Effects of Temperature and Agitation Time of Triethanolamine as a Complexing Agent in Production of Tin Sulfide Thin Films by CBD
The effects of the temperature and agitation time of the complexing agent on the structural, morphological, compositional, and optical properties of SnS films deposited by chemical bath deposition (CBD) have been studied. The properties of the thin films were studied by X-ray diffraction (XRD) analy...
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Veröffentlicht in: | Journal of electronic materials 2021-06, Vol.50 (6), p.3266-3275 |
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description | The effects of the temperature and agitation time of the complexing agent on the structural, morphological, compositional, and optical properties of SnS films deposited by chemical bath deposition (CBD) have been studied. The properties of the thin films were studied by X-ray diffraction (XRD) analysis, X-ray fluorescence spectroscopy, atomic force microscopy, and ultraviolet–visible–near infrared (UV–Vis–NIR) spectroscopy. The XRD results confirmed formation of polycrystalline films with orthorhombic phase. The best thin film was formed when using an agitation time of the complexing agent of 16 min, resulting in a maximum crystallite size of 8.26 nm, lattice parameters close to reported values (
a
= 4.30 Å,
b
= 10.55 Å, and
c
= 3.89 Å), and a calculated bandgap of around 1.65 eV. Investigation of the trend with deposition temperature indicated that values between 40°C and 45°C during CBD were better. Variation of the deposition temperature resulted in crystallite sizes ranging from 5 nm to 25 nm and bandgap values from 1.62 eV to 1.66 eV. |
doi_str_mv | 10.1007/s11664-021-08810-1 |
format | Article |
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a
= 4.30 Å,
b
= 10.55 Å, and
c
= 3.89 Å), and a calculated bandgap of around 1.65 eV. Investigation of the trend with deposition temperature indicated that values between 40°C and 45°C during CBD were better. Variation of the deposition temperature resulted in crystallite sizes ranging from 5 nm to 25 nm and bandgap values from 1.62 eV to 1.66 eV.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-021-08810-1</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Agitation ; Atomic beam spectroscopy ; Atomic force microscopy ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Crystallites ; Deposition ; Electronics and Microelectronics ; Energy gap ; Infrared spectroscopy ; Instrumentation ; Lattice parameters ; Materials Science ; Mathematical analysis ; Near infrared radiation ; Optical and Electronic Materials ; Optical properties ; Original Research Article ; Orthorhombic phase ; Solid State Physics ; Spectrum analysis ; Temperature effects ; Thin films ; Triethanolamine ; X ray fluorescence analysis ; X-ray diffraction</subject><ispartof>Journal of electronic materials, 2021-06, Vol.50 (6), p.3266-3275</ispartof><rights>The Minerals, Metals & Materials Society 2021</rights><rights>The Minerals, Metals & Materials Society 2021.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-c10d8d065705c361fb7bc535ae939628e6aa881474888599c6dd285e4859b4a63</cites><orcidid>0000-0002-4877-043X ; 0000-0002-9051-072X ; 0000-0002-7992-2950</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11664-021-08810-1$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11664-021-08810-1$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,777,781,27906,27907,41470,42539,51301</link.rule.ids></links><search><creatorcontrib>Meza Avendaño, C. A.</creatorcontrib><creatorcontrib>Pantoja Enríquez, J.</creatorcontrib><creatorcontrib>Conde, J.</creatorcontrib><title>Effects of Temperature and Agitation Time of Triethanolamine as a Complexing Agent in Production of Tin Sulfide Thin Films by CBD</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>The effects of the temperature and agitation time of the complexing agent on the structural, morphological, compositional, and optical properties of SnS films deposited by chemical bath deposition (CBD) have been studied. The properties of the thin films were studied by X-ray diffraction (XRD) analysis, X-ray fluorescence spectroscopy, atomic force microscopy, and ultraviolet–visible–near infrared (UV–Vis–NIR) spectroscopy. The XRD results confirmed formation of polycrystalline films with orthorhombic phase. The best thin film was formed when using an agitation time of the complexing agent of 16 min, resulting in a maximum crystallite size of 8.26 nm, lattice parameters close to reported values (
a
= 4.30 Å,
b
= 10.55 Å, and
c
= 3.89 Å), and a calculated bandgap of around 1.65 eV. Investigation of the trend with deposition temperature indicated that values between 40°C and 45°C during CBD were better. Variation of the deposition temperature resulted in crystallite sizes ranging from 5 nm to 25 nm and bandgap values from 1.62 eV to 1.66 eV.