Extraction of thermal and optical parameters for As–Se–Te thin films according to phase-change pathways

The technique of thermal evaporation was used to synthesize the As50Se50-xTex (x = 0, 25, and 50 at.%) thin films (∼500 nm). The scenarios of this research were focused on the phase change pathways of the fresh and annealed (at Tc) thin films. By measuring the surface resistance of the studied thin...

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Veröffentlicht in:	Materials chemistry and physics 2022-02, Vol.277, p.125620, Article 125620
Hauptverfasser:	Qasem, Ammar, Alshahrani, B., Yakout, H.A., Abbas, Hebat-Allah S., Shaaban, E.R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing As–Se–Te Thin films Computation Electron density Molar volume Optical parameters Parameters Phase transitions Phase-change pathway Surface resistance Thin films Transition temperature
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