Nanoscale Mapping of Cu‐Ion Transport in van der Waals Layered CuCrP2S6

Ionic conduction of metal thiophosphates (MTPs) is attracting growing attention for promising applications in electrochemical storage and tunable physical properties. Especially, metal‐ion migration in copper thiophosphate has been identified as a key factor for the control of their microstructure a...

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Veröffentlicht in:	Advanced materials interfaces 2022-02, Vol.9 (4), p.n/a
Hauptverfasser:	Ma, Ru‐Ru, Xu, Dong‐Dong, Zhong, Qi‐Lan, Zhong, Chao‐Rong, Huang, Rong, Xiang, Ping‐Hua, Zhong, Ni, Duan, Chun‐Gang
Format:	Artikel
Sprache:	eng
Schlagworte:	Copper Coupling Crystal lattices Crystal structure CuCrP 2S 6 Diffusion layers Electric fields Ion concentration Ion migration Ion transport ionic conductivity Microscopy Phase transitions Physical properties Raman spectra Room temperature scanning probe microscope Scanning probe microscopy structural phase transition van der Waals layered materials
Online-Zugang:	Volltext
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