Advanced aperture cantilevers made by focused ion beam for both magnetic domain structure and morphology investigation in high resolution magneto optical microscopy
Magneto-optical microscopy is a well-known and widely used method of magnetic domain structure investigation. Spatial resolution is limited by diffraction limit of the light and practically not exceed 0.5μm. Possibility to overcome diffraction limit by combination of magneto-optical microscopy and m...
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| Veröffentlicht in: | Journal of physics. Conference series 2019-12, Vol.1410 (1), p.12187 |
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| container_title | Journal of physics. Conference series |
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| creator | Vysokikh, Yu E Krasnoborodko, S Yu Kolomiytsev, A S Fedotov, A A Shaposhnikov, A N Bulatov, M F Churikov, D V Shevyakov, V I |
| description | Magneto-optical microscopy is a well-known and widely used method of magnetic domain structure investigation. Spatial resolution is limited by diffraction limit of the light and practically not exceed 0.5μm. Possibility to overcome diffraction limit by combination of magneto-optical microscopy and magnetic-force microscopy was showed earlier [1]. Aperture cantilever was used to light up the sample in near-field mode. In this paper, authors review most popular technology for aperture cantilever production with its advantages and disadvantages. Authors propose new technology based on focused ion beam treatment for creation aperture cantilevers with advanced parameters such as small aperture size and light throughput. Bi-substituted yttrium iron garnet (Bi: YIG) thin films with high magneto-optical activity and different period of domain structure were used as test objects. High resolution images of both morphology and domain structure obtained with new advanced aperture cantilevers are shown. |
| doi_str_mv | 10.1088/1742-6596/1410/1/012187 |
| format | Article |
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Spatial resolution is limited by diffraction limit of the light and practically not exceed 0.5μm. Possibility to overcome diffraction limit by combination of magneto-optical microscopy and magnetic-force microscopy was showed earlier [1]. Aperture cantilever was used to light up the sample in near-field mode. In this paper, authors review most popular technology for aperture cantilever production with its advantages and disadvantages. Authors propose new technology based on focused ion beam treatment for creation aperture cantilevers with advanced parameters such as small aperture size and light throughput. Bi-substituted yttrium iron garnet (Bi: YIG) thin films with high magneto-optical activity and different period of domain structure were used as test objects. High resolution images of both morphology and domain structure obtained with new advanced aperture cantilevers are shown.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/1410/1/012187</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Apertures ; Cantilever beams ; High resolution ; Image resolution ; Ion beams ; Light diffraction ; Magnetic domains ; Microscopes ; Microscopy ; Morphology ; New technology ; Optical activity ; Optical microscopy ; Physics ; Spatial resolution ; Thin films ; Yttrium ; Yttrium-iron garnet</subject><ispartof>Journal of physics. Conference series, 2019-12, Vol.1410 (1), p.12187</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>2019. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2747-f45e6b08f3dc433118a491b9547b2f699da0eb6eef6c2cef203dc2b5b80ccffd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1742-6596/1410/1/012187/pdf$$EPDF$$P50$$Giop$$Hfree_for_read</linktopdf><link.rule.ids>314,780,784,27924,27925,38868,38890,53840,53867</link.rule.ids></links><search><creatorcontrib>Vysokikh, Yu E</creatorcontrib><creatorcontrib>Krasnoborodko, S Yu</creatorcontrib><creatorcontrib>Kolomiytsev, A S</creatorcontrib><creatorcontrib>Fedotov, A A</creatorcontrib><creatorcontrib>Shaposhnikov, A N</creatorcontrib><creatorcontrib>Bulatov, M F</creatorcontrib><creatorcontrib>Churikov, D V</creatorcontrib><creatorcontrib>Shevyakov, V I</creatorcontrib><title>Advanced aperture cantilevers made by focused ion beam for both magnetic domain structure and morphology investigation in high resolution magneto optical microscopy</title><title>Journal of physics. 