PIC-MCC method with finite element solver for Poisson equation used in simulation of the breakdown phase in dense plasma focus devices
Using PIC-MCC method for simulation of the breakdown of plasma focus device we obtained electron energy distribution function, spatial distributions of potential and charged particle densities. Studied is the first phase of the development of ionization process at pressures 133 - 931 Pa. Satisfactor...
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Veröffentlicht in: | Journal of physics. Conference series 2006-07, Vol.44 (1), p.215-220 |
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creator | Yordanov, V Ivanova-Stanik, I Blagoev, A |
description | Using PIC-MCC method for simulation of the breakdown of plasma focus device we obtained electron energy distribution function, spatial distributions of potential and charged particle densities. Studied is the first phase of the development of ionization process at pressures 133 - 931 Pa. Satisfactory agreement with experiment of the PF-1000 operation is observed for pressures in the range 665 - 931 Pa. |
doi_str_mv | 10.1088/1742-6596/44/1/031 |
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fullrecord | <record><control><sourceid>proquest_O3W</sourceid><recordid>TN_cdi_proquest_journals_2580542492</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2580542492</sourcerecordid><originalsourceid>FETCH-LOGICAL-c391t-4c0867d4a25197441b75478e8cdb0da1bb94eaa2d6a708765e29203f401e90ff3</originalsourceid><addsrcrecordid>eNqNkM1KxDAUhYsoOI6-gKuAKxe1SZr-LaX4MzDiLHQd0uaGZmybTtLO4Av43GYYEUEX3s09HL5zL5wguCT4huA8j0jGaJgmRRoxFpEIx-QomH2bxz_0aXDm3Brj2E82Cz5WizJ8KkvUwdgYiXZ6bJDSvR4BQQsd9CNypt2CRcpYtDLaOdMj2Exi1F5MDiTSPXK6m9qDZRQaG0CVBfEmza5HQyMc7CEJvRdDK1wn_Ll6ct7a6hrceXCiROvg4mvPg9f7u5fyMVw-PyzK22VYxwUZQ1bjPM0kEzQhRcYYqbKEZTnktaywFKSqCgZCUJmKDOdZmgAtKI4VwwQKrFQ8D64OdwdrNhO4ka_NZHv_ktMkxwmjrKCeogeqtsY5C4oPVnfCvnOC-b5vvq-T7-vkjHHCfd8-FB5C2gz_46__4H9xfJAq_gR0B45L</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2580542492</pqid></control><display><type>article</type><title>PIC-MCC method with finite element solver for Poisson equation used in simulation of the breakdown phase in dense plasma focus devices</title><source>IOP Publishing Free Content</source><creator>Yordanov, V ; Ivanova-Stanik, I ; Blagoev, A</creator><creatorcontrib>Yordanov, V ; Ivanova-Stanik, I ; Blagoev, A</creatorcontrib><description>Using PIC-MCC method for simulation of the breakdown of plasma focus device we obtained electron energy distribution function, spatial distributions of potential and charged particle densities. Studied is the first phase of the development of ionization process at pressures 133 - 931 Pa. Satisfactory agreement with experiment of the PF-1000 operation is observed for pressures in the range 665 - 931 Pa.</description><identifier>ISSN: 1742-6596</identifier><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/44/1/031</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Breakdown ; Charged particles ; Dense plasmas ; Distribution functions ; Electron energy distribution ; Finite element method ; Focus devices ; Physics ; Plasma focus ; Poisson equation ; Spatial distribution</subject><ispartof>Journal of physics. Conference series, 2006-07, Vol.44 (1), p.215-220</ispartof><rights>Copyright IOP Publishing Jul 2006</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c391t-4c0867d4a25197441b75478e8cdb0da1bb94eaa2d6a708765e29203f401e90ff3</citedby><cites>FETCH-LOGICAL-c391t-4c0867d4a25197441b75478e8cdb0da1bb94eaa2d6a708765e29203f401e90ff3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1742-6596/44/1/031/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,1552,27626,27922,27923,53902,53929</link.rule.ids><linktorsrc>$$Uhttp://iopscience.iop.org/1742-6596/44/1/031$$EView_record_in_IOP_Publishing$$FView_record_in_$$GIOP_Publishing</linktorsrc></links><search><creatorcontrib>Yordanov, V</creatorcontrib><creatorcontrib>Ivanova-Stanik, I</creatorcontrib><creatorcontrib>Blagoev, A</creatorcontrib><title>PIC-MCC method with finite element solver for Poisson equation used in simulation of the breakdown phase in dense plasma focus devices</title><title>Journal of physics. Conference series</title><description>Using PIC-MCC method for simulation of the breakdown of plasma focus device we obtained electron energy distribution function, spatial distributions of potential and charged particle densities. Studied is the first phase of the development of ionization process at pressures 133 - 931 Pa. Satisfactory agreement with experiment of the PF-1000 operation is observed for pressures in the range 665 - 931 Pa.