Two-Dimensional MoSi2N4: An Excellent 2-D Semiconductor for Field-Effect Transistors

We report the performance of field-effect transistors (FETs), composed of monolayer of recently synthesized layered two-dimensional (2-D) MoSi 2 N 4 as channel material, using the first principles quantum transport simulations. The devices' performance is assessed as per the International Roadm...

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Veröffentlicht in:IEEE transactions on electron devices 2022-01, Vol.69 (1), p.406-413
Hauptverfasser: Nandan, Keshari, Ghosh, Barun, Agarwal, Amit, Bhowmick, Somnath, Chauhan, Yogesh S.
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container_start_page 406
container_title IEEE transactions on electron devices
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creator Nandan, Keshari
Ghosh, Barun
Agarwal, Amit
Bhowmick, Somnath
Chauhan, Yogesh S.
description We report the performance of field-effect transistors (FETs), composed of monolayer of recently synthesized layered two-dimensional (2-D) MoSi 2 N 4 as channel material, using the first principles quantum transport simulations. The devices' performance is assessed as per the International Roadmap for Devices and Systems (IRDS) 2020 roadmap for the year 2034 and compared to advanced silicon-based FETs, carbon nanotube-based FETs, and other promising 2-D materials-based FETs. Finally, we estimate the figure of merits of a combinational and a sequential logic circuit based on our double gate devices and benchmark against promising alternative logic technologies. The performance of our devices and circuits based on them is encouraging, and competitive to other logic alternatives.
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subjects Carbon nanotubes
Density functional theory (DFT)
Discrete Fourier transforms
Field effect transistors
field-effect transistors (FETs)
First principles
Lattices
Logic circuits
Logic gates
maximally localized Wannier functions (MLWFs)
monolayer (ML)
nonequilibrium Green’s function (NEGF)
Performance evaluation
Photonic band gap
Quantum transport
quantum transport (QT)
Semiconductor devices
Transistors
Tunneling
Two dimensional materials
title Two-Dimensional MoSi2N4: An Excellent 2-D Semiconductor for Field-Effect Transistors
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