6.5: Highly reliable 1W 638nm Laser Diode

6.5: Highly reliable 1W 638nm Laser Diode

We report the reliability test of tensile‐strained GaInP quantum‐well single‐emitter lasers of 638‐nm wavelength for RGB laser projection. P‐side‐down submounted multimode lasers with 110 μm stripe width were subjected to long‐term aging tests at the CW current of 1.5 A and the heat sink temperature...

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Veröffentlicht in:SID International Symposium Digest of technical papers 2021-08, Vol.52 (S2), p.124-125
Hauptverfasser: Guo, Qiankun, Liu, Wenbin, Hu, Martin, Wang, Weimin, Wu, Shujuan, Li, Chengpeng
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AlGaInP
Emitters
GaInP
Heat sinks
long-term aging
Red laser
reliability
Semiconductor laser
Semiconductor lasers
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container_issue S2
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creator Guo, Qiankun
Liu, Wenbin
Hu, Martin
Wang, Weimin
Wu, Shujuan
Li, Chengpeng
description We report the reliability test of tensile‐strained GaInP quantum‐well single‐emitter lasers of 638‐nm wavelength for RGB laser projection. P‐side‐down submounted multimode lasers with 110 μm stripe width were subjected to long‐term aging tests at the CW current of 1.5 A and the heat sink temperature of 25 Celsius. Except failures caused by current over‐surging, no devices have failed during the long‐term aging tests. The longest test has accumulated 22297.7 hours and the power degrading coefficient is approximately 3%/10000 hours.
doi_str_mv 10.1002/sdtp.15037
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subjects AlGaInP
Emitters
GaInP
Heat sinks
long-term aging
Red laser
reliability
Semiconductor laser
Semiconductor lasers
title 6.5: Highly reliable 1W 638nm Laser Diode
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