A SC PUF Standard Cell Used for Key Generation and Anti-Invasive-Attack Protection
By using metal blocks as the protective coating, placing the sensitive signals in last but second metal (LSM), integrating a low-cost one-time programming (OTP) cell in each PUF unit, the proposed switched-capacitor (SC) PUF can both provide sensitive anti-invasive-attack protective coating and stab...
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| Veröffentlicht in: | IEEE transactions on information forensics and security 2021, Vol.16, p.3958-3973 |
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| container_title | IEEE transactions on information forensics and security |
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| creator | Zhang, Yin He, Zhangqing Wan, Meilin Liu, Jiuyang Gu, Haoshuang Zou, Xuecheng |
| description | By using metal blocks as the protective coating, placing the sensitive signals in last but second metal (LSM), integrating a low-cost one-time programming (OTP) cell in each PUF unit, the proposed switched-capacitor (SC) PUF can both provide sensitive anti-invasive-attack protective coating and stable key for the security chip. Moreover, the circuit parameters and the layout implementation of the SC PUF unit are all compatible with other digital standard cells, which greatly facilitates the integration of SC PUF unit in the security chip by using digital design flow when its function, timing, power, and layout views are characterized using commercial timing and layout extraction tools. The anti-invasive-attack ability, stability, and digital design flow compatibility of the proposed SC PUF standard cell are verified in a security chip by using a standard 0.18- \mu \text{m} CMOS process. The measured bit error rate, bias, average intra-die HD, and average inter-die HD of output keys after OTP is |
| doi_str_mv | 10.1109/TIFS.2021.3089854 |
| format | Article |
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Moreover, the circuit parameters and the layout implementation of the SC PUF unit are all compatible with other digital standard cells, which greatly facilitates the integration of SC PUF unit in the security chip by using digital design flow when its function, timing, power, and layout views are characterized using commercial timing and layout extraction tools. The anti-invasive-attack ability, stability, and digital design flow compatibility of the proposed SC PUF standard cell are verified in a security chip by using a standard 0.18-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> CMOS process. The measured bit error rate, bias, average intra-die HD, and average inter-die HD of output keys after OTP is <10 −4 , 46.72%, 0%, and 50.38% respectively. Finally, the failed probing and destruction attack attempts to the coating also verify the invasive-attack-resistant property of the proposed SC PUF standard cell. 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(IEEE) 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-aace4e9d6c551ccdfa2751aa0e081fed1101e06043915c4cb22c0855eb9e927d3</citedby><cites>FETCH-LOGICAL-c293t-aace4e9d6c551ccdfa2751aa0e081fed1101e06043915c4cb22c0855eb9e927d3</cites><orcidid>0000-0002-6404-5270 ; 0000-0001-9943-2476 ; 0000-0003-1794-7279</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9456955$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,4022,27922,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9456955$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zhang, Yin</creatorcontrib><creatorcontrib>He, Zhangqing</creatorcontrib><creatorcontrib>Wan, Meilin</creatorcontrib><creatorcontrib>Liu, Jiuyang</creatorcontrib><creatorcontrib>Gu, Haoshuang</creatorcontrib><creatorcontrib>Zou, Xuecheng</creatorcontrib><title>A SC PUF Standard Cell Used for Key Generation and Anti-Invasive-Attack Protection</title><title>IEEE transactions on information forensics and security</title><addtitle>TIFS</addtitle><description>By using metal blocks as the protective coating, placing the sensitive signals in last but second metal (LSM), integrating a low-cost one-time programming (OTP) cell in each PUF unit, the proposed switched-capacitor (SC) PUF can both provide sensitive anti-invasive-attack protective coating and stable key for the security chip. Moreover, the circuit parameters