Precise mass detector based on "W needle - C nanowire" nanomechanical system
Nanomechanical system (NMS) based on amorphous carbon nanowhiskers localized on the top of tungsten tip were fabricated and investigated. The whiskers were grown in the scanning electron microscope (SEM) chamber using focused electron beam technique. The manipulation of SiO2 and TiO2 nanospheres was...
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Veröffentlicht in: | Journal of physics. Conference series 2016-08, Vol.741 (1), p.12207 |
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creator | Lukashenko, S Y Komissarenko, F E Mukhin, I S Lysak, V V Averkiev, D A Sapozhnikov, I D Golubok, A O |
description | Nanomechanical system (NMS) based on amorphous carbon nanowhiskers localized on the top of tungsten tip were fabricated and investigated. The whiskers were grown in the scanning electron microscope (SEM) chamber using focused electron beam technique. The manipulation of SiO2 and TiO2 nanospheres was provided in SEM by means of dielectrophoretic force. Oscillation trajectories and amplitude-frequency characteristic of the oscillator were visualized at low pressure using a scanning electron microscope. The estimation of mass sensitivity of NMS was conducted. |
doi_str_mv | 10.1088/1742-6596/741/1/012207 |
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The whiskers were grown in the scanning electron microscope (SEM) chamber using focused electron beam technique. The manipulation of SiO2 and TiO2 nanospheres was provided in SEM by means of dielectrophoretic force. Oscillation trajectories and amplitude-frequency characteristic of the oscillator were visualized at low pressure using a scanning electron microscope. The estimation of mass sensitivity of NMS was conducted.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/741/1/012207</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Dielectrophoresis ; Electron beams ; Electron microscopes ; Low pressure ; Nanospheres ; Nanowires ; Physics ; Scanning electron microscopy ; Silicon dioxide ; Titanium dioxide</subject><ispartof>Journal of physics. Conference series, 2016-08, Vol.741 (1), p.12207</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>2016. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). 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The estimation of mass sensitivity of NMS was conducted.</description><subject>Dielectrophoresis</subject><subject>Electron beams</subject><subject>Electron microscopes</subject><subject>Low pressure</subject><subject>Nanospheres</subject><subject>Nanowires</subject><subject>Physics</subject><subject>Scanning electron microscopy</subject><subject>Silicon dioxide</subject><subject>Titanium dioxide</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>O3W</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqFkFtLwzAUgIMoOKd_QcJ88qE2aZMmfZTivDBwoOJjSJNT7FibmnTI_r2dlYkgeF7OgfOdCx9C55RcUSJlTAVLooznWSwYjWlMaJIQcYAm-8bhvpbyGJ2EsCIkHUJM0GLpwdQBcKNDwBZ6ML3zuNQBLHYtnr3iFsCuAUe4wK1u3UftYfZVNWDedFsbvcZhG3poTtFRpdcBzr7zFL3Mb56Lu2jxeHtfXC8ik3LeR0wYzUiZD68JKaTMLBjDgeSSVBZAZgaAJXleVdxy4CUDEJZWpU0FlZTSdIouxr2dd-8bCL1auY1vh5Mq4YJTyXIhBiobKeNdCB4q1fm60X6rKFE7c2onRe0EqcGcomo0NwxejoO16342PyyLp1-c6mw1sMkf7D8HPgGXCXxB</recordid><startdate>20160801</startdate><enddate>20160801</enddate><creator>Lukashenko, S Y</creator><creator>Komissarenko, F E</creator><creator>Mukhin, I S</creator><creator>Lysak, V V</creator><creator>Averkiev, D A</creator><creator>Sapozhnikov, I D</creator><creator>Golubok, A O</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20160801</creationdate><title>Precise mass detector based on "W needle - C nanowire" nanomechanical system</title><author>Lukashenko, S Y ; Komissarenko, F E ; Mukhin, I S ; Lysak, V V ; Averkiev, D A ; Sapozhnikov, I D ; Golubok, A O</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-47ca40b9659787886decc5e0980fdee86cee4299ff5d5e5b4ee7d1fbd37181113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Dielectrophoresis</topic><topic>Electron beams</topic><topic>Electron microscopes</topic><topic>Low pressure</topic><topic>Nanospheres</topic><topic>Nanowires</topic><topic>Physics</topic><topic>Scanning electron microscopy</topic><topic>Silicon dioxide</topic><topic>Titanium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lukashenko, S Y</creatorcontrib><creatorcontrib>Komissarenko, F E</creatorcontrib><creatorcontrib>Mukhin, I S</creatorcontrib><creatorcontrib>Lysak, V V</creatorcontrib><creatorcontrib>Averkiev, D A</creatorcontrib><creatorcontrib>Sapozhnikov, I D</creatorcontrib><creatorcontrib>Golubok, A O</creatorcontrib><collection>Institute of Physics Open Access Journal Titles</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Access via ProQuest (Open Access)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. 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subjects | Dielectrophoresis Electron beams Electron microscopes Low pressure Nanospheres Nanowires Physics Scanning electron microscopy Silicon dioxide Titanium dioxide |
title | Precise mass detector based on "W needle - C nanowire" nanomechanical system |
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