Benchtop Nonresonant X-ray Emission Spectroscopy: Coming Soon to Laboratories and XAS Beamlines Near You?
Recently developed instrumentation at the University of Washington has allowed for nonresonant x-ray emission spectra (XES) to be measured in a laboratory-setting with an inexpensive, easily operated system. We present a critical evaluation of this equipment by means of Kβ and valence-level XES meas...
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| Veröffentlicht in: | Journal of physics. Conference series 2016-05, Vol.712 (1), p.12036 |
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| creator | Mortensen, Devon R. Seidler, Gerald T. Ditter, Alexander S. Glatzel, Pieter |
| description | Recently developed instrumentation at the University of Washington has allowed for nonresonant x-ray emission spectra (XES) to be measured in a laboratory-setting with an inexpensive, easily operated system. We present a critical evaluation of this equipment by means of Kβ and valence-level XES measurements for several Co compounds. We find peak count rates of ∼5000 s for concentrated samples and a robust relative energy scale with reproducibility of 25 meV or better. We furthermore find excellent agreement with synchrotron measurements with only modest loss in energy resolution. Instruments such as ours, based on only conventional sources that are widely sold for elemental analysis by x-ray fluorescence, can fill an important role to diversify the research applications of XES both by their presence in non-synchrotron laboratories and by their use in conjunction with XAFS beamlines where the complementarity of XAFS and XES holds high scientific potential. |
| doi_str_mv | 10.1088/1742-6596/712/1/012036 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_iop_j</sourceid><recordid>TN_cdi_proquest_journals_2575112466</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2575112466</sourcerecordid><originalsourceid>FETCH-LOGICAL-c508t-4f2fcb0307251cd80fd9e17b0721ab45d38f370005cfa05217a328ee32d8a0883</originalsourceid><addsrcrecordid>eNqFUV1LwzAULaLgnP4FCfi0h9p8NE3mi2xjOmVMoQrzKWRt6jK2pCadsH9vRmUiCObl5t57zuFyThRdIniNIOcJYimOM9rPEoZwghKIMCTZUdQ5LI4Pf85PozPvVxCS8Fgn0kNlimVjazCzxilvjTQNmMdO7sB4o73X1oC8VkXjrC9svbsBI7vR5h3kNmwaC6ZyYZ1srNPKA2lKMB_kYKjkZq1NmMyUdODNbm_Po5NKrr26-K7d6PVu_DKaxNOn-4fRYBoXFPImTitcFQtIIMMUFSWHVdlXiC1Cj-QipSXhFWEQQlpUElKMmCSYK0VwyWWwg3SjXqu7lGtRO72Rbies1GIymIr9DCLKMGPsEwXsVYutnf3YKt-Ild06E84TmDKKEE6zLKCyFlUED7xT1UEWQbGPQOzdFXunRYhAINFGEIi4JWpb_yj_S-r9QXp8HuW_cKIuK_IFp7uT1Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2575112466</pqid></control><display><type>article</type><title>Benchtop Nonresonant X-ray Emission Spectroscopy: Coming Soon to Laboratories and XAS Beamlines Near You?</title><source>Institute of Physics Open Access Journal Titles</source><source>Institute of Physics IOPscience extra</source><source>EZB-FREE-00999 freely available EZB journals</source><source>Alma/SFX Local Collection</source><source>Free Full-Text Journals in Chemistry</source><creator>Mortensen, Devon R. ; Seidler, Gerald T. ; Ditter, Alexander S. ; Glatzel, Pieter</creator><creatorcontrib>Mortensen, Devon R. ; Seidler, Gerald T. ; Ditter, Alexander S. ; Glatzel, Pieter</creatorcontrib><description>Recently developed instrumentation at the University of Washington has allowed for nonresonant x-ray emission spectra (XES) to be measured in a laboratory-setting with an inexpensive, easily operated system. We present a critical evaluation of this equipment by means of Kβ and valence-level XES measurements for several Co compounds. We find peak count rates of ∼5000 s for concentrated samples and a robust relative energy scale with reproducibility of 25 meV or better. We furthermore find excellent agreement with synchrotron measurements with only modest loss in energy resolution. Instruments such as ours, based on only conventional sources that are widely sold for elemental analysis by x-ray fluorescence, can fill an important role to diversify the research applications of XES both by their presence in non-synchrotron laboratories and by their use in conjunction with XAFS beamlines where the complementarity of XAFS and XES holds high scientific potential.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/712/1/012036</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Emission spectra ; Energy resolution ; Laboratories ; Physics ; Spectrum analysis ; Synchrotrons ; X-ray fluorescence</subject><ispartof>Journal of physics. Conference series, 2016-05, Vol.712 (1), p.12036</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>2016. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c508t-4f2fcb0307251cd80fd9e17b0721ab45d38f370005cfa05217a328ee32d8a0883</citedby><cites>FETCH-LOGICAL-c508t-4f2fcb0307251cd80fd9e17b0721ab45d38f370005cfa05217a328ee32d8a0883</cites><orcidid>0000-0001-6532-8144</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1742-6596/712/1/012036/pdf$$EPDF$$P50$$Giop$$Hfree_for_read</linktopdf><link.rule.ids>230,309,314,780,784,885,27924,27925,38868,38890,53840,53867</link.rule.ids><backlink>$$Uhttps://hal.science/hal-01572777$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Mortensen, Devon R.</creatorcontrib><creatorcontrib>Seidler, Gerald T.</creatorcontrib><creatorcontrib>Ditter, Alexander S.</creatorcontrib><creatorcontrib>Glatzel, Pieter</creatorcontrib><title>Benchtop Nonresonant X-ray Emission Spectroscopy: Coming Soon to Laboratories and XAS Beamlines Near You?