</description><subject>Breakdown</subject><subject>Charged particles</subject><subject>Dense plasmas</subject><subject>Distribution functions</subject><subject>Electron energy distribution</subject><subject>Finite element method</subject><subject>Focus devices</subject><subject>Physics</subject><subject>Plasma focus</subject><subject>Poisson equation</subject><subject>Spatial distribution</subject><issn>1742-6596</issn><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkM1KxDAUhYsoOI6-gKuAKxe1SZr-LaX4MzDiLHQd0uaGZmybTtLO4Av43GYYEUEX3s09HL5zL5wguCT4huA8j0jGaJgmRRoxFpEIx-QomH2bxz_0aXDm3Brj2E82Cz5WizJ8KkvUwdgYiXZ6bJDSvR4BQQsd9CNypt2CRcpYtDLaOdMj2Exi1F5MDiTSPXK6m9qDZRQaG0CVBfEmza5HQyMc7CEJvRdDK1wn_Ll6ct7a6hrceXCiROvg4mvPg9f7u5fyMVw-PyzK22VYxwUZQ1bjPM0kEzQhRcYYqbKEZTnktaywFKSqCgZCUJmKDOdZmgAtKI4VwwQKrFQ8D64OdwdrNhO4ka_NZHv_ktMkxwmjrKCeogeqtsY5C4oPVnfCvnOC-b5vvq-T7-vkjHHCfd8-FB5C2gz_46__4H9xfJAq_gR0B45L</recordid><startdate>20060701</startdate><enddate>20060701</enddate><creator>Yordanov, V</creator><creator>Ivanova-Stanik, I</creator><creator>Blagoev, A</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20060701</creationdate><title>PIC-MCC method with finite element solver for Poisson equation used in simulation of the breakdown phase in dense plasma focus devices</title><author>Yordanov, V ; Ivanova-Stanik, I ; Blagoev, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c391t-4c0867d4a25197441b75478e8cdb0da1bb94eaa2d6a708765e29203f401e90ff3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Breakdown</topic><topic>Charged particles</topic><topic>Dense plasmas</topic><topic>Distribution functions</topic><topic>Electron energy distribution</topic><topic>Finite element method</topic><topic>Focus devices</topic><topic>Physics</topic><topic>Plasma focus</topic><topic>Poisson equation</topic><topic>Spatial distribution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yordanov, V</creatorcontrib><creatorcontrib>Ivanova-Stanik, I</creatorcontrib><creatorcontrib>Blagoev, A</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yordanov, V</au><au>Ivanova-Stanik, I</au><au>Blagoev, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>PIC-MCC method with finite element solver for Poisson equation used in simulation of the breakdown phase in dense plasma focus devices</atitle><jtitle>Journal of physics. Conference series</jtitle><date>2006-07-01</date><risdate>2006</risdate><volume>44</volume><issue>1</issue><spage>215</spage><epage>220</epage><pages>215-220</pages><issn>1742-6596</issn><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>Using PIC-MCC method for simulation of the breakdown of plasma focus device we obtained electron energy distribution function, spatial distributions of potential and charged particle densities. Studied is the first phase of the development of ionization process at pressures 133 - 931 Pa. Satisfactory agreement with experiment of the PF-1000 operation is observed for pressures in the range 665 - 931 Pa.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/44/1/031</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Breakdown Charged particles Dense plasmas Distribution functions Electron energy distribution Finite element method Focus devices Physics Plasma focus Poisson equation Spatial distribution |
title | PIC-MCC method with finite element solver for Poisson equation used in simulation of the breakdown phase in dense plasma focus devices |
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