and the layout implementation of the SC PUF unit are all compatible with other digital standard cells, which greatly facilitates the integration of SC PUF unit in the security chip by using digital design flow when its function, timing, power, and layout views are characterized using commercial timing and layout extraction tools. The anti-invasive-attack ability, stability, and digital design flow compatibility of the proposed SC PUF standard cell are verified in a security chip by using a standard 0.18-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> CMOS process. The measured bit error rate, bias, average intra-die HD, and average inter-die HD of output keys after OTP is <10 −4 , 46.72%, 0%, and 50.38% respectively. Finally, the failed probing and destruction attack attempts to the coating also verify the invasive-attack-resistant property of the proposed SC PUF standard cell. With the help of SC PUF standard cell, the whole security chip can easily obtain stable keys and sensitive anti-invasive-attack ability by using digital design flow.</description><subject>Bit error rate</subject><subject>Capacitors</subject><subject>Circuits</subject><subject>CMOS</subject><subject>Coatings</subject><subject>Error analysis</subject><subject>Flow stability</subject><subject>invasive attacks</subject><subject>Layout</subject><subject>Layouts</subject><subject>Metals</subject><subject>OTP</subject><subject>protective coating</subject><subject>Protective coatings</subject><subject>PUF</subject><subject>Registers</subject><subject>Security</subject><subject>standard cell</subject><subject>Switched-capacitor</subject><subject>Transmission line measurements</subject><issn>1556-6013</issn><issn>1556-6021</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kFFrwjAQx8PYYM7tA4y9BPZcl0ua2DyWMp1MmEx9DjG9Qp1rXRIFv_1aFJ_uOH7_O-5HyDOwEQDTb6vZZDnijMNIsExnMr0hA5BSJaqb3V57EPfkIYQtY2kKKhuQ75wuC7pYT-gy2qa0vqQF7nZ0HbCkVevpJ57oFBv0NtZtQzuG5k2sk1lztKE-YpLHaN0PXfg2ouuZR3JX2V3Ap0sdkvXkfVV8JPOv6azI54njWsTEWocp6lI5KcG5srJ8LMFahiyDCsvuLUCmWCo0SJe6DeeOZVLiRqPm41IMyet57963fwcM0Wzbg2-6k4ZLxQWMlc46Cs6U820IHiuz9_Wv9ScDzPTqTK_O9OrMRV2XeTlnakS88jqVSksp_gFYKWjf</recordid><startdate>2021</startdate><enddate>2021</enddate><creator>Zhang, Yin</creator><creator>He, Zhangqing</creator><creator>Wan, Meilin</creator><creator>Liu, Jiuyang</creator><creator>Gu, Haoshuang</creator><creator>Zou, Xuecheng</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Moreover, the circuit parameters and the layout implementation of the SC PUF unit are all compatible with other digital standard cells, which greatly facilitates the integration of SC PUF unit in the security chip by using digital design flow when its function, timing, power, and layout views are characterized using commercial timing and layout extraction tools. The anti-invasive-attack ability, stability, and digital design flow compatibility of the proposed SC PUF standard cell are verified in a security chip by using a standard 0.18-<inline-formula> <tex-math notation="LaTeX">\mu \text{m} </tex-math></inline-formula> CMOS process. The measured bit error rate, bias, average intra-die HD, and average inter-die HD of output keys after OTP is <10 −4 , 46.72%, 0%, and 50.38% respectively. Finally, the failed probing and destruction attack attempts to the coating also verify the invasive-attack-resistant property of the proposed SC PUF standard cell. With the help of SC PUF standard cell, the whole security chip can easily obtain stable keys and sensitive anti-invasive-attack ability by using digital design flow.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIFS.2021.3089854</doi><tpages>16</tpages><orcidid>https://orcid.org/0000-0002-6404-5270</orcidid><orcidid>https://orcid.org/0000-0001-9943-2476</orcidid><orcidid>https://orcid.org/0000-0003-1794-7279</orcidid></addata></record> |
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| subjects | Bit error rate Capacitors Circuits CMOS Coatings Error analysis Flow stability invasive attacks Layout Layouts Metals OTP protective coating Protective coatings PUF Registers Security standard cell Switched-capacitor Transmission line measurements |
| title | A SC PUF Standard Cell Used for Key Generation and Anti-Invasive-Attack Protection |
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