Enhancing the Performance of Lightweight Configurable PUF for Robust IoT Hardware-Assisted Security
Lightweight physical unclonable functions (LPUFs) exploit manufacturing process variations of semiconductor integrated circuits (ICs) to protect IoT-based electronic and smart devices from new cyberattacks. This paper proposes two novel security techniques to enhance the robustness of LPUFs using co...
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description | Lightweight physical unclonable functions (LPUFs) exploit manufacturing process variations of semiconductor integrated circuits (ICs) to protect IoT-based electronic and smart devices from new cyberattacks. This paper proposes two novel security techniques to enhance the robustness of LPUFs using configurable-based ring oscillator PUFs (CF-ROPUFs). These techniques are the intra-die frequency aware (IFA) approach to improve PUF reliability and the logarithmic gamma function ( Ln_{\gamma } ) technique to enhance PUF randomness. The lightweight CF-ROPUF design is realized on hardware, and data samples are collected under varying temperatures and supply voltages over a population of 30 Spartan-3E FPGAs. Experimental results of the IFA technique in terms of average Hamming Weight (HM) demonstrate that the percentage of the reliable RO sample frequencies PUF output is 98.5%. For the analysis, PUF reliability is evaluated in terms of accuracy, repeatability, and reproducibility, the international organization for Standardization (ISO) standards. The results indicate that the RO samples are accurately measured from the CF-ROPUFs mapped in all the chips. After using the proposed 1-out-of-r coding algorithm, the results demonstrate high average repeatability of 98.2% and a magnified average reproducibility of 99.63%. It is also shown that our CF-ROPUF design is immune from accelerated aging impacts reliability issues. Statistical results show that Ln( Ln_{\gamma } ) enhances the normality and mitigate the negative impacts of the systematic process variations on RO sample frequencies. Randomness results show that CF-ROPUF binary response bits can successfully pass the 15 NIST test suites for true randomness with an enhanced percentage, 93.3%, with the application of the 1-out-of-r coding. |
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This paper proposes two novel security techniques to enhance the robustness of LPUFs using configurable-based ring oscillator PUFs (CF-ROPUFs). These techniques are the intra-die frequency aware (IFA) approach to improve PUF reliability and the logarithmic gamma function (<inline-formula> <tex-math notation="LaTeX">Ln_{\gamma } </tex-math></inline-formula>) technique to enhance PUF randomness. The lightweight CF-ROPUF design is realized on hardware, and data samples are collected under varying temperatures and supply voltages over a population of 30 Spartan-3E FPGAs. Experimental results of the IFA technique in terms of average Hamming Weight (HM) demonstrate that the percentage of the reliable RO sample frequencies PUF output is 98.5%. For the analysis, PUF reliability is evaluated in terms of accuracy, repeatability, and reproducibility, the international organization for Standardization (ISO) standards. The results indicate that the RO samples are accurately measured from the CF-ROPUFs mapped in all the chips. After using the proposed 1-out-of-r coding algorithm, the results demonstrate high average repeatability of 98.2% and a magnified average reproducibility of 99.63%. It is also shown that our CF-ROPUF design is immune from accelerated aging impacts reliability issues. Statistical results show that Ln(<inline-formula> <tex-math notation="LaTeX">Ln_{\gamma } </tex-math></inline-formula>) enhances the normality and mitigate the negative impacts of the systematic process variations on RO sample frequencies. Randomness results show that CF-ROPUF binary response bits can successfully pass the 15 NIST test suites for true randomness with an enhanced percentage, 93.3%, with the application of the 1-out-of-r coding.]]