Microstructure and the grain boundaries evolution in sequential epitaxial buffer layers on RABiTS-Substrates

Epitaxial buffer layers of CeO2 and Yttria-stabilized ZrO2 (YSZ) have been deposited on biaxially textured nickel substrates using reel to reel thermal reactive evaporation, and rf sputtering. The degree of texture of the deposited buffer layers were analysed by X-ray pole figure, Out-of-plane (w-sc...

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Veröffentlicht in:	Journal of physics. Conference series 2008-02, Vol.97 (1), p.012042
Hauptverfasser:	Elmechaouri, M, Mönter, B, Krämer, D, Pusch, H, Jasper, W, Erdman, I, Huehne, R
Format:	Artikel
Sprache:	eng
Schlagworte:	Buffer layers Cerium oxides Conductors Electron backscatter diffraction Grain boundaries Microstructure Physics Sputtering Substrates Texture YBCO superconductors Yttria-stabilized zirconia Yttrium oxide Zirconium dioxide
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