Run-Time Thermal Management for Lifetime Optimization in Low-Power Designs

In this paper, the magnitude of the temperature and stress variability of dynamic voltage and frequency scaling (DVFS) designs is analyzed, and their impact on the bias temperature instability (BTI) degradation and lifetime of DVFS designs is assessed. For this purpose, a design-time evaluation fram...

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Veröffentlicht in:	Electronics (Basel) 2022-02, Vol.11 (3), p.411
Hauptverfasser:	Rossi, Daniele, Tenentes, Vasileios
Format:	Artikel
Sprache:	eng
Schlagworte:	Aging Circuits Critical path Degradation Design Designers Ethernet Impact analysis Optimization Simulation Stability analysis Temperature effects Temperature profiles Thermal management Throttling Tradeoffs Transistors Workload Workloads
Online-Zugang:	Volltext
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