></description><identifier>ISSN: 2169-3536</identifier><identifier>EISSN: 2169-3536</identifier><identifier>DOI: 10.1109/ACCESS.2021.3117240</identifier><identifier>CODEN: IAECCG</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Algorithms ; Circuit protection ; Coding ; configurable ROPUF ; Electronic devices ; Encoding ; Fabrication ; Gamma function ; Hardware ; Integrated circuits ; Internet of Things ; ISO standards ; Lightweight ; Lightweight hardware-assisted security ; Normality ; Performance enhancement ; Physical unclonable function ; PUF aging ; PUF reliability ; Randomness ; Reliability ; Reliability analysis ; Reproducibility ; Security ; Standardization ; Statistical methods ; trusted Internet of Thing (IoT) consumer electronic devices</subject><ispartof>IEEE access, 2021, Vol.9, p.136792-136810</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c474t-a72f22f8ef7eaa3046944cf3520249969294977b39f3e265ff1bfed00668d4813</citedby><cites>FETCH-LOGICAL-c474t-a72f22f8ef7eaa3046944cf3520249969294977b39f3e265ff1bfed00668d4813</cites><orcidid>0000-0002-1641-5046 ; 0000-0001-8095-6691 ; 0000-0002-8719-501X ; 0000-0002-1896-1569 ; 0000-0001-6069-9261 ; 0000-0002-4349-144X ; 0000-0002-0396-1347</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9557269$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,860,2096,4010,27610,27900,27901,27902,54908</link.rule.ids></links><search><creatorcontrib>Amsaad, Fathi</creatorcontrib><creatorcontrib>Oun, Ahmed</creatorcontrib><creatorcontrib>Niamat, Mohammed Y.</creatorcontrib><creatorcontrib>Razaque, Abdul</creatorcontrib><creatorcontrib>Kose, Selcuk</creatorcontrib><creatorcontrib>Mahmoud, Mohamed</creatorcontrib><creatorcontrib>Alasmary, Waleed</creatorcontrib><creatorcontrib>Alsolami, Fawaz</creatorcontrib><title>Enhancing the Performance of Lightweight Configurable PUF for Robust IoT Hardware-Assisted Security</title><title>IEEE access</title><addtitle>Access</addtitle><description><![CDATA[Lightweight physical unclonable functions (LPUFs) exploit manufacturing process variations of semiconductor integrated circuits (ICs) to protect IoT-based electronic and smart devices from new cyberattacks. This paper proposes two novel security techniques to enhance the robustness of LPUFs using configurable-based ring oscillator PUFs (CF-ROPUFs). These techniques are the intra-die frequency aware (IFA) approach to improve PUF reliability and the logarithmic gamma function (<inline-formula> <tex-math notation="LaTeX">Ln_{\gamma } </tex-math></inline-formula>) technique to enhance PUF randomness. The lightweight CF-ROPUF design is realized on hardware, and data samples are collected under varying temperatures and supply voltages over a population of 30 Spartan-3E FPGAs. Experimental results of the IFA technique in terms of average Hamming Weight (HM) demonstrate that the percentage of the reliable RO sample frequencies PUF output is 98.5%. For the analysis, PUF reliability is evaluated in terms of accuracy, repeatability, and reproducibility, the international organization for Standardization (ISO) standards. The results indicate that the RO samples are accurately measured from the CF-ROPUFs mapped in all the chips. After using the proposed 1-out-of-r coding algorithm, the results demonstrate high average repeatability of 98.2% and a magnified average reproducibility of 99.63%. It is also shown that our CF-ROPUF design is immune from accelerated aging impacts reliability issues. Statistical results show that Ln(<inline-formula> <tex-math notation="LaTeX">Ln_{\gamma } </tex-math></inline-formula>) enhances the normality and mitigate the negative impacts of the systematic process variations on RO sample frequencies. Randomness results show that CF-ROPUF binary response bits can successfully pass the 15 NIST test suites for true randomness with an enhanced percentage, 93.3%, with the application of the 1-out-of-r coding.]]