Comparative Study of the Structural Properties for Thin and Thick ZnO Films Deposited on PPC Plastic Substrates
ZnO films with various thicknesses (0.4, 0.6, 0.8, 1 and 1.3 μm) had been prepared on PPC plastic bases by using DC sputtering. XRD results showed that all the films displayed principally ZnO (002) peak at 2θ = 34.115°, 34.01, 34.16, 34.07 and 34.12° with FWHM of 0.41°, 0.34, 0.27, 0.21 and 0.368° r...
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| Veröffentlicht in: | Journal of physics. Conference series 2021-07, Vol.1963 (1), p.12074 |
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| container_title | Journal of physics. Conference series |
| container_volume | 1963 |
| creator | Jandow, N. N. Abbas, A.A. Mohammed, Kh. G. Habubi, N. F. Yam, F.K. |
| description | ZnO films with various thicknesses (0.4, 0.6, 0.8, 1 and 1.3 μm) had been prepared on PPC plastic bases by using DC sputtering. XRD results showed that all the films displayed principally ZnO (002) peak at 2θ = 34.115°, 34.01, 34.16, 34.07 and 34.12° with FWHM of 0.41°, 0.34, 0.27, 0.21 and 0.368° respectively, which is coincide with wurtzite hexagonal phase, indicated that films were preferentially grown along c-axis. XRD results also showed that the lattice constant and the crystallite size for the deposited thin films became larger than those for the thick film 1.3 μm; while the stress and microstrain increased for the thick films. |
| doi_str_mv | 10.1088/1742-6596/1963/1/012074 |
| format | Article |
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| subjects | Comparative studies Crystallites Hexagonal phase Lattice parameters Microstrain Physical properties PPC Plastic Structural Properties Substrates Thick Films Thickness Thin Films Wurtzite Zinc oxide |
| title | Comparative Study of the Structural Properties for Thin and Thick ZnO Films Deposited on PPC Plastic Substrates |
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