Optical and Electrophysical Properties of Thin Zinc Oxide Films Doped with Manganese Oxide and Obtained by Laser Deposition
Nanostructured thin films on a silicon substrate were obtained on a ceramic of zinc oxide doped with manganese oxide by high-frequency periodic pulsed laser action with f ~ 10–15 kHz, wavelength λ = 1.064 μm at power density q = 150 MW/cm 2 in a vacuum chamber with p = 2.7 Pa. The surface morphology...
Gespeichert in:
| Veröffentlicht in: | Journal of applied spectroscopy 2021-08, Vol.88 (2), p.283-288 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 288 |
|---|---|
| container_issue | 2 |
| container_start_page | 283 |
| container_title | Journal of applied spectroscopy |
| container_volume | 88 |
| creator | Bosak, N. A. Chumakov, A. N. Shevchenok, A. A. Baran, L. V. Karoza, A. G. Malutina-Bronskaya, V. V. Ivanov, A. A. |
| description | Nanostructured thin films on a silicon substrate were obtained on a ceramic of zinc oxide doped with manganese oxide by high-frequency periodic pulsed laser action with f ~ 10–15 kHz, wavelength λ = 1.064 μm at power density q = 150 MW/cm
2
in a vacuum chamber with p = 2.7 Pa. The surface morphology and the elemental composition of the obtained films were studied using atomic force microscopy, scanning electron microscopy, and X-ray spectral microanalysis. Features of the transmission spectra in the visible, near, and middle IR regions were determined. The electrophysical properties of the ZnO + 2% MnO
2
/Si heterostructure were analyzed. |
| doi_str_mv | 10.1007/s10812-021-01170-y |
| format | Article |
| fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_journals_2526845556</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A682252293</galeid><sourcerecordid>A682252293</sourcerecordid><originalsourceid>FETCH-LOGICAL-c415t-de3740eb1491c45e5bcea46c83cfbd47d1b0c75617d0d333714c54a969b67b573</originalsourceid><addsrcrecordid>eNp9kU9rHCEYh6W00G3aL9CT0FMPk-qo48wx5E8b2LKhTS-9iKPv7BpmdaouydAvXzcbCAsleFBen-d90R9CHyk5pYTIL4mSltYVqWlFKJWkml-hBRWSVW3D5Wu0IPurjjD5Fr1L6Y4Q0rU1WaC_qyk7o0esvcWXI5gcw7SZ02PtppwhZgcJhwHfbpzHv503ePXgLOArN24TviiIxfcub_B37dfaQ4InYN9y1WftfCH6GS91gogvYArJZRf8e_Rm0GOCD0_7Cfp1dXl7_q1arr5en58tK8OpyJUFJjmBnvKOGi5A9AY0b0zLzNBbLi3tiZGiodISyxiTlBvBddd0fSP78gcn6NOh7xTDnx2krO7CLvoyUtWiblouhGieqbUeQTk_hBy12bpk1FnT1oWsO1ao0_9QZVnYOhM8DK7Uj4TPR0JhMjzktd6lpK5__jhm6wNrYkgpwqCm6LY6zooStc9ZHXJWJUz1mLOai8QOUiqwX0N8ft0L1j-on6mK</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2526845556</pqid></control><display><type>article</type><title>Optical and Electrophysical Properties of Thin Zinc Oxide Films Doped with Manganese Oxide and Obtained by Laser Deposition</title><source>SpringerLink Journals - AutoHoldings</source><creator>Bosak, N. A. ; Chumakov, A. N. ; Shevchenok, A. A. ; Baran, L. V. ; Karoza, A. G. ; Malutina-Bronskaya, V. V. ; Ivanov, A. A.</creator><creatorcontrib>Bosak, N. A. ; Chumakov, A. N. ; Shevchenok, A. A. ; Baran, L. V. ; Karoza, A. G. ; Malutina-Bronskaya, V. V. ; Ivanov, A. A.</creatorcontrib><description>Nanostructured thin films on a silicon substrate were obtained on a ceramic of zinc oxide doped with manganese oxide by high-frequency periodic pulsed laser action with f ~ 10–15 kHz, wavelength λ = 1.064 μm at power density q = 150 MW/cm
2
in a vacuum chamber with p = 2.7 Pa. The surface morphology and the elemental composition of the obtained films were studied using atomic force microscopy, scanning electron microscopy, and X-ray spectral microanalysis. Features of the transmission spectra in the visible, near, and middle IR regions were determined. The electrophysical properties of the ZnO + 2% MnO
2