></description><subject>Algorithms</subject><subject>Circuit protection</subject><subject>Coding</subject><subject>configurable ROPUF</subject><subject>Electronic devices</subject><subject>Encoding</subject><subject>Fabrication</subject><subject>Gamma function</subject><subject>Hardware</subject><subject>Integrated circuits</subject><subject>Internet of Things</subject><subject>ISO standards</subject><subject>Lightweight</subject><subject>Lightweight hardware-assisted security</subject><subject>Normality</subject><subject>Performance enhancement</subject><subject>Physical unclonable function</subject><subject>PUF aging</subject><subject>PUF reliability</subject><subject>Randomness</subject><subject>Reliability</subject><subject>Reliability analysis</subject><subject>Reproducibility</subject><subject>Security</subject><subject>Standardization</subject><subject>Statistical methods</subject><subject>trusted Internet of Thing (IoT) consumer electronic devices</subject><issn>2169-3536</issn><issn>2169-3536</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><sourceid>DOA</sourceid><recordid>eNpNUV1r4zAQNKWFll5-QV8E9-xUn5b1GEx6DQTuaNpnIdu7iUJq9SSb0n9_Sl3K7cOuGGZmtUxR3DG6ZIya-1XTrHe7JaecLQVjmkt6UdxwVplSKFFd_ve-LhYpHWmuOkNK3xTdeji4ofPDnowHIH8gYoivGQESkGz9_jC-w7mTJgzo91N07SnzXh5IJpKn0E5pJJvwTB5d7N9dhHKVkk8j9GQH3RT9-PGjuEJ3SrD4mrfFy8P6uXkst79_bZrVtuyklmPpNEfOsQbU4JygsjJSdihUvkwaUxlupNG6FQYF8Eohshahp7Sq6l7WTNwWm9m3D-5o36J_dfHDBuftJxDi3ro4-u4EFkGg41KDUkIy6JxrZY9AlQHkAvvs9XP2eovh7wRptMcwxSF_33JVM6WprkVmiZnVxZBSBPzeyqg9h2PncOw5HPsVTlbdzSoPAN8Ko5TmlRH_AIUJisc</recordid><startdate>2021</startdate><enddate>2021</enddate><creator>Amsaad, Fathi</creator><creator>Oun, Ahmed</creator><creator>Niamat, Mohammed Y.</creator><creator>Razaque, Abdul</creator><creator>Kose, Selcuk</creator><creator>Mahmoud, Mohamed</creator><creator>Alasmary, Waleed</creator><creator>Alsolami, Fawaz</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0002-1641-5046</orcidid><orcidid>https://orcid.org/0000-0001-8095-6691</orcidid><orcidid>https://orcid.org/0000-0002-8719-501X</orcidid><orcidid>https://orcid.org/0000-0002-1896-1569</orcidid><orcidid>https://orcid.org/0000-0001-6069-9261</orcidid><orcidid>https://orcid.org/0000-0002-4349-144X</orcidid><orcidid>https://orcid.org/0000-0002-0396-1347</orcidid></search><sort><creationdate>2021</creationdate><title>Enhancing the Performance of Lightweight Configurable PUF for Robust IoT Hardware-Assisted Security</title><author>Amsaad, Fathi ; Oun, Ahmed ; Niamat, Mohammed Y. ; Razaque, Abdul ; Kose, Selcuk ; Mahmoud, Mohamed ; Alasmary, Waleed ; Alsolami, Fawaz</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c474t-a72f22f8ef7eaa3046944cf3520249969294977b39f3e265ff1bfed00668d4813</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Algorithms</topic><topic>Circuit protection</topic><topic>Coding</topic><topic>configurable ROPUF</topic><topic>Electronic devices</topic><topic>Encoding</topic><topic>Fabrication</topic><topic>Gamma function</topic><topic>Hardware</topic><topic>Integrated circuits</topic><topic>Internet of Things</topic><topic>ISO standards</topic><topic>Lightweight</topic><topic>Lightweight hardware-assisted security</topic><topic>Normality</topic><topic>Performance enhancement</topic><topic>Physical unclonable function</topic><topic>PUF aging</topic><topic>PUF reliability</topic><topic>Randomness</topic><topic>Reliability</topic><topic>Reliability analysis</topic><topic>Reproducibility</topic><topic>Security</topic><topic>Standardization</topic><topic>Statistical methods</topic><topic>trusted Internet of Thing (IoT) consumer electronic devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Amsaad, Fathi</creatorcontrib><creatorcontrib>Oun, Ahmed</creatorcontrib><creatorcontrib>Niamat, Mohammed Y.