Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source
This article continues the series of publications that describe in detail the process of development, research, and implementation of circuit modeling and machine vision mechanisms in industrial equipment for laser trimming of resistors in order to obtain products with better characteristics and inc...
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| Veröffentlicht in: | Electronics (Basel) 2022-03, Vol.11 (5), p.767 |
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| container_title | Electronics (Basel) |
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| creator | Kondrashov, Vladimir V. Chapkin, Vyacheslav V. Seredin, Oleg S. Zemlyakov, Evgeny V. Pozdeeva, Ekaterina Yu |
| description | This article continues the series of publications that describe in detail the process of development, research, and implementation of circuit modeling and machine vision mechanisms in industrial equipment for laser trimming of resistors in order to obtain products with better characteristics and increase the economic efficiency of the process. A circuit model of the process of laser trimming of film-resistive elements under the action of a measuring voltage source, as well as an algorithm for correcting this model during laser trimming, has been developed. The paper considers the principles of building a circuit model of film resistor cutting. The conductive resistive medium is defined with the component equations and the topology of the circuit model. A method of estimating the electric parameters of a resistor operating in the system with a measuring voltage source is shown. An equation system for the node voltages is defined, and the resistive layer parameters are analyzed as the circuit model structure changes during the cutting process. |
| doi_str_mv | 10.3390/electronics11050767 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2637647287</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2637647287</sourcerecordid><originalsourceid>FETCH-LOGICAL-c272t-8734565b2310abb54ee15a6d62fddea9e85210f69fd3da27fc0207c6ec0aa4283</originalsourceid><addsrcrecordid>eNptkF9LwzAUxYMoOOY-gS8Bn6v50ybNowynQkXYpq8lTW9mRtvMJEX89nbMBx-8L-dyuZwf5yB0Tckt54rcQQcmBT84EyklBZFCnqEZI1Jliil2_me_RIsY92QaRXnJyQytly6Y0SW8cf3Y6eT8gL3FK9f1eA3RxeQDrnSEgLfB9b0bdvjLpQ-s8QvoOIbj4d13Se8Ab_wYDFyhC6u7CItfnaO31cN2-ZRVr4_Py_sqM0yylJWS54UoGsYp0U1T5AC00KIVzLYtaAVlwSixQtmWt5pJa8iUwwgwROuclXyObk6-h-A_R4ip3k_8YULWTHApcskmxhzx05cJPsYAtj5MOXT4rimpj_3V__THfwAN2WbA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2637647287</pqid></control><display><type>article</type><title>Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source</title><source>MDPI - Multidisciplinary Digital Publishing Institute</source><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>Kondrashov, Vladimir V. ; Chapkin, Vyacheslav V. ; Seredin, Oleg S. ; Zemlyakov, Evgeny V. ; Pozdeeva, Ekaterina Yu</creator><creatorcontrib>Kondrashov, Vladimir V. ; Chapkin, Vyacheslav V. ; Seredin, Oleg S. ; Zemlyakov, Evgeny V. ; Pozdeeva, Ekaterina Yu</creatorcontrib><description>This article continues the series of publications that describe in detail the process of development, research, and implementation of circuit modeling and machine vision mechanisms in industrial equipment for laser trimming of resistors in order to obtain products with better characteristics and increase the economic efficiency of the process. A circuit model of the process of laser trimming of film-resistive elements under the action of a measuring voltage source, as well as an algorithm for correcting this model during laser trimming, has been developed. The paper considers the principles of building a circuit model of film resistor cutting. The conductive resistive medium is defined with the component equations and the topology of the circuit model. A method of estimating the electric parameters of a resistor operating in the system with a measuring voltage source is shown. An equation system for the node voltages is defined, and the resistive layer parameters are analyzed as the circuit model structure changes during the cutting process.