Fast Hyperspectral Soft X-Ray Mapping

Fast Hyperspectral Soft X-Ray Mapping

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Veröffentlicht in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.246-247
Hauptverfasser: MacRae, Colin M., Wilson, N.C., Torpy, A., Hughes, A.E.
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Sprache:eng
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Analytical and Instrumentation Science Symposia
Cameras
Energy
Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques
Mapping
Microscopy
Noise
Sensors
Soft x rays
X-rays
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container_end_page 247
container_issue S2
container_start_page 246
container_title Microscopy and microanalysis
container_volume 25
creator MacRae, Colin M.
Wilson, N.C.
Torpy, A.
Hughes, A.E.
description
doi_str_mv 10.1017/S143192761900196X
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2595853360</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S143192761900196X</cupid><sourcerecordid>2595853360</sourcerecordid><originalsourceid>FETCH-LOGICAL-c205x-d26a698208cfcf8632ab79c60f8d6d91d1cd639c93c1d07a41775d4ecae24a2c3</originalsourceid><addsrcrecordid>eNp1kE9LAzEQxYMoWKsfwNuCeFydSTbJ5ijFWqEiWIXeQpo_ZUvbXZMtuN_erS14EE8zzLzfe_AIuUa4Q0B5P8OCoaJSoAJAJeYnZNCfeF4i8tOfHfP9_5xcpLQCAAZSDMjt2KQ2m3SNj6nxto1mnc3q0Gbz_M102Ytpmmq7vCRnwayTvzrOIfkYP76PJvn09el59DDNLQX-lTsqjFAlhdIGG0rBqFlIZQWE0gmn0KF1gimrmEUH0hQoJXeFt8bTwlDLhuTm4NvE-nPnU6tX9S5u-0hNueIlZ0xAr8KDysY6peiDbmK1MbHTCHrfhv7TRs-wI2M2i1i5pf-1_p_6Brd8X4s</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2595853360</pqid></control><display><type>article</type><title>Fast Hyperspectral Soft X-Ray Mapping</title><source>Cambridge Journals</source><creator>MacRae, Colin M. ; Wilson, N.C. ; Torpy, A. ; Hughes, A.E.</creator><creatorcontrib>MacRae, Colin M. ; Wilson, N.C. ; Torpy, A. ; Hughes, A.E.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S143192761900196X</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Analytical and Instrumentation Science Symposia ; Cameras ; Energy ; Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques ; Mapping ; Microscopy ; Noise ; Sensors ; Soft x rays ; X-rays</subject><ispartof>Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.246-247</ispartof><rights>Copyright © Microscopy Society of America 2019</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c205x-d26a698208cfcf8632ab79c60f8d6d91d1cd639c93c1d07a41775d4ecae24a2c3</citedby><cites>FETCH-LOGICAL-c205x-d26a698208cfcf8632ab79c60f8d6d91d1cd639c93c1d07a41775d4ecae24a2c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S143192761900196X/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27923,27924,55627</link.rule.ids></links><search><creatorcontrib>MacRae, Colin M.</creatorcontrib><creatorcontrib>Wilson, N.C.</creatorcontrib><creatorcontrib>Torpy, A.</creatorcontrib><creatorcontrib>Hughes, A.E.</creatorcontrib><title>Fast Hyperspectral Soft X-Ray Mapping</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Analytical and Instrumentation Science Symposia</subject><subject>Cameras</subject><subject>Energy</subject><subject>Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques</subject><subject>Mapping</subject><subject>Microscopy</subject><subject>Noise</subject><subject>Sensors</subject><subject>Soft x rays</subject><subject>X-rays</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kE9LAzEQxYMoWKsfwNuCeFydSTbJ5ijFWqEiWIXeQpo_ZUvbXZMtuN_erS14EE8zzLzfe_AIuUa4Q0B5P8OCoaJSoAJAJeYnZNCfeF4i8tOfHfP9_5xcpLQCAAZSDMjt2KQ2m3SNj6nxto1mnc3q0Gbz_M102Ytpmmq7vCRnwayTvzrOIfkYP76PJvn09el59DDNLQX-lTsqjFAlhdIGG0rBqFlIZQWE0gmn0KF1gimrmEUH0hQoJXeFt8bTwlDLhuTm4NvE-nPnU6tX9S5u-0hNueIlZ0xAr8KDysY6peiDbmK1MbHTCHrfhv7TRs-wI2M2i1i5pf-1_p_6Brd8X4s</recordid><startdate>201908</startdate><enddate>201908</enddate><creator>MacRae, Colin M.</creator><creator>Wilson, N.C.</creator><creator>Torpy, A.</creator><creator>Hughes, A.E.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201908</creationdate><title>Fast Hyperspectral Soft X-Ray Mapping</title><author>MacRae, Colin M. ; Wilson, N.C. ; Torpy, A. ; Hughes, A.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c205x-d26a698208cfcf8632ab79c60f8d6d91d1cd639c93c1d07a41775d4ecae24a2c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Analytical and Instrumentation Science Symposia</topic><topic>Cameras</topic><topic>Energy</topic><topic>Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques</topic><topic>Mapping</topic><topic>Microscopy</topic><topic>Noise</topic><topic>Sensors</topic><topic>Soft x rays</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MacRae, Colin M.</creatorcontrib><creatorcontrib>Wilson, N.C.</creatorcontrib><creatorcontrib>Torpy, A.</creatorcontrib><creatorcontrib>Hughes, A.E.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MacRae, Colin M.</au><au>Wilson, N.C.</au><au>Torpy, A.</au><au>Hughes, A.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fast Hyperspectral Soft X-Ray Mapping</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2019-08</date><risdate>2019</risdate><volume>25</volume><issue>S2</issue><spage>246</spage><epage>247</epage><pages>246-247</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S143192761900196X</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
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issn 1431-9276
1435-8115
language eng
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source Cambridge Journals
subjects Analytical and Instrumentation Science Symposia
Cameras
Energy
Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques
Mapping
Microscopy
Noise
Sensors
Soft x rays
X-rays
title Fast Hyperspectral Soft X-Ray Mapping
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T10%3A45%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Fast%20Hyperspectral%20Soft%20X-Ray%20Mapping&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=MacRae,%20Colin%20M.&rft.date=2019-08&rft.volume=25&rft.issue=S2&rft.spage=246&rft.epage=247&rft.pages=246-247&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S143192761900196X&rft_dat=%3Cproquest_cross%3E2595853360%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2595853360&rft_id=info:pmid/&rft_cupid=10_1017_S143192761900196X&rfr_iscdi=true