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High resolution images of both morphology and domain structure obtained with new advanced aperture cantilevers are shown.</description><subject>Apertures</subject><subject>Cantilever beams</subject><subject>High resolution</subject><subject>Image resolution</subject><subject>Ion beams</subject><subject>Light diffraction</subject><subject>Magnetic domains</subject><subject>Microscopes</subject><subject>Microscopy</subject><subject>Morphology</subject><subject>New technology</subject><subject>Optical activity</subject><subject>Optical microscopy</subject><subject>Physics</subject><subject>Spatial resolution</subject><subject>Thin films</subject><subject>Yttrium</subject><subject>Yttrium-iron garnet</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>O3W</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqFkdtq3DAQhk1JoDn0GSroXWG7kg-SfLksObQsJJD0Wugw2lWwLVeyF_w-fdDIcUkJBKIbidH3_zPMn2VfCf5BMOdrwsp8RauarklJ8JqsMckJZ5-ys9efk9c355-z8xifMC7SYWfZ3405yk6DQbKHMIwBkJbd4Bo4QoiolQaQmpD1eowJcr5DCmSbCgEpPxwSse9gcBoZ30rXoTiEUb_4yM6g1of-4Bu_n5DrjhAHt5fDbJLIg9sfUIDom_GltDh55PtkJxvUOh181L6fLrNTK5sIX_7dF9nv66vH7e1qd3fzc7vZrXTOSrayZQVUYW4Lo8uiIITLsiaqrkqmckvr2kgMigJYqnMNNscJzFWlONbaWlNcZN8W3z74P2OaVjz5MXSppcgrygtCGWWJYgs1jxcDWNEH18owCYLFHImYly3mxYs5EkHEEklSFovS-f6_9ceq7--oft1vH96Coje2eAZs0aD3</recordid><startdate>20191201</startdate><enddate>20191201</enddate><creator>Vysokikh, Yu E</creator><creator>Krasnoborodko, S Yu</creator><creator>Kolomiytsev, A S</creator><creator>Fedotov, A A</creator><creator>Shaposhnikov, A N</creator><creator>Bulatov, M F</creator><creator>Churikov, D V</creator><creator>Shevyakov, V I</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20191201</creationdate><title>Advanced aperture cantilevers made by focused ion beam for both magnetic domain structure and morphology investigation in high resolution magneto optical microscopy</title><author>Vysokikh, Yu E ; 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Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vysokikh, Yu E</au><au>Krasnoborodko, S Yu</au><au>Kolomiytsev, A S</au><au>Fedotov, A A</au><au>Shaposhnikov, A N</au><au>Bulatov, M F</au><au>Churikov, D V</au><au>Shevyakov, V I</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced aperture cantilevers made by focused ion beam for both magnetic domain structure and morphology investigation in high resolution magneto optical microscopy</atitle><jtitle>Journal of physics. Conference series</jtitle><addtitle>J. Phys.: Conf. Ser</addtitle><date>2019-12-01</date><risdate>2019</risdate><volume>1410</volume><issue>1</issue><spage>12187</spage><pages>12187-</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>Magneto-optical microscopy is a well-known and widely used method of magnetic domain structure investigation. Spatial resolution is limited by diffraction limit of the light and practically not exceed 0.5μm. Possibility to overcome diffraction limit by combination of magneto-optical microscopy and magnetic-force microscopy was showed earlier [1]. Aperture cantilever was used to light up the sample in near-field mode. In this paper, authors review most popular technology for aperture cantilever production with its advantages and disadvantages. Authors propose new technology based on focused ion beam treatment for creation aperture cantilevers with advanced parameters such as small aperture size and light throughput. Bi-substituted yttrium iron garnet (Bi: YIG) thin films with high magneto-optical activity and different period of domain structure were used as test objects. 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| subjects | Apertures Cantilever beams High resolution Image resolution Ion beams Light diffraction Magnetic domains Microscopes Microscopy Morphology New technology Optical activity Optical microscopy Physics Spatial resolution Thin films Yttrium Yttrium-iron garnet |
| title | Advanced aperture cantilevers made by focused ion beam for both magnetic domain structure and morphology investigation in high resolution magneto optical microscopy |
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