Susceptibility of a microcontroller against electrical fast transients disturbances

Susceptibility of a microcontroller against electrical fast transients disturbances

This paper presents a research on the susceptibility of a microcontroller against electrical fast transients (EFT) and the caused failure of the microcontroller. The susceptibility test method is based on an EFT injection probe. According to the result of test, it is found that the susceptibility th...

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Veröffentlicht in:Journal of physics. Conference series 2018-09, Vol.1074 (1), p.12117
Hauptverfasser: Nie, Jiawen, Chen, Xianchao, Shao, Weiheng, Fang, Wenxiao
Format: Artikel
Sprache:eng
Schlagworte:
Electromagnetic compatibility
Latch-up
Microcontrollers
Physics
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Zusammenfassung:This paper presents a research on the susceptibility of a microcontroller against electrical fast transients (EFT) and the caused failure of the microcontroller. The susceptibility test method is based on an EFT injection probe. According to the result of test, it is found that the susceptibility threshold of coupling voltage is 25V and the tested IC was damaged due to latch-up effect. The results would be instructive for the IC application with better electromagnetic compatibility performance.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1074/1/012117