/Si heterostructure were analyzed.</description><identifier>ISSN: 0021-9037</identifier><identifier>EISSN: 1573-8647</identifier><identifier>DOI: 10.1007/s10812-021-01170-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Analysis ; Analytical Chemistry ; Atomic force microscopy ; Atomic/Molecular Structure and Spectra ; Dielectric films ; Heterostructures ; Laser deposition ; Manganese dioxide ; Manganese oxides ; Microscopy ; Morphology ; Optical properties ; Oxide coatings ; Physics ; Physics and Astronomy ; Pulsed lasers ; Silicon ; Silicon substrates ; Thin films ; Vacuum chambers ; X ray spectra ; Zinc oxide ; Zinc oxides</subject><ispartof>Journal of applied spectroscopy, 2021-08, Vol.88 (2), p.283-288</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2021</rights><rights>COPYRIGHT 2021 Springer</rights><rights>Springer Science+Business Media, LLC, part of Springer Nature 2021.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c415t-de3740eb1491c45e5bcea46c83cfbd47d1b0c75617d0d333714c54a969b67b573</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10812-021-01170-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10812-021-01170-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Bosak, N. A.</creatorcontrib><creatorcontrib>Chumakov, A. N.</creatorcontrib><creatorcontrib>Shevchenok, A. A.</creatorcontrib><creatorcontrib>Baran, L. V.</creatorcontrib><creatorcontrib>Karoza, A. G.</creatorcontrib><creatorcontrib>Malutina-Bronskaya, V. V.</creatorcontrib><creatorcontrib>Ivanov, A. A.</creatorcontrib><title>Optical and Electrophysical Properties of Thin Zinc Oxide Films Doped with Manganese Oxide and Obtained by Laser Deposition</title><title>Journal of applied spectroscopy</title><addtitle>J Appl Spectrosc</addtitle><description>Nanostructured thin films on a silicon substrate were obtained on a ceramic of zinc oxide doped with manganese oxide by high-frequency periodic pulsed laser action with f ~ 10–15 kHz, wavelength λ = 1.064 μm at power density q = 150 MW/cm
2
in a vacuum chamber with p = 2.7 Pa. The surface morphology and the elemental composition of the obtained films were studied using atomic force microscopy, scanning electron microscopy, and X-ray spectral microanalysis. Features of the transmission spectra in the visible, near, and middle IR regions were determined. The electrophysical properties of the ZnO + 2% MnO
2
/Si heterostructure were analyzed.</description><subject>Analysis</subject><subject>Analytical Chemistry</subject><subject>Atomic force microscopy</subject><subject>Atomic/Molecular Structure and Spectra</subject><subject>Dielectric films</subject><subject>Heterostructures</subject><subject>Laser deposition</subject><subject>Manganese dioxide</subject><subject>Manganese oxides</subject><subject>Microscopy</subject><subject>Morphology</subject><subject>Optical properties</subject><subject>Oxide coatings</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Pulsed lasers</subject><subject>Silicon</subject><subject>Silicon substrates</subject><subject>Thin films</subject><subject>Vacuum chambers</subject><subject>X ray spectra</subject><subject>Zinc oxide</subject><subject>Zinc oxides</subject><issn>0021-9037</issn><issn>1573-8647</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp9kU9rHCEYh6W00G3aL9CT0FMPk-qo48wx5E8b2LKhTS-9iKPv7BpmdaouydAvXzcbCAsleFBen-d90R9CHyk5pYTIL4mSltYVqWlFKJWkml-hBRWSVW3D5Wu0IPurjjD5Fr1L6Y4Q0rU1WaC_qyk7o0esvcWXI5gcw7SZ02PtppwhZgcJhwHfbpzHv503ePXgLOArN24TviiIxfcub_B37dfaQ4InYN9y1WftfCH6GS91gogvYArJZRf8e_Rm0GOCD0_7Cfp1dXl7_q1arr5en58tK8OpyJUFJjmBnvKOGi5A9AY0b0zLzNBbLi3tiZGiodISyxiTlBvBddd0fSP78gcn6NOh7xTDnx2krO7CLvoyUtWiblouhGieqbUeQTk_hBy12bpk1FnT1oWsO1ao0_9QZVnYOhM8DK7Uj4TPR0JhMjzktd6lpK5__jhm6wNrYkgpwqCm6LY6zooStc9ZHXJWJUz1mLOai8QOUiqwX0N8ft0L1j-on6mK</recordid><startdate>20210819</startdate><enddate>20210819</enddate><creator>Bosak, N. A.</creator><creator>Chumakov, A. N.</creator><creator>Shevchenok, A. A.</creator><creator>Baran, L. V.</creator><creator>Karoza, A. G.</creator><creator>Malutina-Bronskaya, V. V.</creator><creator>Ivanov, A. A.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope></search><sort><creationdate>20210819</creationdate><title>Optical and Electrophysical Properties of Thin Zinc Oxide Films Doped with Manganese Oxide and Obtained by Laser Deposition</title><author>Bosak, N. A. ; Chumakov, A. N. ; Shevchenok, A. A. ; Baran, L. V. ; Karoza, A. G. ; Malutina-Bronskaya, V. V. ; Ivanov, A. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c415t-de3740eb1491c45e5bcea46c83cfbd47d1b0c75617d0d333714c54a969b67b573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Analysis</topic><topic>Analytical Chemistry</topic><topic>Atomic force microscopy</topic><topic>Atomic/Molecular Structure and Spectra</topic><topic>Dielectric films</topic><topic>Heterostructures</topic><topic>Laser deposition</topic><topic>Manganese dioxide</topic><topic>Manganese oxides</topic><topic>Microscopy</topic><topic>Morphology</topic><topic>Optical properties</topic><topic>Oxide coatings</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Pulsed lasers</topic><topic>Silicon</topic><topic>Silicon substrates</topic><topic>Thin films</topic><topic>Vacuum chambers</topic><topic>X ray spectra</topic><topic>Zinc oxide</topic><topic>Zinc oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bosak, N. A.</creatorcontrib><creatorcontrib>Chumakov, A. N.</creatorcontrib><creatorcontrib>Shevchenok, A. A.</creatorcontrib><creatorcontrib>Baran, L. V.</creatorcontrib><creatorcontrib>Karoza, A. G.</creatorcontrib><creatorcontrib>Malutina-Bronskaya, V. V.</creatorcontrib><creatorcontrib>Ivanov, A. A.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><jtitle>Journal of applied spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bosak, N. A.</au><au>Chumakov, A. N.</au><au>Shevchenok, A. A.</au><au>Baran, L. V.</au><au>Karoza, A. G.</au><au>Malutina-Bronskaya, V. V.</au><au>Ivanov, A. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical and Electrophysical Properties of Thin Zinc Oxide Films Doped with Manganese Oxide and Obtained by Laser Deposition</atitle><jtitle>Journal of applied spectroscopy</jtitle><stitle>J Appl Spectrosc</stitle><date>2021-08-19</date><risdate>2021</risdate><volume>88</volume><issue>2</issue><spage>283</spage><epage>288</epage><pages>283-288</pages><issn>0021-9037</issn><eissn>1573-8647</eissn><abstract>Nanostructured thin films on a silicon substrate were obtained on a ceramic of zinc oxide doped with manganese oxide by high-frequency periodic pulsed laser action with f ~ 10–15 kHz, wavelength λ = 1.064 μm at power density q = 150 MW/cm
2
in a vacuum chamber with p = 2.7 Pa. The surface morphology and the elemental composition of the obtained films were studied using atomic force microscopy, scanning electron microscopy, and X-ray spectral microanalysis. Features of the transmission spectra in the visible, near, and middle IR regions were determined. The electrophysical properties of the ZnO + 2% MnO
2
/Si heterostructure were analyzed.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10812-021-01170-y</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-9037 |
| ispartof | Journal of applied spectroscopy, 2021-08, Vol.88 (2), p.283-288 |
| issn | 0021-9037 1573-8647 |
| language | eng |
| recordid | cdi_proquest_journals_2526845556 |
| source | SpringerLink Journals - AutoHoldings |
| subjects | Analysis Analytical Chemistry Atomic force microscopy Atomic/Molecular Structure and Spectra Dielectric films Heterostructures Laser deposition Manganese dioxide Manganese oxides Microscopy Morphology Optical properties Oxide coatings Physics Physics and Astronomy Pulsed lasers Silicon Silicon substrates Thin films Vacuum chambers X ray spectra Zinc oxide Zinc oxides |
| title | Optical and Electrophysical Properties of Thin Zinc Oxide Films Doped with Manganese Oxide and Obtained by Laser Deposition |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T05%3A15%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optical%20and%20Electrophysical%20Properties%20of%20Thin%20Zinc%20Oxide%20Films%20Doped%20with%20Manganese%20Oxide%20and%20Obtained%20by%20Laser%20Deposition&rft.jtitle=Journal%20of%20applied%20spectroscopy&rft.au=Bosak,%20N.%20A.&rft.date=2021-08-19&rft.volume=88&rft.issue=2&rft.spage=283&rft.epage=288&rft.pages=283-288&rft.issn=0021-9037&rft.eissn=1573-8647&rft_id=info:doi/10.1007/s10812-021-01170-y&rft_dat=%3Cgale_proqu%3EA682252293%3C/gale_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2526845556&rft_id=info:pmid/&rft_galeid=A682252293&rfr_iscdi=true |