Electrical transport properties of nanocrystalline nickel

Solution phase synthesized Ni nanoparticles(NPs) of Scherrer size 20.5 ± 0.9 nm are characterized systematically using X-ray diffraction (XRD), atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). Their electrical transport properties in temperature range 5 K to 300 K are studie...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Saxena, Monika, Sharma, Vikash, Okram, Gunadhor S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Atomic force microscopy Crystal defects Debye temperature Electron phonon interactions Grain boundaries Nanoparticles Nickel Phonon drag Phonons Photoelectrons Seebeck effect Transport properties X ray photoelectron spectroscopy
Online-Zugang:	Volltext
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