Error compensation for laser line scanners
•Measurement error model for laser line scanner to simulate the systematic error.•Algorithm to compensate the systematic error on a measurement of geometrical features.•Experimental validation of the algorithm on ring gauges and a gauge block. This paper presents an algorithm to compensate the syste...
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| Veröffentlicht in: | Measurement : journal of the International Measurement Confederation 2021-04, Vol.175, p.109085, Article 109085 |
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| container_title | Measurement : journal of the International Measurement Confederation |
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| creator | Vlaeyen, M. Haitjema, H. Dewulf, W. |
| description | •Measurement error model for laser line scanner to simulate the systematic error.•Algorithm to compensate the systematic error on a measurement of geometrical features.•Experimental validation of the algorithm on ring gauges and a gauge block.
This paper presents an algorithm to compensate the systematic error of lasers line scanned data based on the measurement error model of the measurement system. The iterative process of the algorithm is used to determine geometrical features accurately, solely making use of an optical measurement device. The systematic error on the task-specific measurement is reduced by the algorithm. The validation of the algorithm consists of the evaluation of multiple compensated measurements on calibrated ring gauges with different diameters and similar surface properties as the acquisition artefact of the measurement error model. Furthermore, a validation is performed on a gauge block. Experimental research shows the reduction of the systematic error as a function of the scan strategy due to the compensation by the algorithm. |
| doi_str_mv | 10.1016/j.measurement.2021.109085 |
| format | Article |
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This paper presents an algorithm to compensate the systematic error of lasers line scanned data based on the measurement error model of the measurement system. The iterative process of the algorithm is used to determine geometrical features accurately, solely making use of an optical measurement device. The systematic error on the task-specific measurement is reduced by the algorithm. The validation of the algorithm consists of the evaluation of multiple compensated measurements on calibrated ring gauges with different diameters and similar surface properties as the acquisition artefact of the measurement error model. Furthermore, a validation is performed on a gauge block. Experimental research shows the reduction of the systematic error as a function of the scan strategy due to the compensation by the algorithm.</description><identifier>ISSN: 0263-2241</identifier><identifier>EISSN: 1873-412X</identifier><identifier>DOI: 10.1016/j.measurement.2021.109085</identifier><language>eng</language><publisher>London: Elsevier Ltd</publisher><subject>Algorithms ; Coordinate Measurement Machine (CMM) ; Diameters ; Error analysis ; Error compensation ; Gauges ; Iterative methods ; Laser line scanner ; Lasers ; Measurement errors ; Metrology ; Optical measurement ; Surface properties ; Systematic error ; Systematic errors ; Systematic review</subject><ispartof>Measurement : journal of the International Measurement Confederation, 2021-04, Vol.175, p.109085, Article 109085</ispartof><rights>2021 Elsevier Ltd</rights><rights>Copyright Elsevier Science Ltd. Apr 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c400t-9ea0deceadf4ff83ae48cbdd753aa64f2c44ece65783c5acb26c73c8ae8588313</citedby><cites>FETCH-LOGICAL-c400t-9ea0deceadf4ff83ae48cbdd753aa64f2c44ece65783c5acb26c73c8ae8588313</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0263224121001159$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Vlaeyen, M.</creatorcontrib><creatorcontrib>Haitjema, H.</creatorcontrib><creatorcontrib>Dewulf, W.</creatorcontrib><title>Error compensation for laser line scanners</title><title>Measurement : journal of the International Measurement Confederation</title><description>•Measurement error model for laser line scanner to simulate the systematic error.•Algorithm to compensate the systematic error on a measurement of geometrical features.•Experimental validation of the algorithm on ring gauges and a gauge block.
