Comparative inter diffusion study among Ag and AuAg thin film grown on reconstructed Si(5 5 12) substrate

Investigations about various aspects of thin film growth for metal (Au, Ag) deposition on single crystal Si substrate encompass significant importance for interconnects in Si-based technology besides importance of AuAg alloys for their interesting properties, such as templates for surface enhanced R...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2022, Vol.128 (1), Article 66
Hauptverfasser: Bhukta, Anjan, Ravulapalli, Sathyavathi, Satyam, Parlapalli Venkata
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 1
container_start_page
container_title Applied physics. A, Materials science & processing
container_volume 128
creator Bhukta, Anjan
Ravulapalli, Sathyavathi
Satyam, Parlapalli Venkata
description Investigations about various aspects of thin film growth for metal (Au, Ag) deposition on single crystal Si substrate encompass significant importance for interconnects in Si-based technology besides importance of AuAg alloys for their interesting properties, such as templates for surface enhanced Raman spectroscopy. The reconstructed surface of Si(5 5 12) with its one-dimensional wire like structures provides a typical patterned surface for the growth of bilayers. Considering Ag (35.5 monolayer (ML)) and sequential AuAg (22 ML Au after 35.5 ML Ag) growth on reconstructed Si(5 5 12) substrate near at room temperature with subsequent stepwise annealing up to 600 °C in ultra-high vacuum condition, we have comparatively studied various growth aspects viz. crystallographic characteristic, morphology and compositional depth profile. In-situ RHEED measurements explore gradual crystallographic orientation of crystallites along a preferred direction due to anneal at higher temperature, for both kind of thin film. In course of stepwise annealing, for Ag growth RHEED pattern is changed from three dimensional spotty to two dimensional streaky alike as substrate temperature is changed from 380 to 520 °C indicating significant reduction of particle density. But for AuAg growth, 3D spotty like RHEED pattern doesn’t change even after anneal at 600 °C. Resulting morphology is consisted of well-shaped particle with its density ~ 1.5 × 10 3 times larger for AuAg growth than Ag growth. Subsequent annealing process causes significant sublimation from grown Ag thin film, and remnant material is extensively inter diffused inside Si matrix. In comparison, for AuAg thin film sublimation is much less significant for Ag and negligible for Au. For detection of crystal violet molecule with low concentration ~ 5 × 10 –7  M, self-assembled AuAg nanostructures as well as thin film with comparatively smaller enhancement factor, have been utilized for competent SERS substrate.
doi_str_mv 10.1007/s00339-021-05207-z
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2613301756</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2613301756</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-c7543ba81b7131baf7a2eaa92cb5e2dde7e5ef6768f70ca8a70b3cc8d275ab583</originalsourceid><addsrcrecordid>eNp9kE1LxDAQhoMouK7-AU8BL3qI5qNp2uOy-AULHtRzSNO0Ztkma5Iqu7_eaAVvzmWG4Xln4AHgnOBrgrG4iRgzViNMCcKcYoH2B2BGCkYRLhk-BDNcFwJVrC6PwUmMa5yroHQG7NIPWxVUsh8GWpdMgK3tujFa72BMY7uDavCuh4seKtfCxZiH9GYd7OxmgH3wnw5mNBjtXUxh1Mm08NlecsghoVcwjk1eq2ROwVGnNtGc_fY5eL27fVk-oNXT_eNysUKakTohLXjBGlWRRhBGGtUJRY1SNdUNN7RtjTDcdKUoq05grSolcMO0rloquGp4xebgYrq7Df59NDHJtR-Dyy8lLQljmAheZopOlA4-xmA6uQ12UGEnCZbfSuWkVGal8kep3OcQm0Ixw6434e_0P6kvHLR6Ug</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2613301756</pqid></control><display><type>article</type><title>Comparative inter diffusion study among Ag and AuAg thin film grown on reconstructed Si(5 5 12) substrate</title><source>SpringerNature Journals</source><creator>Bhukta, Anjan ; Ravulapalli, Sathyavathi ; Satyam, Parlapalli Venkata</creator><creatorcontrib>Bhukta, Anjan ; Ravulapalli, Sathyavathi ; Satyam, Parlapalli Venkata</creatorcontrib><description>Investigations about various aspects of thin film growth for metal (Au, Ag) deposition on single crystal Si substrate encompass significant importance for interconnects in Si-based technology besides importance of AuAg alloys for their interesting properties, such as templates for surface enhanced Raman spectroscopy. The reconstructed surface of Si(5 5 12) with its one-dimensional wire like structures