Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction
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| Veröffentlicht in: | Microscopy and microanalysis 2019-08, Vol.25 (S2), p.2404-2405 |
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| container_issue | S2 |
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| container_title | Microscopy and microanalysis |
| container_volume | 25 |
| creator | Naresh-Kumar, G. Trager-Cowan, C. Winkelmann, A. |
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| doi_str_mv | 10.1017/S1431927619012753 |
| format | Article |
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| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.2404-2405 |
| issn | 1431-9276 1435-8115 |
| language | eng |
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| source | Cambridge University Press Journals Complete |
| subjects | Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials Electron backscatter diffraction Nanotechnology Nanowires Physical Science Symposia Polarity |
| title | Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction |
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