Optical Characterization of Phosphate Glass with Additional Aluminum/Tin Impurities
The optical properties of phosphate glass (PG) with two different impurities, namely, aluminum and tin, were investigated. Broad white luminescence was observed from PGs with tin and aluminum impurities under deep ultraviolet exposure. Through emission and excitation spectroscopy and decay curve mea...
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Veröffentlicht in: | Sensors and materials 2022-01, Vol.34 (2), p.735 |
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creator | Akiyama, Shun Sasaki, Aika Nakajima, Runa Hasegawa, Daichi Iizuka, Kazuya Kimura, Shigetaka Akagami, Tomoki Kitagawa, Yuichi Hanaizumi, Osamu Kada, Wataru |
description | The optical properties of phosphate glass (PG) with two different impurities, namely, aluminum and tin, were investigated. Broad white luminescence was observed from PGs with tin and aluminum impurities under deep ultraviolet exposure. Through emission and excitation spectroscopy and decay curve measurement, it is assumed that the origin of the broadband luminescence differs depending on the impurities introduced. In addition, time-resolved emission spectral analysis revealed the difference in decay constant at each wavelength. The results obtained in this study might give important information about two potential impurities of PG for a better understanding of background noise and the functions of widely used radiophotoluminescence (RPL) dosimeters. |
doi_str_mv | 10.18494/SAM3697 |
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Broad white luminescence was observed from PGs with tin and aluminum impurities under deep ultraviolet exposure. Through emission and excitation spectroscopy and decay curve measurement, it is assumed that the origin of the broadband luminescence differs depending on the impurities introduced. In addition, time-resolved emission spectral analysis revealed the difference in decay constant at each wavelength. The results obtained in this study might give important information about two potential impurities of PG for a better understanding of background noise and the functions of widely used radiophotoluminescence (RPL) dosimeters.</description><subject>Aluminum</subject><subject>Background noise</subject><subject>Broadband</subject><subject>Decay rate</subject><subject>Dosimeters</subject><subject>Emission analysis</subject><subject>Excitation spectra</subject><subject>Impurities</subject><subject>Luminescence</subject><subject>Optical properties</subject><subject>Phosphate glass</subject><subject>Spectrum analysis</subject><issn>0914-4935</issn><issn>2435-0869</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNotkE1LAzEQhoMoWGrBnxDw4mVtktnsJselaC1UKrSelzSbsCn7ZZJF9Ne72p7mMM_7zvAgdE_JExWpTJf74g0ymV-hGUuBJ0Rk8hrNiKRpkkrgt2gRwokQQgUnGctmaL8botOqwataeaWj8e5HRdd3uLf4ve7DUKto8LpRIeAvF2tcVJX7A6ZM0Yyt68Z2eXAd3rTD6KeNCXfoxqommMVlztHHy_Nh9Zpsd-vNqtgmGjiPiT5mWW7AAhfcEmEEzbmQCnIiCWjJrdYqPxKuBDMMmLC6YlAZMNpW1BCAOXo49w6-_xxNiOWpH_30WChZNp1gueDpRD2eKe37ELyx5eBdq_x3SUn5b628WINfBB1fCA</recordid><startdate>20220101</startdate><enddate>20220101</enddate><creator>Akiyama, Shun</creator><creator>Sasaki, Aika</creator><creator>Nakajima, Runa</creator><creator>Hasegawa, Daichi</creator><creator>Iizuka, Kazuya</creator><creator>Kimura, Shigetaka</creator><creator>Akagami, Tomoki</creator><creator>Kitagawa, Yuichi</creator><creator>Hanaizumi, Osamu</creator><creator>Kada, Wataru</creator><general>MYU Scientific Publishing Division</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7TB</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20220101</creationdate><title>Optical Characterization of Phosphate Glass with Additional Aluminum/Tin Impurities</title><author>Akiyama, Shun ; Sasaki, Aika ; Nakajima, Runa ; Hasegawa, Daichi ; Iizuka, Kazuya ; Kimura, Shigetaka ; Akagami, Tomoki ; Kitagawa, Yuichi ; Hanaizumi, Osamu ; Kada, Wataru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-cb667e3f3585f08e817589a370903c95fcca7b05a82e2328fcd23de3ecfd1e033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Aluminum</topic><topic>Background noise</topic><topic>Broadband</topic><topic>Decay rate</topic><topic>Dosimeters</topic><topic>Emission analysis</topic><topic>Excitation spectra</topic><topic>Impurities</topic><topic>Luminescence</topic><topic>Optical properties</topic><topic>Phosphate glass</topic><topic>Spectrum analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Akiyama, Shun</creatorcontrib><creatorcontrib>Sasaki, Aika</creatorcontrib><creatorcontrib>Nakajima, Runa</creatorcontrib><creatorcontrib>Hasegawa, Daichi</creatorcontrib><creatorcontrib>Iizuka, Kazuya</creatorcontrib><creatorcontrib>Kimura, Shigetaka</creatorcontrib><creatorcontrib>Akagami, Tomoki</creatorcontrib><creatorcontrib>Kitagawa, Yuichi</creatorcontrib><creatorcontrib>Hanaizumi, Osamu</creatorcontrib><creatorcontrib>Kada, Wataru</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Sensors and materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Akiyama, Shun</au><au>Sasaki, Aika</au><au>Nakajima, Runa</au><au>Hasegawa, Daichi</au><au>Iizuka, Kazuya</au><au>Kimura, Shigetaka</au><au>Akagami, Tomoki</au><au>Kitagawa, Yuichi</au><au>Hanaizumi, Osamu</au><au>Kada, Wataru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical Characterization of Phosphate Glass with Additional Aluminum/Tin Impurities</atitle><jtitle>Sensors and materials</jtitle><date>2022-01-01</date><risdate>2022</risdate><volume>34</volume><issue>2</issue><spage>735</spage><pages>735-</pages><issn>0914-4935</issn><eissn>2435-0869</eissn><abstract>The optical properties of phosphate glass (PG) with two different impurities, namely, aluminum and tin, were investigated. Broad white luminescence was observed from PGs with tin and aluminum impurities under deep ultraviolet exposure. Through emission and excitation spectroscopy and decay curve measurement, it is assumed that the origin of the broadband luminescence differs depending on the impurities introduced. In addition, time-resolved emission spectral analysis revealed the difference in decay constant at each wavelength. The results obtained in this study might give important information about two potential impurities of PG for a better understanding of background noise and the functions of widely used radiophotoluminescence (RPL) dosimeters.</abstract><cop>Tokyo</cop><pub>MYU Scientific Publishing Division</pub><doi>10.18494/SAM3697</doi><oa>free_for_read</oa></addata></record> |
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subjects | Aluminum Background noise Broadband Decay rate Dosimeters Emission analysis Excitation spectra Impurities Luminescence Optical properties Phosphate glass Spectrum analysis |
title | Optical Characterization of Phosphate Glass with Additional Aluminum/Tin Impurities |
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