provides a typical patterned surface for the growth of bilayers. Considering Ag (35.5 monolayer (ML)) and sequential AuAg (22 ML Au after 35.5 ML Ag) growth on reconstructed Si(5 5 12) substrate near at room temperature with subsequent stepwise annealing up to 600 °C in ultra-high vacuum condition, we have comparatively studied various growth aspects viz. crystallographic characteristic, morphology and compositional depth profile. In-situ RHEED measurements explore gradual crystallographic orientation of crystallites along a preferred direction due to anneal at higher temperature, for both kind of thin film. In course of stepwise annealing, for Ag growth RHEED pattern is changed from three dimensional spotty to two dimensional streaky alike as substrate temperature is changed from 380 to 520 °C indicating significant reduction of particle density. But for AuAg growth, 3D spotty like RHEED pattern doesn’t change even after anneal at 600 °C. Resulting morphology is consisted of well-shaped particle with its density ~ 1.5 × 10 3 times larger for AuAg growth than Ag growth. Subsequent annealing process causes significant sublimation from grown Ag thin film, and remnant material is extensively inter diffused inside Si matrix. In comparison, for AuAg thin film sublimation is much less significant for Ag and negligible for Au. For detection of crystal violet molecule with low concentration ~ 5 × 10 –7  M, self-assembled AuAg nanostructures as well as thin film with comparatively smaller enhancement factor, have been utilized for competent SERS substrate.</description><identifier>ISSN: 0947-8396</identifier><identifier>EISSN: 1432-0630</identifier><identifier>DOI: 10.1007/s00339-021-05207-z</identifier><language>eng</language><publisher>Berlin/Heidelberg: Springer Berlin Heidelberg</publisher><subject>Annealing ; Applied physics ; Bilayers ; Characterization and Evaluation of Materials ; Condensed Matter Physics ; Crystallites ; Crystallography ; Film growth ; Gold ; Gold base alloys ; High vacuum ; Interdiffusion ; Machines ; Manufacturing ; Materials science ; Morphology ; Nanotechnology ; Optical and Electronic Materials ; Particle density (concentration) ; Physics ; Physics and Astronomy ; Processes ; Raman spectroscopy ; Room temperature ; Self-assembly ; Silicon substrates ; Silver ; Single crystals ; Sublimation ; Surfaces and Interfaces ; Thin Films</subject><ispartof>Applied physics. A, Materials science &amp; processing, 2022, Vol.128 (1), Article 66</ispartof><rights>The Author(s), under exclusive licence to Springer-Verlag GmbH, DE part of Springer Nature 2021</rights><rights>The Author(s), under exclusive licence to Springer-Verlag GmbH, DE part of Springer Nature 2021.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-c7543ba81b7131baf7a2eaa92cb5e2dde7e5ef6768f70ca8a70b3cc8d275ab583</citedby><cites>FETCH-LOGICAL-c319t-c7543ba81b7131baf7a2eaa92cb5e2dde7e5ef6768f70ca8a70b3cc8d275ab583</cites><orcidid>0000-0002-0711-4698</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s00339-021-05207-z$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s00339-021-05207-z$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,781,785,27929,27930,41493,42562,51324</link.rule.ids></links><search><creatorcontrib>Bhukta, Anjan</creatorcontrib><creatorcontrib>Ravulapalli, Sathyavathi</creatorcontrib><creatorcontrib>Satyam, Parlapalli Venkata</creatorcontrib><title>Comparative inter diffusion study among Ag and AuAg thin film grown on reconstructed Si(5 5 12) substrate</title><title>Applied physics. A, Materials science &amp; processing</title><addtitle>Appl. Phys. A</addtitle><description>Investigations about various aspects of thin film growth for metal (Au, Ag) deposition on single crystal Si substrate encompass significant importance for interconnects in Si-based technology besides importance of AuAg alloys for their interesting properties, such as templates for surface enhanced Raman spectroscopy. The reconstructed surface of Si(5 5 12) with its one-dimensional wire like structures provides a typical patterned surface for the growth of bilayers. Considering Ag (35.5 monolayer (ML)) and sequential AuAg (22 ML Au after 35.5 ML Ag) growth on reconstructed Si(5 5 12) substrate near at room temperature with subsequent stepwise annealing up to 600 °C in ultra-high vacuum condition, we have comparatively studied various growth aspects viz. crystallographic