Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM

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Veröffentlicht in:Microscopy and microanalysis 2021-08, Vol.27 (S1), p.3134-3136
Hauptverfasser: Golla-Schindler, Ute, Wacker, Irene, Schindler, Bernd, Löffler, Ralf, Goll, Dagmar, Schneider, Gerhard, Schröder, Rasmus R.
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container_end_page 3136
container_issue S1
container_start_page 3134
container_title Microscopy and microanalysis
container_volume 27
creator Golla-Schindler, Ute
Wacker, Irene
Schindler, Bernd
Löffler, Ralf
Goll, Dagmar
Schneider, Gerhard
Schröder, Rasmus R.
description
doi_str_mv 10.1017/S1431927621010850
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2556247319</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927621010850</cupid><sourcerecordid>2556247319</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2050-a3faeb826994be6da3eee11a40b07291e6db429a37940fc9e4a8383d11ba07453</originalsourceid><addsrcrecordid>eNp1UU9PwjAUX4wmIvoBvDXxPG3X_fWGOJQE4gE8L2_bGxS3FtsSw2fxy1oGiQfj6fX9_iZ9nnfL6D2jLHlYsJCzLEjiwK00jeiZN3BQ5KeMRef9m_kH_tK7MmZDKeU0iQfe9xwsagEtGStpNRhLprJRugMrlCRgiV0jaUUn7COZdrASckVUQ1CiXu2Jxtb5a9KdUgz5EnZNnqD6MBVYBzoyb7GyWklDVGlBSAf1qonA1rGdMKbvknVf9pzPliOyyOfX3kXjIvHmNIfe-yRfjl_92dvLdDya-VVAI-oDbwDLNIizLCwxroEjImMQ0pImQcYcVIZBBjzJQtpUGYaQ8pTXjJVAkzDiQ-_umLvV6nOHxhYbtdPSVRZBFMVBmLivdSp2VFVaGaOxKbZadKD3BaPF4QbFnxs4Dz95oCu1qFf4G_2_6wdD3Ymx</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2556247319</pqid></control><display><type>article</type><title>Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM</title><source>Alma/SFX Local Collection</source><creator>Golla-Schindler, Ute ; Wacker, Irene ; Schindler, Bernd ; Löffler, Ralf ; Goll, Dagmar ; Schneider, Gerhard ; Schröder, Rasmus R.</creator><creatorcontrib>Golla-Schindler, Ute ; Wacker, Irene ; Schindler, Bernd ; Löffler, Ralf ; Goll, Dagmar ; Schneider, Gerhard ; Schröder, Rasmus R.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927621010850</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Backscattering ; Electrolytes ; Energy ; Field emission ; Materials research ; Microscopy &amp; Spectroscopy of Energy Conversion and Storage Materials ; Physical Sciences Symposia ; Scanning electron microscopy ; Sensors</subject><ispartof>Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.3134-3136</ispartof><rights>Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2050-a3faeb826994be6da3eee11a40b07291e6db429a37940fc9e4a8383d11ba07453</citedby><cites>FETCH-LOGICAL-c2050-a3faeb826994be6da3eee11a40b07291e6db429a37940fc9e4a8383d11ba07453</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,27907,27908</link.rule.ids></links><search><creatorcontrib>Golla-Schindler, Ute</creatorcontrib><creatorcontrib>Wacker, Irene</creatorcontrib><creatorcontrib>Schindler, Bernd</creatorcontrib><creatorcontrib>Löffler, Ralf</creatorcontrib><creatorcontrib>Goll, Dagmar</creatorcontrib><creatorcontrib>Schneider, Gerhard</creatorcontrib><creatorcontrib>Schröder, Rasmus R.</creatorcontrib><title>Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Backscattering</subject><subject>Electrolytes</subject><subject>Energy</subject><subject>Field emission</subject><subject>Materials research</subject><subject>Microscopy &amp; Spectroscopy of Energy Conversion and Storage Materials</subject><subject>Physical Sciences Symposia</subject><subject>Scanning electron