An extension of the Fourier series-based particle model to the GJK-based contact detection and resolution framework for DEM

Fourier series (FS) is an efficient tool for describing irregular geometries and has been employed to develop the FS-based particle model in the discrete element method (DEM). This work is devoted to extending the previous FS-based particle model to the Minkowski and Gilbert–Johnson–Keerthi (GJK)-ba...

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Veröffentlicht in:Computational particle mechanics 2022-03, Vol.9 (2), p.381-391
Hauptverfasser: Huang, Shuai, Huang, Linchong, Lai, Zhengshou
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Sprache:eng
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