characteristic, morphology and compositional depth profile. In-situ RHEED measurements explore gradual crystallographic orientation of crystallites along a preferred direction due to anneal at higher temperature, for both kind of thin film. In course of stepwise annealing, for Ag growth RHEED pattern is changed from three dimensional spotty to two dimensional streaky alike as substrate temperature is changed from 380 to 520 °C indicating significant reduction of particle density. But for AuAg growth, 3D spotty like RHEED pattern doesn’t change even after anneal at 600 °C. Resulting morphology is consisted of well-shaped particle with its density ~ 1.5 × 10 3 times larger for AuAg growth than Ag growth. Subsequent annealing process causes significant sublimation from grown Ag thin film, and remnant material is extensively inter diffused inside Si matrix. In comparison, for AuAg thin film sublimation is much less significant for Ag and negligible for Au. For detection of crystal violet molecule with low concentration ~ 5 × 10 –7  M, self-assembled AuAg nanostructures as well as thin film with comparatively smaller enhancement factor, have been utilized for competent SERS substrate.</description><subject>Annealing</subject><subject>Applied physics</subject><subject>Bilayers</subject><subject>Characterization and Evaluation of Materials</subject><subject>Condensed Matter Physics</subject><subject>Crystallites</subject><subject>Crystallography</subject><subject>Film growth</subject><subject>Gold</subject><subject>Gold base alloys</subject><subject>High vacuum</subject><subject>Interdiffusion</subject><subject>Machines</subject><subject>Manufacturing</subject><subject>Materials science</subject><subject>Morphology</subject><subject>Nanotechnology</subject><subject>Optical and Electronic Materials</subject><subject>Particle density (concentration)</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Processes</subject><subject>Raman spectroscopy</subject><subject>Room temperature</subject><subject>Self-assembly</subject><subject>Silicon substrates</subject><subject>Silver</subject><subject>Single crystals</subject><subject>Sublimation</subject><subject>Surfaces and Interfaces</subject><subject>Thin Films</subject><issn>0947-8396</issn><issn>1432-0630</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMouK7-AU8BL3qI5qNp2uOy-AULHtRzSNO0Ztkma5Iqu7_eaAVvzmWG4Xln4AHgnOBrgrG4iRgzViNMCcKcYoH2B2BGCkYRLhk-BDNcFwJVrC6PwUmMa5yroHQG7NIPWxVUsh8GWpdMgK3tujFa72BMY7uDavCuh4seKtfCxZiH9GYd7OxmgH3wnw5mNBjtXUxh1Mm08NlecsghoVcwjk1eq2ROwVGnNtGc_fY5eL27fVk-oNXT_eNysUKakTohLXjBGlWRRhBGGtUJRY1SNdUNN7RtjTDcdKUoq05grSolcMO0rloquGp4xebgYrq7Df59NDHJtR-Dyy8lLQljmAheZopOlA4-xmA6uQ12UGEnCZbfSuWkVGal8kep3OcQm0Ixw6434e_0P6kvHLR6Ug</recordid><startdate>2022</startdate><enddate>2022</enddate><creator>Bhukta, Anjan</creator><creator>Ravulapalli, Sathyavathi</creator><creator>Satyam, Parlapalli Venkata</creator><general>Springer Berlin Heidelberg</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-0711-4698</orcidid></search><sort><creationdate>2022</creationdate><title>Comparative inter diffusion study among Ag and AuAg thin film grown on reconstructed Si(5 5 12) substrate</title><author>Bhukta, Anjan ; Ravulapalli, Sathyavathi ; Satyam, Parlapalli Venkata</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-c7543ba81b7131baf7a2eaa92cb5e2dde7e5ef6768f70ca8a70b3cc8d275ab583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Annealing</topic><topic>Applied physics</topic><topic>Bilayers</topic><topic>Characterization and Evaluation of Materials</topic><topic>Condensed Matter Physics</topic><topic>Crystallites</topic><topic>Crystallography</topic><topic>Film growth</topic><topic>Gold</topic><topic>Gold base alloys</topic><topic>High vacuum</topic><topic>Interdiffusion</topic><topic>Machines</topic><topic>Manufacturing</topic><topic>Materials science</topic><topic>Morphology</topic><topic>Nanotechnology</topic><topic>Optical and Electronic Materials</topic><topic>Particle density (concentration)</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Processes</topic><topic>Raman spectroscopy</topic><topic>Room temperature</topic><topic>Self-assembly</topic><topic>Silicon substrates</topic><topic>Silver</topic><topic>Single crystals</topic><topic>Sublimation</topic><topic>Surfaces and Interfaces</topic><topic>Thin