AC-polarized neutron reflectometry: Application to domain dynamics in thin Fe film

AC-polarized neutron reflectometry: Application to domain dynamics in thin Fe film

We report on the first application of polarized neutron reflectometry (PNR) to probe the re-magnetization kinetics in thin films subjected to periodic magnetic fields. Specular PNR and off- specular scattering were recorded from a 100 nm thick MBE grown Fe film under the application of AC magnetic f...

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Veröffentlicht in:Journal of physics. Conference series 2010-02, Vol.211 (1), p.012016
Hauptverfasser: Zhernenkov, K, Klimko, S, Toperverg, B P, Zabel, H
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Sprache:eng
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Magnetic fields
Magnetism
Magnetization reversal
Physics
Reflectometry
Scattering
Thin films
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creator Zhernenkov, K
Klimko, S
Toperverg, B P
Zabel, H
description We report on the first application of polarized neutron reflectometry (PNR) to probe the re-magnetization kinetics in thin films subjected to periodic magnetic fields. Specular PNR and off- specular scattering were recorded from a 100 nm thick MBE grown Fe film under the application of AC magnetic fields with amplitudes up to 60 Oe and frequencies in the range of 0.3 − 1.8 MHz. It was found that up to 0.4 MHz a complete magnetization reversal of the Fe film takes place during each AC field cycle. Higher frequencies cause only a partial re-magnetization and above 0.8 MHz the AC field no longer alters the sample magnetization. High frequencies suppress magnetization fluctuations on a micrometer scale which are otherwise seen via off-specular scattering.
doi_str_mv 10.1088/1742-6596/211/1/012016
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subjects Magnetic fields
Magnetism
Magnetization reversal
Physics
Reflectometry
Scattering
Thin films
title AC-polarized neutron reflectometry: Application to domain dynamics in thin Fe film
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