Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition

In this study, CdO2 (1-X) AlX thin films were prepared by pulsed-laser deposition. The X-ray diffraction patterns reveal that the films were polycrystalline with a cubic structure, and the composition of the material changed from CdO at the target to CdO2 in the deposited thin films. The intensity o...

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Veröffentlicht in:	NeuroQuantology 2021-11, Vol.19 (10), p.34-40
Hauptverfasser:	Taher, B.Y., Ahmed, A.S., Alatta, Hassan J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Deviation Diffraction patterns Doping Pulsed laser deposition Pulsed lasers Structural analysis Texture Thin films
Online-Zugang:	Volltext
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