complete Springer Journals |
| subjects | Cadmium fluorides Calcium fluoride Classical and Continuum Physics Diffraction Electron microscopes Epitaxial growth Fluorides Heterostructures Inhomogeneity Molecular beam epitaxy Physics Physics and Astronomy Silicon substrates Structural analysis Superlattices Transmission electron microscopy |
| title | Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry |
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