</creatorcontrib><creatorcontrib>Razaque, Abdul</creatorcontrib><creatorcontrib>Kose, Selcuk</creatorcontrib><creatorcontrib>Mahmoud, Mohamed</creatorcontrib><creatorcontrib>Alasmary, Waleed</creatorcontrib><creatorcontrib>Alsolami, Fawaz</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>IEEE access</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Amsaad, Fathi</au><au>Oun, Ahmed</au><au>Niamat, Mohammed Y.</au><au>Razaque, Abdul</au><au>Kose, Selcuk</au><au>Mahmoud, Mohamed</au><au>Alasmary, Waleed</au><au>Alsolami, Fawaz</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Enhancing the Performance of Lightweight Configurable PUF for Robust IoT Hardware-Assisted Security</atitle><jtitle>IEEE access</jtitle><stitle>Access</stitle><date>2021</date><risdate>2021</risdate><volume>9</volume><spage>136792</spage><epage>136810</epage><pages>136792-136810</pages><issn>2169-3536</issn><eissn>2169-3536</eissn><coden>IAECCG</coden><abstract><![CDATA[Lightweight physical unclonable functions (LPUFs) exploit manufacturing process variations of semiconductor integrated circuits (ICs) to protect IoT-based electronic and smart devices from new cyberattacks. This paper proposes two novel security techniques to enhance the robustness of LPUFs using configurable-based ring oscillator PUFs (CF-ROPUFs). These techniques are the intra-die frequency aware (IFA) approach to improve PUF reliability and the logarithmic gamma function (<inline-formula> <tex-math notation="LaTeX">Ln_{\gamma } </tex-math></inline-formula>) technique to enhance PUF randomness. The lightweight CF-ROPUF design is realized on hardware, and data samples are collected under varying temperatures and supply voltages over a population of 30 Spartan-3E FPGAs. Experimental results of the IFA technique in terms of average Hamming Weight (HM) demonstrate that the percentage of the reliable RO sample frequencies PUF output is 98.5%. For the analysis, PUF reliability is evaluated in terms of accuracy, repeatability, and reproducibility, the international organization for Standardization (ISO) standards. The results indicate that the RO samples are accurately measured from the CF-ROPUFs mapped in all the chips. After using the proposed 1-out-of-r coding algorithm, the results demonstrate high average repeatability of 98.2% and a magnified average reproducibility of 99.63%. It is also shown that our CF-ROPUF design is immune from accelerated aging impacts reliability issues. Statistical results show that Ln(<inline-formula> <tex-math notation="LaTeX">Ln_{\gamma } </tex-math></inline-formula>) enhances the normality and mitigate the negative impacts of the systematic process variations on RO sample frequencies. Randomness results show that CF-ROPUF binary response bits can successfully pass the 15 NIST test suites for true randomness with an enhanced percentage, 93.3%, with the application of the 1-out-of-r coding.]]></abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/ACCESS.2021.3117240</doi><tpages>19</tpages><orcidid>https://orcid.org/0000-0002-1641-5046</orcidid><orcidid>https://orcid.org/0000-0001-8095-6691</orcidid><orcidid>https://orcid.org/0000-0002-8719-501X</orcidid><orcidid>https://orcid.org/0000-0002-1896-1569</orcidid><orcidid>https://orcid.org/0000-0001-6069-9261</orcidid><orcidid>https://orcid.org/0000-0002-4349-144X</orcidid><orcidid>https://orcid.org/0000-0002-0396-1347</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Algorithms Circuit protection Coding configurable ROPUF Electronic devices Encoding Fabrication Gamma function Hardware Integrated circuits Internet of Things ISO standards Lightweight Lightweight hardware-assisted security Normality Performance enhancement Physical unclonable function PUF aging PUF reliability Randomness Reliability Reliability analysis Reproducibility Security Standardization Statistical methods trusted Internet of Thing (IoT) consumer electronic devices |
title | Enhancing the Performance of Lightweight Configurable PUF for Robust IoT Hardware-Assisted Security |
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