Response to Comment on: “Growth, Optical, Thermal, Mechanical, Laser Damage Threshold and Electrical Polarizability of Cadmium Chloride Doped L-Alanine (LACC) Single Crystal for Optoelectronic Applications” [J. Electron. Mater., 48, 7915–22 (2019)]

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format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2529017687</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2529017687</sourcerecordid><originalsourceid>FETCH-LOGICAL-c314t-5a2c39373029ff2cbe0308fdea1b74cfd21807ac85381b59afb5d8295c05b22c3</originalsourceid><addsrcrecordid>eNp9kdGK1DAUhosoOK6-gFcHvNmF6ZikTZt6N3TXVemyoisIIiVtT6dd2qQmGaRezTt4qy83DyJmdha88-qEw_f__wl_EDynZEUJSV9aSpMkDgmjIREio-H8IFhQHkchFcnnh8GCRAkNOYv44-CJtbeEUE4FXQR_PqCdtLIITkOuxxGVA61ewX7369Lo765bwvXk-loOS7jp0IyHxxXWnVTHZSEtGjiXo9ygJwzaTg8NSNXAxYC1MwcM3utBmv6HrPqhdzPoFnLZjP12hLwbtOkbhHM9YQNFuB68tUI4LdZ5fgYfe7UZEHIzW-eNWm0OB2m889b-CFhP0-BDXO__sd_9hi_vVvfRWq3gSjo0qyXEYglpRvl-95MxOGWEZmdfnwaPWjlYfHY_T4JPry9u8jdhcX35Nl8XYR3R2IVcsjrKojQiLGtbVldIIiLaBiWt0rhuG0YFSWUteCRoxTPZVrwRLOM14RXz2pPgxdF3MvrbFq0rb_XWKB9ZMs4yQtNEpJ5iR6o22lqDbTmZfpRmLikpDz2Xx55L33N513M5e1F0FFkPqw2af9b_Uf0F6ZWuZw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2529017687</pqid></control><display><type>article</type><title>Response to Comment on: “Growth, Optical, Thermal, Mechanical, Laser Damage Threshold and Electrical Polarizability of Cadmium Chloride Doped L-Alanine (LACC) Single Crystal for Optoelectronic Applications” [J. Electron. Mater., 48, 7915–22 (2019)]</title><source>SpringerNature Journals</source><creator>Karnan, C.</creator><creatorcontrib>Karnan, C.</creatorcontrib><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-021-08891-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Alanine ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Electronics and Microelectronics ; Instrumentation ; Laser damage ; Letter to the Editor ; Materials Science ; Optical and Electronic Materials ; Optoelectronics ; Single crystals ; Solid State Physics ; Yield point</subject><ispartof>Journal of electronic materials, 2021-06, Vol.50 (6), p.3757-3757</ispartof><rights>The Minerals, Metals &amp; Materials Society 2021</rights><rights>The Minerals, Metals &amp; Materials Society 2021.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0003-3435-6497</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11664-021-08891-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11664-021-08891-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Karnan, C.</creatorcontrib><title>Response to Comment on: “Growth, Optical, Thermal, Mechanical, Laser Damage Threshold and Electrical Polarizability of Cadmium Chloride Doped L-Alanine (LACC) Single Crystal for Optoelectronic Applications” [J. Electron. Mater., 48, 7915–22 (2019)]</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><subject>Alanine</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Electronics and Microelectronics</subject><subject>Instrumentation</subject><subject>Laser damage</subject><subject>Letter to the Editor</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Optoelectronics</subject><subject>Single crystals</subject><subject>Solid State Physics</subject><subject>Yield point</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp9kdGK1DAUhosoOK6-gFcHvNmF6ZikTZt6N3TXVemyoisIIiVtT6dd2qQmGaRezTt4qy83DyJmdha88-qEw_f__wl_EDynZEUJSV9aSpMkDgmjIREio-H8IFhQHkchFcnnh8GCRAkNOYv44-CJtbeEUE4FXQR_PqCdtLIITkOuxxGVA61ewX7369Lo765bwvXk-loOS7jp0IyHxxXWnVTHZSEtGjiXo9ygJwzaTg8NSNXAxYC1MwcM3utBmv6HrPqhdzPoFnLZjP12hLwbtOkbhHM9YQNFuB68tUI4LdZ5fgYfe7UZEHIzW-eNWm0OB2m889b-CFhP0-BDXO__sd_9hi_vVvfRWq3gSjo0qyXEYglpRvl-95MxOGWEZmdfnwaPWjlYfHY_T4JPry9u8jdhcX35Nl8XYR3R2IVcsjrKojQiLGtbVldIIiLaBiWt0rhuG0YFSWUteCRoxTPZVrwRLOM14RXz2pPgxdF3MvrbFq0rb_XWKB9ZMs4yQtNEpJ5iR6o22lqDbTmZfpRmLikpDz2Xx55L33N513M5e1F0FFkPqw2af9b_Uf0F6ZWuZw</recordid><startdate>20210601</startdate><enddate>20210601</enddate><creator>Karnan, C.