</title><title>Journal of physics. Conference series</title><addtitle>J. Phys.: Conf. Ser</addtitle><description>Recently developed instrumentation at the University of Washington has allowed for nonresonant x-ray emission spectra (XES) to be measured in a laboratory-setting with an inexpensive, easily operated system. We present a critical evaluation of this equipment by means of Kβ and valence-level XES measurements for several Co compounds. We find peak count rates of ∼5000 s for concentrated samples and a robust relative energy scale with reproducibility of 25 meV or better. We furthermore find excellent agreement with synchrotron measurements with only modest loss in energy resolution. Instruments such as ours, based on only conventional sources that are widely sold for elemental analysis by x-ray fluorescence, can fill an important role to diversify the research applications of XES both by their presence in non-synchrotron laboratories and by their use in conjunction with XAFS beamlines where the complementarity of XAFS and XES holds high scientific potential.</description><subject>Emission spectra</subject><subject>Energy resolution</subject><subject>Laboratories</subject><subject>Physics</subject><subject>Spectrum analysis</subject><subject>Synchrotrons</subject><subject>X-ray fluorescence</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>O3W</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqFUV1LwzAULaLgnP4FCfi0h9p8NE3mi2xjOmVMoQrzKWRt6jK2pCadsH9vRmUiCObl5t57zuFyThRdIniNIOcJYimOM9rPEoZwghKIMCTZUdQ5LI4Pf85PozPvVxCS8Fgn0kNlimVjazCzxilvjTQNmMdO7sB4o73X1oC8VkXjrC9svbsBI7vR5h3kNmwaC6ZyYZ1srNPKA2lKMB_kYKjkZq1NmMyUdODNbm_Po5NKrr26-K7d6PVu_DKaxNOn-4fRYBoXFPImTitcFQtIIMMUFSWHVdlXiC1Cj-QipSXhFWEQQlpUElKMmCSYK0VwyWWwg3SjXqu7lGtRO72Rbies1GIymIr9DCLKMGPsEwXsVYutnf3YKt-Ild06E84TmDKKEE6zLKCyFlUED7xT1UEWQbGPQOzdFXunRYhAINFGEIi4JWpb_yj_S-r9QXp8HuW_cKIuK_IFp7uT1Q</recordid><startdate>20160501</startdate><enddate>20160501</enddate><creator>Mortensen, Devon R.</creator><creator>Seidler, Gerald T.</creator><creator>Ditter, Alexander S.</creator><creator>Glatzel, Pieter</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0001-6532-8144</orcidid></search><sort><creationdate>20160501</creationdate><title>Benchtop Nonresonant X-ray Emission Spectroscopy: Coming Soon to Laboratories and XAS Beamlines Near You?</title><author>Mortensen, Devon R. ; Seidler, Gerald T. ; Ditter, Alexander S. ; Glatzel, Pieter</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c508t-4f2fcb0307251cd80fd9e17b0721ab45d38f370005cfa05217a328ee32d8a0883</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Emission spectra</topic><topic>Energy resolution</topic><topic>Laboratories</topic><topic>Physics</topic><topic>Spectrum analysis</topic><topic>Synchrotrons</topic><topic>X-ray fluorescence</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mortensen, Devon R.</creatorcontrib><creatorcontrib>Seidler, Gerald T.</creatorcontrib><creatorcontrib>Ditter, Alexander S.</creatorcontrib><creatorcontrib>Glatzel, Pieter</creatorcontrib><collection>Institute of Physics Open Access Journal Titles</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mortensen, Devon R.</au><au>Seidler, Gerald T.</au><au>Ditter, Alexander S.</au><au>Glatzel, Pieter</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Benchtop Nonresonant X-ray Emission Spectroscopy: Coming Soon to Laboratories and XAS Beamlines Near You?</atitle><jtitle>Journal of physics. Conference series</jtitle><addtitle>J. Phys.: Conf. Ser</addtitle><date>2016-05-01</date><risdate>2016</risdate><volume>712</volume><issue>1</issue><spage>12036</spage><pages>12036-</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>Recently developed instrumentation at the University of Washington has allowed for nonresonant x-ray emission spectra (XES) to be measured in a laboratory-setting with an inexpensive, easily operated system. We present a critical evaluation of this equipment by means of Kβ and valence-level XES measurements for several Co compounds. We find peak count rates of ∼5000 s for concentrated samples and a robust relative energy scale with reproducibility of 25 meV or better. We furthermore find excellent agreement with synchrotron measurements with only modest loss in energy resolution. Instruments such as ours, based on only conventional sources that are widely sold for elemental analysis by x-ray fluorescence, can fill an important role to diversify the research applications of XES both by their presence in non-synchrotron laboratories and by their use in conjunction with XAFS beamlines where the complementarity of XAFS and XES holds high scientific potential.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/712/1/012036</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-6532-8144</orcidid><oa>free_for_read</oa></addata></record> |
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| subjects | Emission spectra Energy resolution Laboratories Physics Spectrum analysis Synchrotrons X-ray fluorescence |
| title | Benchtop Nonresonant X-ray Emission Spectroscopy: Coming Soon to Laboratories and XAS Beamlines Near You? |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T05%3A22%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_iop_j&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Benchtop%20Nonresonant%20X-ray%20Emission%20Spectroscopy:%20Coming%20Soon%20to%20Laboratories%20and%20XAS%20Beamlines%20Near%20You?&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Mortensen,%20Devon%20R.&rft.date=2016-05-01&rft.volume=712&rft.issue=1&rft.spage=12036&rft.pages=12036-&rft.issn=1742-6588&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/712/1/012036&rft_dat=%3Cproquest_iop_j%3E2575112466%3C/proquest_iop_j%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2575112466&rft_id=info:pmid/&rfr_iscdi=true |