The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.586-587
Hauptverfasser: Cheng, Shaobo, Longo, Paolo, Twesten, Ray D., Botton, Gianluigi A.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 587
container_issue S2
container_start_page 586
container_title Microscopy and microanalysis
container_volume 25
creator Cheng, Shaobo
Longo, Paolo
Twesten, Ray D.
Botton, Gianluigi A.
description
doi_str_mv 10.1017/S1431927619003660
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2595856206</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927619003660</cupid><sourcerecordid>2595856206</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2050-7100a3e2b8601ef298bc3a9bc2f518a5ed7a1518d570c898a53813f5eedb72ec3</originalsourceid><addsrcrecordid>eNp1UEtLAzEQDqJgrf4AbwHPqzOJ2cdR2vqAgkLrxcuSzc7WLW2yJttD_73pA3oQT_PxvWYYxm4R7hEwe5jho8RCZCkWADJN4YwNIqWSHFGd7zEmO_2SXYWwhGiCLB2wr_k38Q_yjfNrbQ1x1_DJikzvneUjt7F9axd83PpI8TH1cbRRae3JNbHkF1s-dSHwWbcng3Hd9ppdNHoV6OY4h-zzeTIfvSbT95e30dM0MQIUJBkCaEmiylNAakSRV0bqojKiUZhrRXWmMaJaZWDyIjIyR9koorrKBBk5ZHeH3s67nw2Fvly6jbdxZSlUoXKVCkijCw8uE88Lnpqy8-1a-22JUO5eWP55YczIY0avK9_WCzpV_5_6BeXRcqk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2595856206</pqid></control><display><type>article</type><title>The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy</title><source>Cambridge University Press Journals Complete</source><creator>Cheng, Shaobo ; Longo, Paolo ; Twesten, Ray D. ; Botton, Gianluigi A.</creator><creatorcontrib>Cheng, Shaobo ; Longo, Paolo ; Twesten, Ray D. ; Botton, Gianluigi A.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927619003660</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Analytical and Instrumentation Science Symposia ; Current Trends and Challenges in Electron Energy-Loss Spectroscopy ; Electron energy loss spectroscopy ; Energy ; Energy dissipation ; Energy loss ; Materials science ; Microscopy ; Sensors ; Signal to noise ratio ; Spectroscopy ; Spectrum analysis</subject><ispartof>Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.586-587</ispartof><rights>Copyright © Microscopy Society of America 2019</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2050-7100a3e2b8601ef298bc3a9bc2f518a5ed7a1518d570c898a53813f5eedb72ec3</citedby><cites>FETCH-LOGICAL-c2050-7100a3e2b8601ef298bc3a9bc2f518a5ed7a1518d570c898a53813f5eedb72ec3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927619003660/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27923,27924,55627</link.rule.ids></links><search><creatorcontrib>Cheng, Shaobo</creatorcontrib><creatorcontrib>Longo, Paolo</creatorcontrib><creatorcontrib>Twesten, Ray D.</creatorcontrib><creatorcontrib>Botton, Gianluigi A.</creatorcontrib><title>The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Analytical and Instrumentation Science Symposia</subject><subject>Current Trends and Challenges in Electron Energy-Loss Spectroscopy</subject><subject>Electron energy loss spectroscopy</subject><subject>Energy</subject><subject>Energy dissipation</subject><subject>Energy loss</subject><subject>Materials science</subject><subject>Microscopy</subject><subject>Sensors</subject><subject>Signal to noise ratio</subject><subject>Spectroscopy</subject><subject>Spectrum analysis</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1UEtLAzEQDqJgrf4AbwHPqzOJ2cdR2vqAgkLrxcuSzc7WLW2yJttD_73pA3oQT_PxvWYYxm4R7hEwe5jho8RCZCkWADJN4YwNIqWSHFGd7zEmO_2SXYWwhGiCLB2wr_k38Q_yjfNrbQ1x1_DJikzvneUjt7F9axd83PpI8TH1cbRRae3JNbHkF1s-dSHwWbcng3Hd9ppdNHoV6OY4h-zzeTIfvSbT95e30dM0MQIUJBkCaEmiylNAakSRV0bqojKiUZhrRXWmMaJaZWDyIjIyR9koorrKBBk5ZHeH3s67nw2Fvly6jbdxZSlUoXKVCkijCw8uE88Lnpqy8-1a-22JUO5eWP55YczIY0avK9_WCzpV_5_6BeXRcqk</recordid><startdate>201908</startdate><enddate>201908</enddate><creator>Cheng, Shaobo</creator><creator>Longo, Paolo</creator><creator>Twesten, Ray D.</creator><creator>Botton, Gianluigi A.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201908</creationdate><title>The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy</title><author>Cheng, Shaobo ; Longo, Paolo ; Twesten, Ray D. ; Botton, Gianluigi A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2050-7100a3e2b8601ef298bc3a9bc2f518a5ed7a1518d570c898a53813f5eedb72ec3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Analytical and Instrumentation Science Symposia</topic><topic>Current Trends and Challenges in Electron Energy-Loss Spectroscopy</topic><topic>Electron energy loss spectroscopy</topic><topic>Energy</topic><topic>Energy dissipation</topic><topic>Energy loss</topic><topic>Materials science</topic><topic>Microscopy</topic><topic>Sensors</topic><topic>Signal to noise ratio</topic><topic>Spectroscopy</topic><topic>Spectrum analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cheng, Shaobo</creatorcontrib><creatorcontrib>Longo, Paolo</creatorcontrib><creatorcontrib>Twesten, Ray D.</creatorcontrib><creatorcontrib>Botton, Gianluigi A.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cheng, Shaobo</au><au>Longo, Paolo</au><au>Twesten, Ray D.</au><au>Botton, Gianluigi A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2019-08</date><risdate>2019</risdate><volume>25</volume><issue>S2</issue><spage>586</spage><epage>587</epage><pages>586-587</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927619003660</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.586-587
issn 1431-9276
1435-8115
language eng
recordid cdi_proquest_journals_2595856206
source Cambridge University Press Journals Complete
subjects Analytical and Instrumentation Science Symposia
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Electron energy loss spectroscopy
Energy
Energy dissipation
Energy loss
Materials science
Microscopy
Sensors
Signal to noise ratio
Spectroscopy
Spectrum analysis
title The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T18%3A15%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20Performance%20of%20Electron%20Counting%20Direct%20Detection%20in%20Electron%20Energy%20Loss%20Spectroscopy&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Cheng,%20Shaobo&rft.date=2019-08&rft.volume=25&rft.issue=S2&rft.spage=586&rft.epage=587&rft.pages=586-587&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927619003660&rft_dat=%3Cproquest_cross%3E2595856206%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2595856206&rft_id=info:pmid/&rft_cupid=10_1017_S1431927619003660&rfr_iscdi=true