Nanotechnology measurements of the Young’s modulus of polymeric materials
Making use of atomic force microscopy (AFM) —known as the state-of-the-art technology for handling matter on an atomic and molecular scale—, this paper describes the use of a nanotechnology technique for characterizing properties of polymeric materials. AFM measurement on two materials (polyamide an...
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| Veröffentlicht in: | Journal of physics. Conference series 2021-03, Vol.1826 (1), p.12004 |
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| creator | Caicedo, J D Pandoli, O G Hernandez, J D Frota, M N |
| description | Making use of atomic force microscopy (AFM) —known as the state-of-the-art technology for handling matter on an atomic and molecular scale—, this paper describes the use of a nanotechnology technique for characterizing properties of polymeric materials. AFM measurement on two materials (polyamide and polystyrene) allowed to compare the performance of two distinct multi-asperity adhesion models based on the JKR (Johnson-Kendall-Robert) and DMT (Derajaguin-Muller-Toporov) theories, when assessing the Young’s Modulus (modulus of elasticity) of the investigated materials. Experimental results confirm that the JKR model processed through a MatLab algorithm produces more reliable results of the Young’s Modulus than the DMT model built-in in the AFM software. |
| doi_str_mv | 10.1088/1742-6596/1826/1/012004 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2511973295</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2511973295</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2494-25f25a20807205052171a5e0022580bc9bed93ad6161afe74166d988798d8e353</originalsourceid><addsrcrecordid>eNo9kE1OwzAQhS0EEqVwBiKxDplx4theogooooINLFhZbjLpj5K42MmiO67B9TgJCUWdxbyR3tM86WPsGuEWQakEZcbjXOg8QcWHlQBygOyETY7O6fFW6pxdhLAFSIeRE_b8YlvXUbFuXe1W-6ghG3pPDbVdiFwVdWuKPlzfrn6-vkPUuLKv-z9j5-p9Q35TRI3tBrV1uGRn1SB09a9T9v5w_zabx4vXx6fZ3SIueKazmIuKC8tBgeQgQHCUaAUBcC4ULAu9pFKntswxR1uRzDDPS62U1KpUlIp0ym4Of3feffYUOrN1vW-HSsMFopYp12NKHlKFdyF4qszObxrr9wbBjOTMyMSMfMxIzqA5kEt_AWapYUc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2511973295</pqid></control><display><type>article</type><title>Nanotechnology measurements of the Young’s modulus of polymeric materials</title><source>IOP Publishing Free Content</source><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>IOPscience extra</source><source>Alma/SFX Local Collection</source><source>Free Full-Text Journals in Chemistry</source><creator>Caicedo, J D ; Pandoli, O G ; Hernandez, J D ; Frota, M N</creator><creatorcontrib>Caicedo, J D ; Pandoli, O G ; Hernandez, J D ; Frota, M N</creatorcontrib><description>Making use of atomic force microscopy (AFM) —known as the state-of-the-art technology for handling matter on an atomic and molecular scale—, this paper describes the use of a nanotechnology technique for characterizing properties of polymeric materials. AFM measurement on two materials (polyamide and polystyrene) allowed to compare the performance of two distinct multi-asperity adhesion models based on the JKR (Johnson-Kendall-Robert) and DMT (Derajaguin-Muller-Toporov) theories, when assessing the Young’s Modulus (modulus of elasticity) of the investigated materials. Experimental results confirm that the JKR model processed through a MatLab algorithm produces more reliable results of the Young’s Modulus than the DMT model built-in in the AFM software.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/1826/1/012004</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Algorithms ; Atomic force microscopy ; Microscopes ; Modulus of elasticity ; Nanotechnology ; Physics ; Polyamide resins ; Polystyrene resins</subject><ispartof>Journal of physics. Conference series, 2021-03, Vol.1826 (1), p.12004</ispartof><rights>2021. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2494-25f25a20807205052171a5e0022580bc9bed93ad6161afe74166d988798d8e353</citedby><cites>FETCH-LOGICAL-c2494-25f25a20807205052171a5e0022580bc9bed93ad6161afe74166d988798d8e353</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Caicedo, J D</creatorcontrib><creatorcontrib>Pandoli, O G</creatorcontrib><creatorcontrib>Hernandez, J D</creatorcontrib><creatorcontrib>Frota, M N</creatorcontrib><title>Nanotechnology measurements of the Young’s modulus of polymeric materials</title><title>Journal of physics. Conference series</title><description>Making use of atomic force microscopy (AFM) —known as the state-of-the-art technology for handling matter on an atomic and molecular scale—, this paper describes the use of a nanotechnology technique for characterizing properties of polymeric materials. AFM measurement on two materials (polyamide and polystyrene) allowed to compare the performance of two distinct multi-asperity adhesion models based on the JKR (Johnson-Kendall-Robert) and DMT (Derajaguin-Muller-Toporov) theories, when assessing the Young’s Modulus (modulus of elasticity) of the investigated materials. Experimental results confirm that the JKR model processed through a MatLab algorithm produces more reliable results of the Young’s Modulus than the DMT model built-in in the AFM software.