Tuning the randomization of lamellar orientation in poly(3-hexylthiophene) thin films with substrate nano-curvature

We report the effect of substrates with uniform nanocurvature on the structure of deposited thin films of high molecular weight regio-regular poly(3-hexylthiophene) (P3HT). The curvature-induced effects on the in-plane and out-of-plane crystalline structure and the lamellae orientation were investig...

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Veröffentlicht in:	Polymer (Guilford) 2021-09, Vol.230, p.124071, Article 124071
Hauptverfasser:	Ruffino, Roberta, Fichera, Luca, Valenti, Andrea, Jankowski, Maciej, Konovalov, Oleg, Messina, Grazia M.L., Licciardello, Antonino, Tuccitto, Nunzio, Li-Destri, Giovanni, Marletta, Giovanni
Format:	Artikel
Sprache:	eng
Schlagworte:	AFM Atomic force microscopy Conductivity Curvature GID Lamella Lamellae Lamellar structure Molecular weight Orientation Randomization Substrates Synchrotrons Thin films X-ray diffraction
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