Growth, Optical, and Scintillation Properties of (Gd0.4Lu0.6)8Sr2(SiO4)6O2 Crystals
Non-doped and 0.1, 0.5, 1.0, and 2.0% Ce-doped (Gd0.4Lu0.6)8Sr2(SiO4)6O2 crystals were prepared and their optical and scintillation properties were investigated. Their X-ray diffraction (XRD) patterns confirmed that the Ce-doped samples did not contain an impurity phase, whereas the non-doped one co...
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| Veröffentlicht in: | Sensors and materials 2022-02, Vol.34 (2), p.595 |
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| creator | Yanagida, Takayuki Kato, Takumi Nakauchi, Daisuke Kawaguchi, Noriaki |
| description | Non-doped and 0.1, 0.5, 1.0, and 2.0% Ce-doped (Gd0.4Lu0.6)8Sr2(SiO4)6O2 crystals were prepared and their optical and scintillation properties were investigated. Their X-ray diffraction (XRD) patterns confirmed that the Ce-doped samples did not contain an impurity phase, whereas the non-doped one contained some impurity phases such as Gd2SiO5 and Lu2SiO5. The emission due to 5d–4f transitions of Ce3+ was observed at 380–650 nm in both the photoluminescence (PL) and scintillation spectra of the Ce-doped samples. The scintillation light yields (LYs) of the 0.5 and 1.0% Ce-doped samples under 241Am α-ray irradiation were ~230 and ~620 ph/5.5 MeV-α, respectively. |
| doi_str_mv | 10.18494/SAM3684 |
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| source | DOAJ Directory of Open Access Journals; EZB-FREE-00999 freely available EZB journals; Alma/SFX Local Collection |
| subjects | Alpha rays Cerium Crystals Diffraction patterns Impurities Optical properties Photoluminescence Scintillation |
| title | Growth, Optical, and Scintillation Properties of (Gd0.4Lu0.6)8Sr2(SiO4)6O2 Crystals |
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