On the self-testing (m,n)-code checker design

On the self-testing (m,n)-code checker design

We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function r...

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Veröffentlicht in:IOP conference series. Materials Science and Engineering 2021-01, Vol.1019 (1), p.12098
Hauptverfasser: Butorina, N, Burkatovskaya, Yu, Pakhomova, E
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Circuits
Segments
Self testing
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Burkatovskaya, Yu
Pakhomova, E
description We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker.
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subjects Circuits
Segments
Self testing
title On the self-testing (m,n)-code checker design
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