Films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bhukta, Anjan</creatorcontrib><creatorcontrib>Ravulapalli, Sathyavathi</creatorcontrib><creatorcontrib>Satyam, Parlapalli Venkata</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics. A, Materials science &amp; processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bhukta, Anjan</au><au>Ravulapalli, Sathyavathi</au><au>Satyam, Parlapalli Venkata</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparative inter diffusion study among Ag and AuAg thin film grown on reconstructed Si(5 5 12) substrate</atitle><jtitle>Applied physics. A, Materials science &amp; processing</jtitle><stitle>Appl. Phys. A</stitle><date>2022</date><risdate>2022</risdate><volume>128</volume><issue>1</issue><artnum>66</artnum><issn>0947-8396</issn><eissn>1432-0630</eissn><abstract>Investigations about various aspects of thin film growth for metal (Au, Ag) deposition on single crystal Si substrate encompass significant importance for interconnects in Si-based technology besides importance of AuAg alloys for their interesting properties, such as templates for surface enhanced Raman spectroscopy. The reconstructed surface of Si(5 5 12) with its one-dimensional wire like structures provides a typical patterned surface for the growth of bilayers. Considering Ag (35.5 monolayer (ML)) and sequential AuAg (22 ML Au after 35.5 ML Ag) growth on reconstructed Si(5 5 12) substrate near at room temperature with subsequent stepwise annealing up to 600 °C in ultra-high vacuum condition, we have comparatively studied various growth aspects viz. crystallographic characteristic, morphology and compositional depth profile. In-situ RHEED measurements explore gradual crystallographic orientation of crystallites along a preferred direction due to anneal at higher temperature, for both kind of thin film. In course of stepwise annealing, for Ag growth RHEED pattern is changed from three dimensional spotty to two dimensional streaky alike as substrate temperature is changed from 380 to 520 °C indicating significant reduction of particle density. But for AuAg growth, 3D spotty like RHEED pattern doesn’t change even after anneal at 600 °C. Resulting morphology is consisted of well-shaped particle with its density ~ 1.5 × 10 3 times larger for AuAg growth than Ag growth. Subsequent annealing process causes significant sublimation from grown Ag thin film, and remnant material is extensively inter diffused inside Si matrix. In comparison, for AuAg thin film sublimation is much less significant for Ag and negligible for Au. For detection of crystal violet molecule with low concentration ~ 5 × 10 –7  M, self-assembled AuAg nanostructures as well as thin film with comparatively smaller enhancement factor, have been utilized for competent SERS substrate.</abstract><cop>Berlin/Heidelberg</cop><pub>Springer Berlin Heidelberg</pub><doi>10.1007/s00339-021-05207-z</doi><orcidid>https://orcid.org/0000-0002-0711-4698</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0947-8396
ispartof Applied physics. A, Materials science & processing, 2022, Vol.128 (1), Article 66
issn 0947-8396
1432-0630
language eng
recordid cdi_proquest_journals_2613301756
source SpringerNature Journals
subjects Annealing
Applied physics
Bilayers
Characterization and Evaluation of Materials
Condensed Matter Physics
Crystallites
Crystallography
Film growth
Gold
Gold base alloys
High vacuum
Interdiffusion
Machines
Manufacturing
Materials science
Morphology
Nanotechnology
Optical and Electronic Materials
Particle density (concentration)
Physics
Physics and Astronomy
Processes
Raman spectroscopy
Room temperature
Self-assembly
Silicon substrates
Silver
Single crystals
Sublimation
Surfaces and Interfaces
Thin Films
title Comparative inter diffusion study among Ag and AuAg thin film grown on reconstructed Si(5 5 12) substrate
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-14T00%3A50%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comparative%20inter%20diffusion%20study%20among%20Ag%20and%20AuAg%20thin%20film%20grown%20on%20reconstructed%20Si(5%205%2012)%20substrate&rft.jtitle=Applied%20physics.%20A,%20Materials%20science%20&%20processing&rft.au=Bhukta,%20Anjan&rft.date=2022&rft.volume=128&rft.issue=1&rft.artnum=66&rft.issn=0947-8396&rft.eissn=1432-0630&rft_id=info:doi/10.1007/s00339-021-05207-z&rft_dat=%3Cproquest_cross%3E2613301756%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2613301756&rft_id=info:pmid/&rfr_iscdi=true