Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering
•Annealing of BaFe12O19/Al2O3 (102) films led to the formation of a layered structure.•Surface layer of BaFe12O19/Al2O3 (102) films could have (00l) crystal texture.•The morphology of the surface BaFe12O19/Al2O3 (102) depends on the substrate temperature.•The thickness of BaFe12O19 film influences t...
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| Veröffentlicht in: | Journal of magnetism and magnetic materials 2021-06, Vol.527, p.167786, Article 167786 |
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| container_title | Journal of magnetism and magnetic materials |
| container_volume | 527 |
| creator | Kostishin, V.G. Mironovich, A.Yu Shakirzyanov, R.I. Isaev, I.M. Timofeev, A.V. Ril, A.I. Lega, P.V. |
| description | •Annealing of BaFe12O19/Al2O3 (102) films led to the formation of a layered structure.•Surface layer of BaFe12O19/Al2O3 (102) films could have (00l) crystal texture.•The morphology of the surface BaFe12O19/Al2O3 (102) depends on the substrate temperature.•The thickness of BaFe12O19 film influences the type of its texture after annealing.
Barium hexaferrite thin films were prepared by ion beam deposition on sapphire (102) single crystal substrates. The structural properties of the films were analyzed by means of X-ray diffraction, atomic force microscopy, magnetic force microscopy and scanning electron microscopy. The obtained results were interpreted as a presence of layered structure with different types of texture and its formation mechanism is proposed. The significant influence of BaFe12O19 thickness on its microstructure was observed. Films obtained under certain conditions are potentially fit for further growing of oriented hexaferrite with out-of-plane orientation of c-axis. |
| doi_str_mv | 10.1016/j.jmmm.2021.167786 |
| format | Article |
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Barium hexaferrite thin films were prepared by ion beam deposition on sapphire (102) single crystal substrates. The structural properties of the films were analyzed by means of X-ray diffraction, atomic force microscopy, magnetic force microscopy and scanning electron microscopy. The obtained results were interpreted as a presence of layered structure with different types of texture and its formation mechanism is proposed. The significant influence of BaFe12O19 thickness on its microstructure was observed. Films obtained under certain conditions are potentially fit for further growing of oriented hexaferrite with out-of-plane orientation of c-axis.</description><identifier>ISSN: 0304-8853</identifier><identifier>EISSN: 1873-4766</identifier><identifier>DOI: 10.1016/j.jmmm.2021.167786</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Atomic force microscopy ; Barium hexaferrite ; Crystal structure ; Crystals ; Epitaxial-like growth ; Film thickness ; Ion beam deposition ; Ion beam sputtering ; Ion beams ; Magnetic fields ; Microscopy ; Sapphire ; Single crystals ; Substrates ; Surface morphology ; Thickness ; Thin films</subject><ispartof>Journal of magnetism and magnetic materials, 2021-06, Vol.527, p.167786, Article 167786</ispartof><rights>2021 Elsevier B.V.</rights><rights>Copyright Elsevier BV Jun 1, 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c328t-b8c6fe29e588d7c13b849fb3d4a4616ffda0a74447b34807d5efc374bf908bb03</citedby><cites>FETCH-LOGICAL-c328t-b8c6fe29e588d7c13b849fb3d4a4616ffda0a74447b34807d5efc374bf908bb03</cites><orcidid>0000-0002-2366-2395 ; 0000-0002-7745-2529</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0304885321000627$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Kostishin, V.G.</creatorcontrib><creatorcontrib>Mironovich, A.Yu</creatorcontrib><creatorcontrib>Shakirzyanov, R.I.</creatorcontrib><creatorcontrib>Isaev, I.M.</creatorcontrib><creatorcontrib>Timofeev, A.V.</creatorcontrib><creatorcontrib>Ril, A.I.</creatorcontrib><creatorcontrib>Lega, P.V.</creatorcontrib><title>Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering</title><title>Journal of magnetism and magnetic materials</title><description>•Annealing of BaFe12O19/Al2O3 (102) films led to the formation of a layered structure.•Surface layer of BaFe12O19/Al2O3 (102) films could have (00l) crystal texture.•The morphology of the surface BaFe12O19/Al2O3 (102) depends on the substrate temperature.•The thickness of BaFe12O19 film influences the type of its texture after annealing.
