Surface profile measurement by terahertz interferometric phase imaging
We demonstrate an interferometric phase imaging technique by using a continuous-wave terahertz system with a far-infrared gas laser as the radiation source. A terahertz Michelson interferometer is constructed based on a reflection imaging system. By analyzing the measured fringe patterns, the phase...
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| Veröffentlicht in: | Journal of physics. Conference series 2011-02, Vol.276 (1), p.012222-5 |
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| container_title | Journal of physics. Conference series |
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| creator | Wang, Yingxin Zhao, Ziran Chen, Zhiqiang Zhang, Li Deng, Jingkang |
| description | We demonstrate an interferometric phase imaging technique by using a continuous-wave terahertz system with a far-infrared gas laser as the radiation source. A terahertz Michelson interferometer is constructed based on a reflection imaging system. By analyzing the measured fringe patterns, the phase distribution information can be obtained and then used to reconstruct the profile of the object surface under test. We also show that, for imaging a nearly transparent object with terahertz radiation, our technique can provide a high contrast image which would be quite valuable for accurate identification of the examined object. |
| doi_str_mv | 10.1088/1742-6596/276/1/012222 |
| format | Article |
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We also show that, for imaging a nearly transparent object with terahertz radiation, our technique can provide a high contrast image which would be quite valuable for accurate identification of the examined object.</description><subject>Continuous radiation</subject><subject>Diffraction patterns</subject><subject>Far infrared radiation</subject><subject>Gas lasers</subject><subject>Image contrast</subject><subject>Imaging</subject><subject>Imaging techniques</subject><subject>Infrared lasers</subject><subject>Interferometry</subject><subject>Michelson interferometers</subject><subject>Phase distribution</subject><subject>Physics</subject><subject>Profile measurement</subject><subject>Radiation</subject><subject>Radiation sources</subject><subject>Reflection</subject><issn>1742-6596</issn><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kE1LxDAQhoMouK7-BQl48VKbjzZpj7K4q7DgQT2HNJ3sdumXSXtYf71ZKiqyOJcZyPNO3nkRuqbkjpIsi6lMWCTSXMRMipjGhLJQJ2j2_XD6az5HF97vCOGh5AwtX0ZntQHcu85WNeAGtB8dNNAOuNjjAZzeghs-cNWG2YLrGhhcZXC_1R5w1ehN1W4u0ZnVtYerrz5Hb8uH18VjtH5ePS3u15FJkmSIJJWmzHQBWhBqqMy5LQpGMi5NWqSa5zQNN1ieQZGU2gpOTGI1LSQjZc5Zzufodtob7L6P4AfVVN5AXesWutErKjkhmZQiC-jNH3TXja4N7hRLZc5yxhIRKDFRxnXeO7Cqd-Emt1eUqEO86pCcOiSngjVF1RRvEEaTsOr6H81RVvWlDTw9wv__xyepWolO</recordid><startdate>20110201</startdate><enddate>20110201</enddate><creator>Wang, Yingxin</creator><creator>Zhao, Ziran</creator><creator>Chen, Zhiqiang</creator><creator>Zhang, Li</creator><creator>Deng, Jingkang</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>7U5</scope><scope>8BQ</scope><scope>JG9</scope></search><sort><creationdate>20110201</creationdate><title>Surface profile measurement by terahertz interferometric phase imaging</title><author>Wang, Yingxin ; Zhao, Ziran ; Chen, Zhiqiang ; Zhang, Li ; Deng, Jingkang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c444t-717cd8abea601c1793fbb20837c5b5a3915276f38eb4daf630c4fa1b720d93293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Continuous radiation</topic><topic>Diffraction patterns</topic><topic>Far infrared radiation</topic><topic>Gas lasers</topic><topic>Image contrast</topic><topic>Imaging</topic><topic>Imaging techniques</topic><topic>Infrared lasers</topic><topic>Interferometry</topic><topic>Michelson interferometers</topic><topic>Phase distribution</topic><topic>Physics</topic><topic>Profile measurement</topic><topic>Radiation</topic><topic>Radiation sources</topic><topic>Reflection</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Yingxin</creatorcontrib><creatorcontrib>Zhao, Ziran</creatorcontrib><creatorcontrib>Chen, Zhiqiang</creatorcontrib><creatorcontrib>Zhang, Li</creatorcontrib><creatorcontrib>Deng, Jingkang</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Materials Research Database</collection><jtitle>Journal of physics. 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| subjects | Continuous radiation Diffraction patterns Far infrared radiation Gas lasers Image contrast Imaging Imaging techniques Infrared lasers Interferometry Michelson interferometers Phase distribution Physics Profile measurement Radiation Radiation sources Reflection |
| title | Surface profile measurement by terahertz interferometric phase imaging |
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