microscopy</subject><subject>Sensors</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1UU9PwjAUX4wmIvoBvDXxPG3X_fWGOJQE4gE8L2_bGxS3FtsSw2fxy1oGiQfj6fX9_iZ9nnfL6D2jLHlYsJCzLEjiwK00jeiZN3BQ5KeMRef9m_kH_tK7MmZDKeU0iQfe9xwsagEtGStpNRhLprJRugMrlCRgiV0jaUUn7COZdrASckVUQ1CiXu2Jxtb5a9KdUgz5EnZNnqD6MBVYBzoyb7GyWklDVGlBSAf1qonA1rGdMKbvknVf9pzPliOyyOfX3kXjIvHmNIfe-yRfjl_92dvLdDya-VVAI-oDbwDLNIizLCwxroEjImMQ0pImQcYcVIZBBjzJQtpUGYaQ8pTXjJVAkzDiQ-_umLvV6nOHxhYbtdPSVRZBFMVBmLivdSp2VFVaGaOxKbZadKD3BaPF4QbFnxs4Dz95oCu1qFf4G_2_6wdD3Ymx</recordid><startdate>202108</startdate><enddate>202108</enddate><creator>Golla-Schindler, Ute</creator><creator>Wacker, Irene</creator><creator>Schindler, Bernd</creator><creator>Löffler, Ralf</creator><creator>Goll, Dagmar</creator><creator>Schneider, Gerhard</creator><creator>Schröder, Rasmus R.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>202108</creationdate><title>Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM</title><author>Golla-Schindler, Ute ; Wacker, Irene ; Schindler, Bernd ; Löffler, Ralf ; Goll, Dagmar ; Schneider, Gerhard ; Schröder, Rasmus R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2050-a3faeb826994be6da3eee11a40b07291e6db429a37940fc9e4a8383d11ba07453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Backscattering</topic><topic>Electrolytes</topic><topic>Energy</topic><topic>Field emission</topic><topic>Materials research</topic><topic>Microscopy &amp; Spectroscopy of Energy Conversion and Storage Materials</topic><topic>Physical Sciences Symposia</topic><topic>Scanning electron microscopy</topic><topic>Sensors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Golla-Schindler, Ute</creatorcontrib><creatorcontrib>Wacker, Irene</creatorcontrib><creatorcontrib>Schindler, Bernd</creatorcontrib><creatorcontrib>Löffler, Ralf</creatorcontrib><creatorcontrib>Goll, Dagmar</creatorcontrib><creatorcontrib>Schneider, Gerhard</creatorcontrib><creatorcontrib>Schröder, Rasmus R.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection (ProQuest)</collection><collection>Natural Science Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Golla-Schindler, Ute</au><au>Wacker, Irene</au><au>Schindler, Bernd</au><au>Löffler, Ralf</au><au>Goll, Dagmar</au><au>Schneider, Gerhard</au><au>Schröder, Rasmus R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2021-08</date><risdate>2021</risdate><volume>27</volume><issue>S1</issue><spage>3134</spage><epage>3136</epage><pages>3134-3136</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927621010850</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record>
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ispartof Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.3134-3136
issn 1431-9276
1435-8115
language eng
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source Alma/SFX Local Collection
subjects Backscattering
Electrolytes
Energy
Field emission
Materials research
Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Physical Sciences Symposia
Scanning electron microscopy
Sensors
title Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T14%3A43%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Material%20Contrast%20Information%20at%20the%20limit:%20Imaging%20of%20energy%20related%20materials%20with%20Backscattered%20Electrons%20obtained%20with%20Field%20Emission%20and%20the%20DELTA%20SEM&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Golla-Schindler,%20Ute&rft.date=2021-08&rft.volume=27&rft.issue=S1&rft.spage=3134&rft.epage=3136&rft.pages=3134-3136&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927621010850&rft_dat=%3Cproquest_cross%3E2556247319%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2556247319&rft_id=info:pmid/&rft_cupid=10_1017_S1431927621010850&rfr_iscdi=true