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope><orcidid>https://orcid.org/0000-0003-3435-6497</orcidid></search><sort><creationdate>20210601</creationdate><title>Response to Comment on: “Growth, Optical, Thermal, Mechanical, Laser Damage Threshold and Electrical Polarizability of Cadmium Chloride Doped L-Alanine (LACC) Single Crystal for Optoelectronic Applications” [J. Electron. Mater., 48, 7915–22 (2019)]</title><author>Karnan, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c314t-5a2c39373029ff2cbe0308fdea1b74cfd21807ac85381b59afb5d8295c05b22c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Alanine</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Electronics and Microelectronics</topic><topic>Instrumentation</topic><topic>Laser damage</topic><topic>Letter to the Editor</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Optoelectronics</topic><topic>Single crystals</topic><topic>Solid State Physics</topic><topic>Yield point</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Karnan, C.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Karnan, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Response to Comment on: “Growth, Optical, Thermal, Mechanical, Laser Damage Threshold and Electrical Polarizability of Cadmium Chloride Doped L-Alanine (LACC) Single Crystal for Optoelectronic Applications” [J. Electron. Mater., 48, 7915–22 (2019)]</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2021-06-01</date><risdate>2021</risdate><volume>50</volume><issue>6</issue><spage>3757</spage><epage>3757</epage><pages>3757-3757</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11664-021-08891-y</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0003-3435-6497</orcidid><oa>free_for_read</oa></addata></record>
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1543-186X
language eng
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subjects Alanine
Characterization and Evaluation of Materials
Chemistry and Materials Science
Electronics and Microelectronics
Instrumentation
Laser damage
Letter to the Editor
Materials Science
Optical and Electronic Materials
Optoelectronics
Single crystals
Solid State Physics
Yield point
title Response to Comment on: “Growth, Optical, Thermal, Mechanical, Laser Damage Threshold and Electrical Polarizability of Cadmium Chloride Doped L-Alanine (LACC) Single Crystal for Optoelectronic Applications” [J. Electron. Mater., 48, 7915–22 (2019)]
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T20%3A45%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Response%20to%20Comment%20on:%20%E2%80%9CGrowth,%20Optical,%20Thermal,%20Mechanical,%20Laser%20Damage%20Threshold%20and%20Electrical%20Polarizability%20of%20Cadmium%20Chloride%20Doped%20L-Alanine%20(LACC)%20Single%20Crystal%20for%20Optoelectronic%20Applications%E2%80%9D%20%5BJ.%20Electron.%20Mater.,%2048,%207915%E2%80%9322%20(2019)%5D&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=Karnan,%20C.&rft.date=2021-06-01&rft.volume=50&rft.issue=6&rft.spage=3757&rft.epage=3757&rft.pages=3757-3757&rft.issn=0361-5235&rft.eissn=1543-186X&rft_id=info:doi/10.1007/s11664-021-08891-y&rft_dat=%3Cproquest_cross%3E2529017687%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2529017687&rft_id=info:pmid/&rfr_iscdi=true