Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition
In this study, CdO2 (1-X) AlX thin films were prepared by pulsed-laser deposition. The X-ray diffraction patterns reveal that the films were polycrystalline with a cubic structure, and the composition of the material changed from CdO at the target to CdO2 in the deposited thin films. The intensity o...
Gespeichert in:
| Veröffentlicht in: | NeuroQuantology 2021-11, Vol.19 (10), p.34-40 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 40 |
|---|---|
| container_issue | 10 |
| container_start_page | 34 |
| container_title | NeuroQuantology |
| container_volume | 19 |
| creator | Taher, B.Y. Ahmed, A.S. Alatta, Hassan J. |
| description | In this study, CdO2 (1-X) AlX thin films were prepared by pulsed-laser deposition. The X-ray diffraction patterns reveal that the films were polycrystalline with a cubic structure, and the composition of the material changed from CdO at the target to CdO2 in the deposited thin films. The intensity of the diffraction peak (or the texture factor) decreases with increasing hkl and has a maximum value for the (111) plane, the interplanar distance and diffraction angle has a high deviation from the standard value for the (111) plane and. This deviation is affected by doping concentration and shows its highest deviation at a doping concentration of 0.1 wt.% for the (111) and (200), and the 0.3 and 0.5 wt.% for the (210) and (220) planes, respectively. The crystalline size take a less value at plane has a high texture factor that is (111) plane and decreases with increase the doping concentration. |
| doi_str_mv | 10.14704/nq.2021.19.10.NQ21154 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2598644222</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2598644222</sourcerecordid><originalsourceid>FETCH-LOGICAL-c145t-c73c0dd466d22c0cf798fe9cc4331300afc5e55c514dc3db3101627050db5f5d3</originalsourceid><addsrcrecordid>eNpNkM1PwkAQxTdGExH9F8wmXvTQOrMfLT0SFDUhggETbpuyH7GktGW3PfDfW4SDp5m8eXmZ9yPkHiFGkYJ4rvYxA4YxZnGvfX4xRCkuyAA58EiihMt_-zW5CWELIFPIkgFZLlvf6bbzeUnHVV4eQhFo7ejEzNkjRusnOi7XdPVTVHRalLtAF942ubeGbg500ZXBmmiWB-vpi23qULRFXd2SK5f3l7vzHJLv6etq8h7N5m8fk_Es0ihkG-mUazBGJIlhTIN2aTZyNtNacN6_C7nT0kqpJQqjudlwBExYChLMRjpp-JA8nHIbX-87G1q1rTvflwiKyWyUCMEY613JyaV9HYK3TjW-2OX-oBDUH0BV7dURoMLsqJ0B8l9kYWLA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2598644222</pqid></control><display><type>article</type><title>Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>Taher, B.Y. ; Ahmed, A.S. ; Alatta, Hassan J.</creator><creatorcontrib>Taher, B.Y. ; Ahmed, A.S. ; Alatta, Hassan J.</creatorcontrib><description>In this study, CdO2 (1-X) AlX thin films were prepared by pulsed-laser deposition. The X-ray diffraction patterns reveal that the films were polycrystalline with a cubic structure, and the composition of the material changed from CdO at the target to CdO2 in the deposited thin films. The intensity of the diffraction peak (or the texture factor) decreases with increasing hkl and has a maximum value for the (111) plane, the interplanar distance and diffraction angle has a high deviation from the standard value for the (111) plane and. This deviation is affected by doping concentration and shows its highest deviation at a doping concentration of 0.1 wt.% for the (111) and (200), and the 0.3 and 0.5 wt.% for the (210) and (220) planes, respectively. The crystalline size take a less value at plane has a high texture factor that is (111) plane and decreases with increase the doping concentration.</description><identifier>ISSN: 1303-5150</identifier><identifier>EISSN: 1303-5150</identifier><identifier>DOI: 10.14704/nq.2021.19.10.NQ21154</identifier><language>eng</language><publisher>Bornova Izmir: NeuroQuantology</publisher><subject>Deviation ; Diffraction patterns ; Doping ; Pulsed laser deposition ; Pulsed lasers ; Structural analysis ; Texture ; Thin films</subject><ispartof>NeuroQuantology, 2021-11, Vol.19 (10), p.34-40</ispartof><rights>Copyright NeuroQuantology 2021</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Taher, B.Y.</creatorcontrib><creatorcontrib>Ahmed, A.S.</creatorcontrib><creatorcontrib>Alatta, Hassan J.</creatorcontrib><title>Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition</title><title>NeuroQuantology</title><description>In this study, CdO2 (1-X) AlX thin films were prepared by pulsed-laser deposition. The X-ray diffraction patterns reveal that the films were polycrystalline with a cubic structure, and the composition of the material changed from CdO at the target to CdO2 in the deposited thin films. The intensity of the diffraction peak (or the texture factor) decreases with increasing hkl and has a maximum value for the (111) plane, the interplanar distance and diffraction angle has a high deviation from the standard value for the (111) plane and. This deviation is affected by doping concentration and shows its highest deviation at a doping concentration of 0.1 wt.% for the (111) and (200), and the 0.3 and 0.5 wt.