</description><subject>Algorithms</subject><subject>Atomic force microscopy</subject><subject>Microscopes</subject><subject>Modulus of elasticity</subject><subject>Nanotechnology</subject><subject>Physics</subject><subject>Polyamide resins</subject><subject>Polystyrene resins</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNo9kE1OwzAQhS0EEqVwBiKxDplx4theogooooINLFhZbjLpj5K42MmiO67B9TgJCUWdxbyR3tM86WPsGuEWQakEZcbjXOg8QcWHlQBygOyETY7O6fFW6pxdhLAFSIeRE_b8YlvXUbFuXe1W-6ghG3pPDbVdiFwVdWuKPlzfrn6-vkPUuLKv-z9j5-p9Q35TRI3tBrV1uGRn1SB09a9T9v5w_zabx4vXx6fZ3SIueKazmIuKC8tBgeQgQHCUaAUBcC4ULAu9pFKntswxR1uRzDDPS62U1KpUlIp0ym4Of3feffYUOrN1vW-HSsMFopYp12NKHlKFdyF4qszObxrr9wbBjOTMyMSMfMxIzqA5kEt_AWapYUc</recordid><startdate>20210301</startdate><enddate>20210301</enddate><creator>Caicedo, J D</creator><creator>Pandoli, O G</creator><creator>Hernandez, J D</creator><creator>Frota, M N</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20210301</creationdate><title>Nanotechnology measurements of the Young’s modulus of polymeric materials</title><author>Caicedo, J D ; Pandoli, O G ; Hernandez, J D ; Frota, M N</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2494-25f25a20807205052171a5e0022580bc9bed93ad6161afe74166d988798d8e353</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Algorithms</topic><topic>Atomic force microscopy</topic><topic>Microscopes</topic><topic>Modulus of elasticity</topic><topic>Nanotechnology</topic><topic>Physics</topic><topic>Polyamide resins</topic><topic>Polystyrene resins</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Caicedo, J D</creatorcontrib><creatorcontrib>Pandoli, O G</creatorcontrib><creatorcontrib>Hernandez, J D</creatorcontrib><creatorcontrib>Frota, M N</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Caicedo, J D</au><au>Pandoli, O G</au><au>Hernandez, J D</au><au>Frota, M N</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nanotechnology measurements of the Young’s modulus of polymeric materials</atitle><jtitle>Journal of physics. Conference series</jtitle><date>2021-03-01</date><risdate>2021</risdate><volume>1826</volume><issue>1</issue><spage>12004</spage><pages>12004-</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>Making use of atomic force microscopy (AFM) —known as the state-of-the-art technology for handling matter on an atomic and molecular scale—, this paper describes the use of a nanotechnology technique for characterizing properties of polymeric materials. AFM measurement on two materials (polyamide and polystyrene) allowed to compare the performance of two distinct multi-asperity adhesion models based on the JKR (Johnson-Kendall-Robert) and DMT (Derajaguin-Muller-Toporov) theories, when assessing the Young’s Modulus (modulus of elasticity) of the investigated materials. Experimental results confirm that the JKR model processed through a MatLab algorithm produces more reliable results of the Young’s Modulus than the DMT model built-in in the AFM software.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/1826/1/012004</doi><oa>free_for_read</oa></addata></record> |
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| subjects | Algorithms Atomic force microscopy Microscopes Modulus of elasticity Nanotechnology Physics Polyamide resins Polystyrene resins |
| title | Nanotechnology measurements of the Young’s modulus of polymeric materials |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T22%3A15%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nanotechnology%20measurements%20of%20the%20Young%E2%80%99s%20modulus%20of%20polymeric%20materials&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Caicedo,%20J%20D&rft.date=2021-03-01&rft.volume=1826&rft.issue=1&rft.spage=12004&rft.pages=12004-&rft.issn=1742-6588&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/1826/1/012004&rft_dat=%3Cproquest_cross%3E2511973295%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2511973295&rft_id=info:pmid/&rfr_iscdi=true |