Optical properties of silicon-implanted polycrystalline diamond membranes
We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline gr...
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| Veröffentlicht in: | Carbon (New York) 2021-04, Vol.174, p.295-304 |
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| creator | Kambalathmana, H. Flatae, A.M. Hunold, L. Sledz, F. Müller, J. Hepp, M. Schmuki, P. Killian, M.S. Lagomarsino, S. Gelli, N. Sciortino, S. Giuntini, L. Wörner, E. Wild, C. Butz, B. Agio, M. |
| description | We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline grains and in the grain boundaries, identifying conditions for the addressability of single SiV centers. Moreover, we perform a scanning transmission electron microscopy (STEM) analysis, which associates the microscopic structure of the membranes and the evolution of the diamond crystals along the growth direction with the photoluminescence properties, as well as a time-of-flight secondary ion mass spectrometry (ToF-SIMS) to address the distribution of Si in implanted and un-implanted membranes. The results of the STEM and ToF-SIMS studies are consistent with the outcome of the optical measurements and provide useful insight into the preparation of polycrystalline samples for quantum nano-optics.
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| doi_str_mv | 10.1016/j.carbon.2020.12.031 |
| format | Article |
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[Display omitted]</description><identifier>ISSN: 0008-6223</identifier><identifier>EISSN: 1873-3891</identifier><identifier>DOI: 10.1016/j.carbon.2020.12.031</identifier><language>eng</language><publisher>New York: Elsevier Ltd</publisher><subject>Color centers ; Correlation analysis ; Crystal growth ; Crystal structure ; CVD diamond Films ; Diamonds ; Emission analysis ; Grain boundaries ; Ion implantation ; Luminescence ; Membranes ; Nano-optics ; Optical measurement ; Optical properties ; Photoluminescence ; Polycrystalline diamond ; Polycrystals ; Scanning electron microscopy ; Scanning transmission electron microscopy ; Secondary ion mass spectrometry ; Silicon ; Silicon-vacancy center ; Spectroscopy and confocal mapping ; STEM analysis ; ToF-SIMS analysis</subject><ispartof>Carbon (New York), 2021-04, Vol.174, p.295-304</ispartof><rights>2020 Elsevier Ltd</rights><rights>Copyright Elsevier BV Apr 15, 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c380t-e43b45c72be7264fc5433838705f0d90bc068d6ac225d56eff2ee55290075553</citedby><cites>FETCH-LOGICAL-c380t-e43b45c72be7264fc5433838705f0d90bc068d6ac225d56eff2ee55290075553</cites><orcidid>0000-0003-0570-7489 ; 0000-0003-0892-4614 ; 0000-0002-9073-669X ; 0000-0002-5811-8672 ; 0000-0003-4563-2709</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0008622320312082$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Kambalathmana, H.</creatorcontrib><creatorcontrib>Flatae, A.M.</creatorcontrib><creatorcontrib>Hunold, L.</creatorcontrib><creatorcontrib>Sledz, F.</creatorcontrib><creatorcontrib>Müller, J.</creatorcontrib><creatorcontrib>Hepp, M.</creatorcontrib><creatorcontrib>Schmuki, P.</creatorcontrib><creatorcontrib>Killian, M.S.</creatorcontrib><creatorcontrib>Lagomarsino, S.</creatorcontrib><creatorcontrib>Gelli, N.</creatorcontrib><creatorcontrib>Sciortino, S.</creatorcontrib><creatorcontrib>Giuntini, L.</creatorcontrib><creatorcontrib>Wörner, E.</creatorcontrib><creatorcontrib>Wild, C.</creatorcontrib><creatorcontrib>Butz, B.</creatorcontrib><creatorcontrib>Agio, M.</creatorcontrib><title>Optical properties of silicon-implanted polycrystalline diamond membranes</title><title>Carbon (New York)</title><description>We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline grains and in the grain boundaries, identifying conditions for the addressability of single SiV centers. Moreover, we perform a scanning transmission electron microscopy (STEM) analysis, which associates the microscopic structure of the membranes and the evolution of the diamond crystals along the growth direction with the photoluminescence properties, as well as a time-of-flight secondary ion mass spectrometry (ToF-SIMS) to address the distribution of Si in implanted and un-implanted membranes. The results of the STEM and ToF-SIMS studies are consistent with the outcome of the optical measurements and provide useful insight into the preparation of polycrystalline samples for quantum nano-optics.