Barium hexaferrite thin films were prepared by ion beam deposition on sapphire (102) single crystal substrates. The structural properties of the films were analyzed by means of X-ray diffraction, atomic force microscopy, magnetic force microscopy and scanning electron microscopy. The obtained results were interpreted as a presence of layered structure with different types of texture and its formation mechanism is proposed. The significant influence of BaFe12O19 thickness on its microstructure was observed. Films obtained under certain conditions are potentially fit for further growing of oriented hexaferrite with out-of-plane orientation of c-axis.</description><subject>Atomic force microscopy</subject><subject>Barium hexaferrite</subject><subject>Crystal structure</subject><subject>Crystals</subject><subject>Epitaxial-like growth</subject><subject>Film thickness</subject><subject>Ion beam deposition</subject><subject>Ion beam sputtering</subject><subject>Ion beams</subject><subject>Magnetic fields</subject><subject>Microscopy</subject><subject>Sapphire</subject><subject>Single crystals</subject><subject>Substrates</subject><subject>Surface morphology</subject><subject>Thickness</subject><subject>Thin films</subject><issn>0304-8853</issn><issn>1873-4766</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOAyEUhonRxHp5AVckrqfCQIFJ3JjGW9LEja4JMAdl7FwExti3l6auXZGTfP9_OB9CV5QsKaHiplt2fd8va1LTJRVSKnGEFlRJVnEpxDFaEEZ4pdSKnaKzlDpCCOVKLFB-_Qjuc4CUMHgPLuNxwCnH2eU5mi2e4jhBzAESHj2expSxGQYwW2ixNTHMPf6AH-MhxpAB-7DtE26hgGUsyA6HUmjB9DhNc84Qw_B-gU682Sa4_HvP0dvD_ev6qdq8PD6v7zaVY7XKlVVOeKgbWCnVSkeZVbzxlrXccEGF960hRnLOpWVcEdmuwDsmufUNUdYSdo6uD73liq8ZUtbdOMehrNT1iqhSWzdNoeoD5eKYUgSvpxh6E3eaEr23qzu9t6v3dvXBbgndHkJQ_v8dIOrkAgwO2hCLRd2O4b_4L0LUhhY</recordid><startdate>20210601</startdate><enddate>20210601</enddate><creator>Kostishin, V.G.</creator><creator>Mironovich, A.Yu</creator><creator>Shakirzyanov, R.I.</creator><creator>Isaev, I.M.</creator><creator>Timofeev, A.V.</creator><creator>Ril, A.I.</creator><creator>Lega, P.V.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-2366-2395</orcidid><orcidid>https://orcid.org/0000-0002-7745-2529</orcidid></search><sort><creationdate>20210601</creationdate><title>Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering</title><author>Kostishin, V.G. ; Mironovich, A.Yu ; Shakirzyanov, R.I. ; Isaev, I.M. ; Timofeev, A.V. ; Ril, A.I. ; Lega, P.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c328t-b8c6fe29e588d7c13b849fb3d4a4616ffda0a74447b34807d5efc374bf908bb03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Atomic force microscopy</topic><topic>Barium hexaferrite</topic><topic>Crystal structure</topic><topic>Crystals</topic><topic>Epitaxial-like growth</topic><topic>Film thickness</topic><topic>Ion beam deposition</topic><topic>Ion beam sputtering</topic><topic>Ion beams</topic><topic>Magnetic fields</topic><topic>Microscopy</topic><topic>Sapphire</topic><topic>Single crystals</topic><topic>Substrates</topic><topic>Surface morphology</topic><topic>Thickness</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kostishin, V.G.</creatorcontrib><creatorcontrib>Mironovich, A.Yu</creatorcontrib><creatorcontrib>Shakirzyanov, R.I.</creatorcontrib><creatorcontrib>Isaev, I.M.</creatorcontrib><creatorcontrib>Timofeev, A.V.</creatorcontrib><creatorcontrib>Ril, A.I.</creatorcontrib><creatorcontrib>Lega, P.V.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kostishin, V.G.</au><au>Mironovich, A.Yu</au><au>Shakirzyanov, R.I.</au><au>Isaev, I.M.</au><au>Timofeev, A.V.</au><au>Ril, A.I.</au><au>Lega, P.V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2021-06-01</date><risdate>2021</risdate><volume>527</volume><spage>167786</spage><pages>167786-</pages><artnum>167786</artnum><issn>0304-8853</issn><eissn>1873-4766</eissn><abstract>•Annealing of BaFe12O19/Al2O3 (102) films led to the formation of a layered structure.•Surface layer of BaFe12O19/Al2O3 (102) films could have (00l) crystal texture.•The morphology of the surface BaFe12O19/Al2O3 (102) depends on the substrate temperature.•The thickness of BaFe12O19 film influences the type of its texture after annealing.
Barium hexaferrite thin films were prepared by ion beam deposition on sapphire (102) single crystal substrates. The structural properties of the films were analyzed by means of X-ray diffraction, atomic force microscopy, magnetic force microscopy and scanning electron microscopy. The obtained results were interpreted as a presence of layered structure with different types of texture and its formation mechanism is proposed. The significant influence of BaFe12O19 thickness on its microstructure was observed. Films obtained under certain conditions are potentially fit for further growing of oriented hexaferrite with out-of-plane orientation of c-axis.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jmmm.2021.167786</doi><orcidid>https://orcid.org/0000-0002-2366-2395</orcidid><orcidid>https://orcid.org/0000-0002-7745-2529</orcidid></addata></record> |
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| subjects | Atomic force microscopy Barium hexaferrite Crystal structure Crystals Epitaxial-like growth Film thickness Ion beam deposition Ion beam sputtering Ion beams Magnetic fields Microscopy Sapphire Single crystals Substrates Surface morphology Thickness Thin films |
| title | Thickness effect on structural properties of post annealed barium hexaferrite films deposited by ion beam sputtering |
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