Effects of Ar+ irradiation on the performance of memristor based on single-crystalline LiNbO3 thin film

Memristor has become the most promising building block for neuromorphic computing. The memristors based on single-crystalline oxide film exhibit some advantages, such as the uniformity of device property. But currently the high energy consumption of memristor still hinders its future application. In...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2021-08, Vol.32 (15), p.20817-20826
Hauptverfasser:	Xie, Qin, Pan, Xinqiang, Luo, Wenbo, Shuai, Yao, Wu, Chuangui, Wang, Jiejun, Huang, Shitian, Luo, Wen, Zhang, Wanli
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Crystal structure Crystallinity Electric potential Electroforming Energy consumption Film thickness Irradiation Lithium niobates Materials Science Memristors Neuromorphic computing Optical and Electronic Materials Oxide coatings Single crystals Thin films Voltage
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