Generalization of Limit Theorems for Connected-(r, s)-out-of- (m, n):F Lattice Systems
In the field of reliability engineering, many studies on the relationship of reliability between components and the entire system have been conducted since the 1960s. Various properties of large-scale systems can be studied by limit theorems. In addition, the limit theorem can provide an approximate...
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Veröffentlicht in: | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences Communications and Computer Sciences, 2022/03/01, Vol.E105.A(3), pp.562-570 |
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creator | YAMADA, Koki NAKAMURA, Taishin YAMAMOTO, Hisashi |
description | In the field of reliability engineering, many studies on the relationship of reliability between components and the entire system have been conducted since the 1960s. Various properties of large-scale systems can be studied by limit theorems. In addition, the limit theorem can provide an approximate system reliability. Existing studies have established the limit theorems of a connected-(r, s)-out-of-(m, n):F lattice system consisting of components with the same reliability. However, the existing limit theorems are constrained in terms of (a) the system shape and (b) the condition under which the theorem can be applied. Therefore, this study generalizes the existing limit theorems along the two aforementioned directions. The limit theorem established in this paper can be useful for revealing the properties of the reliability of a large-scale connected-(r, s)-out-of-(m, n):F lattice system. |
doi_str_mv | 10.1587/transfun.2020EAP1145 |
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Various properties of large-scale systems can be studied by limit theorems. In addition, the limit theorem can provide an approximate system reliability. Existing studies have established the limit theorems of a connected-(r, s)-out-of-(m, n):F lattice system consisting of components with the same reliability. However, the existing limit theorems are constrained in terms of (a) the system shape and (b) the condition under which the theorem can be applied. Therefore, this study generalizes the existing limit theorems along the two aforementioned directions. The limit theorem established in this paper can be useful for revealing the properties of the reliability of a large-scale connected-(r, s)-out-of-(m, n):F lattice system.</description><identifier>ISSN: 0916-8508</identifier><identifier>EISSN: 1745-1337</identifier><identifier>DOI: 10.1587/transfun.2020EAP1145</identifier><language>eng</language><publisher>Tokyo: The Institute of Electronics, Information and Communication Engineers</publisher><subject>Component reliability ; Connected-(r, s)-out-of-(m, n):F lattice system ; limit theorem ; Reliability engineering ; System reliability ; Theorems</subject><ispartof>IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, 2022/03/01, Vol.E105.A(3), pp.562-570</ispartof><rights>2022 The Institute of Electronics, Information and Communication Engineers</rights><rights>Copyright Japan Science and Technology Agency 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c369t-38424d256815e8a7031adfbe7cf3d30e6c4810ce2869d11818bfc6a2f148e40c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,1877,27901,27902</link.rule.ids></links><search><creatorcontrib>YAMADA, Koki</creatorcontrib><creatorcontrib>NAKAMURA, Taishin</creatorcontrib><creatorcontrib>YAMAMOTO, Hisashi</creatorcontrib><title>Generalization of Limit Theorems for Connected-(r, s)-out-of- (m, n):F Lattice Systems</title><title>IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences</title><addtitle>IEICE Trans. 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The limit theorem established in this paper can be useful for revealing the properties of the reliability of a large-scale connected-(r, s)-out-of-(m, n):F lattice system.</description><subject>Component reliability</subject><subject>Connected-(r, s)-out-of-(m, n):F lattice system</subject><subject>limit theorem</subject><subject>Reliability engineering</subject><subject>System reliability</subject><subject>Theorems</subject><issn>0916-8508</issn><issn>1745-1337</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNpNkEtLAzEUhYMoWKv_wEXATQtGcyeZmdRdKfUBBcXXNsTMjZ3SJjVJF_rrHamv1TmL853LPYQcAz-DUtXnORqf3MafFbzg0_EdgCx3SA9qWTIQot4lPT6CiqmSq31ykNKCc1AFyB55vkKP0SzbD5Pb4GlwdNau2kwf5xgirhJ1IdJJ8B5txoYN4ilNQxY2mQXH6GB1Sv3w4pLOTM6tRfrwnnJHHZI9Z5YJj761T54up4-Taza7vbqZjGfMimqUmVCykE1RVgpKVKbmAkzjXrC2TjSCY2WlAm6xUNWoAVCgXpytTOFAKpTcij452fauY3jbYMp6ETbRdyd1UQmplIRO-0RuUzaGlCI6vY7tysR3DVx_Lah_FtT_Fuyw-y22SNm84i9kYvfqEv-gKfBSj7X4Mf9KfsN2bqJGLz4BjhaBeg</recordid><startdate>20220301</startdate><enddate>20220301</enddate><creator>YAMADA, Koki</creator><creator>NAKAMURA, Taishin</creator><creator>YAMAMOTO, Hisashi</creator><general>The Institute of Electronics, Information and Communication Engineers</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20220301</creationdate><title>Generalization of Limit Theorems for Connected-(r, s)-out-of- (m, n):F Lattice Systems</title><author>YAMADA, Koki ; NAKAMURA, Taishin ; YAMAMOTO, Hisashi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-38424d256815e8a7031adfbe7cf3d30e6c4810ce2869d11818bfc6a2f148e40c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Component reliability</topic><topic>Connected-(r, s)-out-of-(m, n):F lattice system</topic><topic>limit theorem</topic><topic>Reliability engineering</topic><topic>System reliability</topic><topic>Theorems</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>YAMADA, Koki</creatorcontrib><creatorcontrib>NAKAMURA, Taishin</creatorcontrib><creatorcontrib>YAMAMOTO, Hisashi</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>YAMADA, Koki</au><au>NAKAMURA, Taishin</au><au>YAMAMOTO, Hisashi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Generalization of Limit Theorems for Connected-(r, s)-out-of- (m, n):F Lattice Systems</atitle><jtitle>IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences</jtitle><addtitle>IEICE Trans. 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subjects | Component reliability Connected-(r, s)-out-of-(m, n):F lattice system limit theorem Reliability engineering System reliability Theorems |
title | Generalization of Limit Theorems for Connected-(r, s)-out-of- (m, n):F Lattice Systems |
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