</description><identifier>ISSN: 2079-9292</identifier><identifier>EISSN: 2079-9292</identifier><identifier>DOI: 10.3390/electronics11050767</identifier><language>eng</language><publisher>Basel: MDPI AG</publisher><subject>Accuracy ; Algorithms ; Automation ; Circuits ; Cutting resistance ; Economic models ; Electrical measurement ; Finite element analysis ; Lasers ; Machine vision ; Mathematical models ; Parameters ; Resistors ; Simulation ; Thin films ; Topology ; Trimming</subject><ispartof>Electronics (Basel), 2022-03, Vol.11 (5), p.767</ispartof><rights>2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c272t-8734565b2310abb54ee15a6d62fddea9e85210f69fd3da27fc0207c6ec0aa4283</cites><orcidid>0000-0003-0410-7705 ; 0000-0002-1535-5571</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Kondrashov, Vladimir V.</creatorcontrib><creatorcontrib>Chapkin, Vyacheslav V.</creatorcontrib><creatorcontrib>Seredin, Oleg S.</creatorcontrib><creatorcontrib>Zemlyakov, Evgeny V.</creatorcontrib><creatorcontrib>Pozdeeva, Ekaterina Yu</creatorcontrib><title>Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source</title><title>Electronics (Basel)</title><description>This article continues the series of publications that describe in detail the process of development, research, and implementation of circuit modeling and machine vision mechanisms in industrial equipment for laser trimming of resistors in order to obtain products with better characteristics and increase the economic efficiency of the process. A circuit model of the process of laser trimming of film-resistive elements under the action of a measuring voltage source, as well as an algorithm for correcting this model during laser trimming, has been developed. The paper considers the principles of building a circuit model of film resistor cutting. The conductive resistive medium is defined with the component equations and the topology of the circuit model. A method of estimating the electric parameters of a resistor operating in the system with a measuring voltage source is shown. An equation system for the node voltages is defined, and the resistive layer parameters are analyzed as the circuit model structure changes during the cutting process.</description><subject>Accuracy</subject><subject>Algorithms</subject><subject>Automation</subject><subject>Circuits</subject><subject>Cutting resistance</subject><subject>Economic models</subject><subject>Electrical measurement</subject><subject>Finite element analysis</subject><subject>Lasers</subject><subject>Machine vision</subject><subject>Mathematical models</subject><subject>Parameters</subject><subject>Resistors</subject><subject>Simulation</subject><subject>Thin films</subject><subject>Topology</subject><subject>Trimming</subject><issn>2079-9292</issn><issn>2079-9292</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNptkF9LwzAUxYMoOOY-gS8Bn6v50ybNowynQkXYpq8lTW9mRtvMJEX89nbMBx-8L-dyuZwf5yB0Tckt54rcQQcmBT84EyklBZFCnqEZI1Jliil2_me_RIsY92QaRXnJyQytly6Y0SW8cf3Y6eT8gL3FK9f1eA3RxeQDrnSEgLfB9b0bdvjLpQ-s8QvoOIbj4d13Se8Ab_wYDFyhC6u7CItfnaO31cN2-ZRVr4_Py_sqM0yylJWS54UoGsYp0U1T5AC00KIVzLYtaAVlwSixQtmWt5pJa8iUwwgwROuclXyObk6-h-A_R4ip3k_8YULWTHApcskmxhzx05cJPsYAtj5MOXT4rimpj_3V__THfwAN2WbA</recordid><startdate>20220301</startdate><enddate>20220301</enddate><creator>Kondrashov, Vladimir V.</creator><creator>Chapkin, Vyacheslav V.</creator><creator>Seredin, Oleg S.</creator><creator>Zemlyakov, Evgeny V.