% for the (210) and (220) planes, respectively. The crystalline size take a less value at plane has a high texture factor that is (111) plane and decreases with increase the doping concentration.</description><subject>Deviation</subject><subject>Diffraction patterns</subject><subject>Doping</subject><subject>Pulsed laser deposition</subject><subject>Pulsed lasers</subject><subject>Structural analysis</subject><subject>Texture</subject><subject>Thin films</subject><issn>1303-5150</issn><issn>1303-5150</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNpNkM1PwkAQxTdGExH9F8wmXvTQOrMfLT0SFDUhggETbpuyH7GktGW3PfDfW4SDp5m8eXmZ9yPkHiFGkYJ4rvYxA4YxZnGvfX4xRCkuyAA58EiihMt_-zW5CWELIFPIkgFZLlvf6bbzeUnHVV4eQhFo7ejEzNkjRusnOi7XdPVTVHRalLtAF942ubeGbg500ZXBmmiWB-vpi23qULRFXd2SK5f3l7vzHJLv6etq8h7N5m8fk_Es0ihkG-mUazBGJIlhTIN2aTZyNtNacN6_C7nT0kqpJQqjudlwBExYChLMRjpp-JA8nHIbX-87G1q1rTvflwiKyWyUCMEY613JyaV9HYK3TjW-2OX-oBDUH0BV7dURoMLsqJ0B8l9kYWLA</recordid><startdate>20211117</startdate><enddate>20211117</enddate><creator>Taher, B.Y.</creator><creator>Ahmed, A.S.</creator><creator>Alatta, Hassan J.</creator><general>NeuroQuantology</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7X7</scope><scope>7XB</scope><scope>88G</scope><scope>8FE</scope><scope>8FG</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>M0S</scope><scope>M2M</scope><scope>P5Z</scope><scope>P62</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PSYQQ</scope><scope>Q9U</scope></search><sort><creationdate>20211117</creationdate><title>Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition</title><author>Taher, B.Y. ; Ahmed, A.S. ; Alatta, Hassan J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c145t-c73c0dd466d22c0cf798fe9cc4331300afc5e55c514dc3db3101627050db5f5d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Deviation</topic><topic>Diffraction patterns</topic><topic>Doping</topic><topic>Pulsed laser deposition</topic><topic>Pulsed lasers</topic><topic>Structural analysis</topic><topic>Texture</topic><topic>Thin films</topic><toplevel>online_resources</toplevel><creatorcontrib>Taher, B.Y.</creatorcontrib><creatorcontrib>Ahmed, A.S.</creatorcontrib><creatorcontrib>Alatta, Hassan J.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Psychology Database (Alumni)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>ProQuest Psychology</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest One Psychology</collection><collection>ProQuest Central Basic</collection><jtitle>NeuroQuantology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Taher, B.Y.</au><au>Ahmed, A.S.</au><au>Alatta, Hassan J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition</atitle><jtitle>NeuroQuantology</jtitle><date>2021-11-17</date><risdate>2021</risdate><volume>19</volume><issue>10</issue><spage>34</spage><epage>40</epage><pages>34-40</pages><issn>1303-5150</issn><eissn>1303-5150</eissn><abstract>In this study, CdO2 (1-X) AlX thin films were prepared by pulsed-laser deposition. The X-ray diffraction patterns reveal that the films were polycrystalline with a cubic structure, and the composition of the material changed from CdO at the target to CdO2 in the deposited thin films. The intensity of the diffraction peak (or the texture factor) decreases with increasing hkl and has a maximum value for the (111) plane, the interplanar distance and diffraction angle has a high deviation from the standard value for the (111) plane and. This deviation is affected by doping concentration and shows its highest deviation at a doping concentration of 0.1 wt.% for the (111) and (200), and the 0.3 and 0.5 wt.% for the (210) and (220) planes, respectively. The crystalline size take a less value at plane has a high texture factor that is (111) plane and decreases with increase the doping concentration.</abstract><cop>Bornova Izmir</cop><pub>NeuroQuantology</pub><doi>10.14704/nq.2021.19.10.NQ21154</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1303-5150 |
| ispartof | NeuroQuantology, 2021-11, Vol.19 (10), p.34-40 |
| issn | 1303-5150 1303-5150 |
| language | eng |
| recordid | cdi_proquest_journals_2598644222 |
| source | Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals |
| subjects | Deviation Diffraction patterns Doping Pulsed laser deposition Pulsed lasers Structural analysis Texture Thin films |
| title | Structural Analysis of CdO2(1-X) AlX Thin Films Prepared by Pulsed-Laser Deposition |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T11%3A17%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20Analysis%20of%20CdO2(1-X)%20AlX%20Thin%20Films%20Prepared%20by%20Pulsed-Laser%20Deposition&rft.jtitle=NeuroQuantology&rft.au=Taher,%20B.Y.&rft.date=2021-11-17&rft.volume=19&rft.issue=10&rft.spage=34&rft.epage=40&rft.pages=34-40&rft.issn=1303-5150&rft.eissn=1303-5150&rft_id=info:doi/10.14704/nq.2021.19.10.NQ21154&rft_dat=%3Cproquest_cross%3E2598644222%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2598644222&rft_id=info:pmid/&rfr_iscdi=true |