Measurement of the Distribution Profile of Electroluminescence Cutoff Frequencies over the Area of a Light-Emitting Heterostructure

A hardware–software complex that has no analogues in Russia and abroad and that is designed to measure the distribution of the cutoff frequency of electroluminescence over the area of a light-emitting heterostructure (LHS) is described. The complex provides a spatial resolution of 0.65 µm, an upper...

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Veröffentlicht in:	Instruments and experimental techniques (New York) 2021-03, Vol.64 (2), p.259-263
Hauptverfasser:	Frolov, I. V., Sergeev, V. A., Radaev, O. A.
Format:	Artikel
Sprache:	eng
Schlagworte:	CMOS Digital imaging Electrical Engineering Electroluminescence Frequency distribution General Experimental Techniques Heterostructures Homogeneity Light emitting diodes Measurement methods Measurement Science and Instrumentation Physical Chemistry Physics Physics and Astronomy Pulse repetition rate Spatial resolution
Online-Zugang:	Volltext
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