</creator><creator>Pozdeeva, Ekaterina Yu</creator><general>MDPI AG</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><orcidid>https://orcid.org/0000-0003-0410-7705</orcidid><orcidid>https://orcid.org/0000-0002-1535-5571</orcidid></search><sort><creationdate>20220301</creationdate><title>Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source</title><author>Kondrashov, Vladimir V. ; Chapkin, Vyacheslav V. ; Seredin, Oleg S. ; Zemlyakov, Evgeny V. ; Pozdeeva, Ekaterina Yu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c272t-8734565b2310abb54ee15a6d62fddea9e85210f69fd3da27fc0207c6ec0aa4283</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Accuracy</topic><topic>Algorithms</topic><topic>Automation</topic><topic>Circuits</topic><topic>Cutting resistance</topic><topic>Economic models</topic><topic>Electrical measurement</topic><topic>Finite element analysis</topic><topic>Lasers</topic><topic>Machine vision</topic><topic>Mathematical models</topic><topic>Parameters</topic><topic>Resistors</topic><topic>Simulation</topic><topic>Thin films</topic><topic>Topology</topic><topic>Trimming</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kondrashov, Vladimir V.</creatorcontrib><creatorcontrib>Chapkin, Vyacheslav V.</creatorcontrib><creatorcontrib>Seredin, Oleg S.</creatorcontrib><creatorcontrib>Zemlyakov, Evgeny V.</creatorcontrib><creatorcontrib>Pozdeeva, Ekaterina Yu</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Electronics (Basel)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kondrashov, Vladimir V.</au><au>Chapkin, Vyacheslav V.</au><au>Seredin, Oleg S.</au><au>Zemlyakov, Evgeny V.</au><au>Pozdeeva, Ekaterina Yu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source</atitle><jtitle>Electronics (Basel)</jtitle><date>2022-03-01</date><risdate>2022</risdate><volume>11</volume><issue>5</issue><spage>767</spage><pages>767-</pages><issn>2079-9292</issn><eissn>2079-9292</eissn><abstract>This article continues the series of publications that describe in detail the process of development, research, and implementation of circuit modeling and machine vision mechanisms in industrial equipment for laser trimming of resistors in order to obtain products with better characteristics and increase the economic efficiency of the process. A circuit model of the process of laser trimming of film-resistive elements under the action of a measuring voltage source, as well as an algorithm for correcting this model during laser trimming, has been developed. The paper considers the principles of building a circuit model of film resistor cutting. The conductive resistive medium is defined with the component equations and the topology of the circuit model. A method of estimating the electric parameters of a resistor operating in the system with a measuring voltage source is shown. An equation system for the node voltages is defined, and the resistive layer parameters are analyzed as the circuit model structure changes during the cutting process.</abstract><cop>Basel</cop><pub>MDPI AG</pub><doi>10.3390/electronics11050767</doi><orcidid>https://orcid.org/0000-0003-0410-7705</orcidid><orcidid>https://orcid.org/0000-0002-1535-5571</orcidid><oa>free_for_read</oa></addata></record> |
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| ispartof | Electronics (Basel), 2022-03, Vol.11 (5), p.767 |
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| source | MDPI - Multidisciplinary Digital Publishing Institute; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals |
| subjects | Accuracy Algorithms Automation Circuits Cutting resistance Economic models Electrical measurement Finite element analysis Lasers Machine vision Mathematical models Parameters Resistors Simulation Thin films Topology Trimming |
| title | Circuit Simulation of Film Resistor Laser Trimming with a Measuring Voltage Source |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T15%3A32%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Circuit%20Simulation%20of%20Film%20Resistor%20Laser%20Trimming%20with%20a%20Measuring%20Voltage%20Source&rft.jtitle=Electronics%20(Basel)&rft.au=Kondrashov,%20Vladimir%20V.&rft.date=2022-03-01&rft.volume=11&rft.issue=5&rft.spage=767&rft.pages=767-&rft.issn=2079-9292&rft.eissn=2079-9292&rft_id=info:doi/10.3390/electronics11050767&rft_dat=%3Cproquest_cross%3E2637647287%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2637647287&rft_id=info:pmid/&rfr_iscdi=true |