</description><subject>Agitation</subject><subject>Atomic beam spectroscopy</subject><subject>Atomic force microscopy</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Crystallites</subject><subject>Deposition</subject><subject>Electronics and Microelectronics</subject><subject>Energy gap</subject><subject>Infrared spectroscopy</subject><subject>Instrumentation</subject><subject>Lattice parameters</subject><subject>Materials Science</subject><subject>Mathematical analysis</subject><subject>Near infrared radiation</subject><subject>Optical and Electronic Materials</subject><subject>Optical properties</subject><subject>Original Research Article</subject><subject>Orthorhombic phase</subject><subject>Solid State Physics</subject><subject>Spectrum analysis</subject><subject>Temperature effects</subject><subject>Thin films</subject><subject>Triethanolamine</subject><subject>X ray fluorescence analysis</subject><subject>X-ray diffraction</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp9kMFKxDAQhoMouK6-gKeA52qmbdL0uNZdFRYUrOAtpG26m6VNa9KCe_TNzW4Fb56GGb5vhvkRugZyC4Qkdw6AsTggIQSEcyABnKAZ0DgKgLOPUzQjEYOAhhE9RxfO7QgBChxm6HtZ16ocHO5qnKu2V1YOo1VYmgovNnqQg-4MznWrjoTVathK0zWy1cZTDkucdW3fqC9tNt5QZsDa4FfbVWN5dA-an7yNTa0rhfOtb1a6aR0u9ji7f7hEZ7VsnLr6rXP0vlrm2VOwfnl8zhbroAwTMgQlkIpXhNGE0NI_UxdJUdKISpVGKQu5YlL6z-Mk5pzTNC1ZVYWcqtg3RSxZNEc3097edp-jcoPYdaM1_qQIaZgSSAhPPRVOVGk756yqRW91K-1eABGHqMUUtfBRi2PUArwUTZLzsNko-7f6H-sHPuqAkQ</recordid><startdate>20210601</startdate><enddate>20210601</enddate><creator>Meza Avendaño, C. A.</creator><creator>Pantoja Enríquez, J.</creator><creator>Conde, J.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope><orcidid>https://orcid.org/0000-0002-4877-043X</orcidid><orcidid>https://orcid.org/0000-0002-9051-072X</orcidid><orcidid>https://orcid.org/0000-0002-7992-2950</orcidid></search><sort><creationdate>20210601</creationdate><title>Effects of Temperature and Agitation Time of Triethanolamine as a Complexing Agent in Production of Tin Sulfide Thin Films by CBD</title><author>Meza Avendaño, C. A. ; Pantoja Enríquez, J. ; Conde, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-c10d8d065705c361fb7bc535ae939628e6aa881474888599c6dd285e4859b4a63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Agitation</topic><topic>Atomic beam spectroscopy</topic><topic>Atomic force microscopy</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Crystallites</topic><topic>Deposition</topic><topic>Electronics and Microelectronics</topic><topic>Energy gap</topic><topic>Infrared spectroscopy</topic><topic>Instrumentation</topic><topic>Lattice parameters</topic><topic>Materials Science</topic><topic>Mathematical analysis</topic><topic>Near infrared radiation</topic><topic>Optical and Electronic Materials</topic><topic>Optical properties</topic><topic>Original Research Article</topic><topic>Orthorhombic phase</topic><topic>Solid State Physics</topic><topic>Spectrum analysis</topic><topic>Temperature effects</topic><topic>Thin films</topic><topic>Triethanolamine</topic><topic>X ray fluorescence analysis</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Meza Avendaño, C. A.</creatorcontrib><creatorcontrib>Pantoja Enríquez, J.</creatorcontrib><creatorcontrib>Conde, J.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Meza Avendaño, C. A.</au><au>Pantoja Enríquez, J.</au><au>Conde, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of Temperature and Agitation Time of Triethanolamine as a Complexing Agent in Production of Tin Sulfide Thin Films by CBD</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2021-06-01</date><risdate>2021</risdate><volume>50</volume><issue>6</issue><spage>3266</spage><epage>3275</epage><pages>3266-3275</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><abstract>The effects of the temperature and agitation time of the complexing agent on the structural, morphological, compositional, and optical properties of SnS films deposited by chemical bath deposition (CBD) have been studied. The properties of the thin films were studied by X-ray diffraction (XRD) analysis, X-ray fluorescence spectroscopy, atomic force microscopy, and ultraviolet–visible–near infrared (UV–Vis–NIR) spectroscopy. The XRD results confirmed formation of polycrystalline films with orthorhombic phase. The best thin film was formed when using an agitation time of the complexing agent of 16 min, resulting in a maximum crystallite size of 8.26 nm, lattice parameters close to reported values (
a
= 4.30 Å,
b
= 10.55 Å, and
c
= 3.89 Å), and a calculated bandgap of around 1.65 eV. Investigation of the trend with deposition temperature indicated that values between 40°C and 45°C during CBD were better. Variation of the deposition temperature resulted in crystallite sizes ranging from 5 nm to 25 nm and bandgap values from 1.62 eV to 1.66 eV.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11664-021-08810-1</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0002-4877-043X</orcidid><orcidid>https://orcid.org/0000-0002-9051-072X</orcidid><orcidid>https://orcid.org/0000-0002-7992-2950</orcidid></addata></record> |
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subjects | Agitation Atomic beam spectroscopy Atomic force microscopy Characterization and Evaluation of Materials Chemistry and Materials Science Crystallites Deposition Electronics and Microelectronics Energy gap Infrared spectroscopy Instrumentation Lattice parameters Materials Science Mathematical analysis Near infrared radiation Optical and Electronic Materials Optical properties Original Research Article Orthorhombic phase Solid State Physics Spectrum analysis Temperature effects Thin films Triethanolamine X ray fluorescence analysis X-ray diffraction |
title | Effects of Temperature and Agitation Time of Triethanolamine as a Complexing Agent in Production of Tin Sulfide Thin Films by CBD |
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