This paper presents an algorithm to compensate the systematic error of lasers line scanned data based on the measurement error model of the measurement system. The iterative process of the algorithm is used to determine geometrical features accurately, solely making use of an optical measurement device. The systematic error on the task-specific measurement is reduced by the algorithm. The validation of the algorithm consists of the evaluation of multiple compensated measurements on calibrated ring gauges with different diameters and similar surface properties as the acquisition artefact of the measurement error model. Furthermore, a validation is performed on a gauge block. Experimental research shows the reduction of the systematic error as a function of the scan strategy due to the compensation by the algorithm.</description><subject>Algorithms</subject><subject>Coordinate Measurement Machine (CMM)</subject><subject>Diameters</subject><subject>Error analysis</subject><subject>Error compensation</subject><subject>Gauges</subject><subject>Iterative methods</subject><subject>Laser line scanner</subject><subject>Lasers</subject><subject>Measurement errors</subject><subject>Metrology</subject><subject>Optical measurement</subject><subject>Surface properties</subject><subject>Systematic error</subject><subject>Systematic errors</subject><subject>Systematic review</subject><issn>0263-2241</issn><issn>1873-412X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqNUE1LAzEUDKJgrf6Hijdha742mz1KqVUoeFHwFtK3L5Clm9RkK_jvTVkPHr28B_Nm5jFDyC2jS0aZeuiXA9p8TDhgGJecclbwlur6jMyYbkQlGf84JzPKlag4l-ySXOXcU0qVaNWM3K9TimkBcThgyHb0MSxcAfY2Y5k-4CKDDQFTviYXzu4z3vzuOXl_Wr-tnqvt6-Zl9bitQFI6Vi1a2iGg7Zx0TguLUsOu65paWKuk4yBlOau60QJqCzuuoBGgLepaa8HEnNxNvocUP4-YR9PHYwrlpeE1l63UJUZhtRMLUsw5oTOH5Aebvg2j5lSN6c2fasypGjNVU7SrSYslxpfHZDJ4DICdTwij6aL_h8sPg5ZzgQ</recordid><startdate>202104</startdate><enddate>202104</enddate><creator>Vlaeyen, M.</creator><creator>Haitjema, H.</creator><creator>Dewulf, W.</creator><general>Elsevier Ltd</general><general>Elsevier Science Ltd</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>202104</creationdate><title>Error compensation for laser line scanners</title><author>Vlaeyen, M. ; Haitjema, H. ; Dewulf, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c400t-9ea0deceadf4ff83ae48cbdd753aa64f2c44ece65783c5acb26c73c8ae8588313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Algorithms</topic><topic>Coordinate Measurement Machine (CMM)</topic><topic>Diameters</topic><topic>Error analysis</topic><topic>Error compensation</topic><topic>Gauges</topic><topic>Iterative methods</topic><topic>Laser line scanner</topic><topic>Lasers</topic><topic>Measurement errors</topic><topic>Metrology</topic><topic>Optical measurement</topic><topic>Surface properties</topic><topic>Systematic error</topic><topic>Systematic errors</topic><topic>Systematic review</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vlaeyen, M.</creatorcontrib><creatorcontrib>Haitjema, H.</creatorcontrib><creatorcontrib>Dewulf, W.</creatorcontrib><collection>CrossRef</collection><jtitle>Measurement : journal of the International Measurement Confederation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vlaeyen, M.</au><au>Haitjema, H.</au><au>Dewulf, W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Error compensation for laser line scanners</atitle><jtitle>Measurement : journal of the International Measurement Confederation</jtitle><date>2021-04</date><risdate>2021</risdate><volume>175</volume><spage>109085</spage><pages>109085-</pages><artnum>109085</artnum><issn>0263-2241</issn><eissn>1873-412X</eissn><abstract>•Measurement error model for laser line scanner to simulate the systematic error.•Algorithm to compensate the systematic error on a measurement of geometrical features.•Experimental validation of the algorithm on ring gauges and a gauge block.
This paper presents an algorithm to compensate the systematic error of lasers line scanned data based on the measurement error model of the measurement system. The iterative process of the algorithm is used to determine geometrical features accurately, solely making use of an optical measurement device. The systematic error on the task-specific measurement is reduced by the algorithm. The validation of the algorithm consists of the evaluation of multiple compensated measurements on calibrated ring gauges with different diameters and similar surface properties as the acquisition artefact of the measurement error model. Furthermore, a validation is performed on a gauge block. Experimental research shows the reduction of the systematic error as a function of the scan strategy due to the compensation by the algorithm.</abstract><cop>London</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.measurement.2021.109085</doi><oa>free_for_read</oa></addata></record> |
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| ispartof | Measurement : journal of the International Measurement Confederation, 2021-04, Vol.175, p.109085, Article 109085 |
| issn | 0263-2241 1873-412X |
| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Algorithms Coordinate Measurement Machine (CMM) Diameters Error analysis Error compensation Gauges Iterative methods Laser line scanner Lasers Measurement errors Metrology Optical measurement Surface properties Systematic error Systematic errors Systematic review |
| title | Error compensation for laser line scanners |
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