[Display omitted]</description><subject>Color centers</subject><subject>Correlation analysis</subject><subject>Crystal growth</subject><subject>Crystal structure</subject><subject>CVD diamond Films</subject><subject>Diamonds</subject><subject>Emission analysis</subject><subject>Grain boundaries</subject><subject>Ion implantation</subject><subject>Luminescence</subject><subject>Membranes</subject><subject>Nano-optics</subject><subject>Optical measurement</subject><subject>Optical properties</subject><subject>Photoluminescence</subject><subject>Polycrystalline diamond</subject><subject>Polycrystals</subject><subject>Scanning electron microscopy</subject><subject>Scanning transmission electron microscopy</subject><subject>Secondary ion mass spectrometry</subject><subject>Silicon</subject><subject>Silicon-vacancy center</subject><subject>Spectroscopy and confocal mapping</subject><subject>STEM analysis</subject><subject>ToF-SIMS analysis</subject><issn>0008-6223</issn><issn>1873-3891</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp9kE9rwzAMxc3YYF23b7BDYOd0sh0n7mUwxv4UCr30bhxbAYfEzux00G8_l-y8k5B470n6EfJIYUOB1s_9xujYBr9hwPKIbYDTK7KisuEll1t6TVYAIMuaMX5L7lLqc1tJWq3I7jDNzuihmGKYMM4OUxG6IrnBmeBLN06D9jPaYgrD2cRzmvUwOI-FdXoM3hYjjm3UHtM9uen0kPDhr67J8eP9-PZV7g-fu7fXfWm4hLnEireVMA1rsWF11RlRcS65bEB0YLfQGqilrbVhTFhRY9cxRCHYFqARQvA1eVpi88HfJ0yz6sMp-rxRMQH1RSN4VlWLysSQUsROTdGNOp4VBXVhpnq1MFMXZooylZll28tiw_zAj8OoknHoDVoX0czKBvd_wC-DGHcG</recordid><startdate>20210415</startdate><enddate>20210415</enddate><creator>Kambalathmana, H.</creator><creator>Flatae, A.M.</creator><creator>Hunold, L.</creator><creator>Sledz, F.</creator><creator>Müller, J.</creator><creator>Hepp, M.</creator><creator>Schmuki, P.</creator><creator>Killian, M.S.</creator><creator>Lagomarsino, S.</creator><creator>Gelli, N.</creator><creator>Sciortino, S.</creator><creator>Giuntini, L.</creator><creator>Wörner, E.</creator><creator>Wild, C.</creator><creator>Butz, B.</creator><creator>Agio, M.</creator><general>Elsevier Ltd</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0003-0570-7489</orcidid><orcidid>https://orcid.org/0000-0003-0892-4614</orcidid><orcidid>https://orcid.org/0000-0002-9073-669X</orcidid><orcidid>https://orcid.org/0000-0002-5811-8672</orcidid><orcidid>https://orcid.org/0000-0003-4563-2709</orcidid></search><sort><creationdate>20210415</creationdate><title>Optical properties of silicon-implanted polycrystalline diamond membranes</title><author>Kambalathmana, H. ; Flatae, A.M. ; Hunold, L. ; Sledz, F. ; Müller, J. ; Hepp, M. ; Schmuki, P. ; Killian, M.S. ; Lagomarsino, S. ; Gelli, N. ; Sciortino, S. ; Giuntini, L. ; Wörner, E. ; Wild, C. ; Butz, B. ; Agio, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-e43b45c72be7264fc5433838705f0d90bc068d6ac225d56eff2ee55290075553</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Color centers</topic><topic>Correlation analysis</topic><topic>Crystal growth</topic><topic>Crystal structure</topic><topic>CVD diamond Films</topic><topic>Diamonds</topic><topic>Emission analysis</topic><topic>Grain boundaries</topic><topic>Ion implantation</topic><topic>Luminescence</topic><topic>Membranes</topic><topic>Nano-optics</topic><topic>Optical measurement</topic><topic>Optical properties</topic><topic>Photoluminescence</topic><topic>Polycrystalline diamond</topic><topic>Polycrystals</topic><topic>Scanning electron microscopy</topic><topic>Scanning transmission electron microscopy</topic><topic>Secondary ion mass spectrometry</topic><topic>Silicon</topic><topic>Silicon-vacancy center</topic><topic>Spectroscopy and confocal mapping</topic><topic>STEM analysis</topic><topic>ToF-SIMS analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kambalathmana, H.</creatorcontrib><creatorcontrib>Flatae, A.M.</creatorcontrib><creatorcontrib>Hunold, L.</creatorcontrib><creatorcontrib>Sledz, F.</creatorcontrib><creatorcontrib>Müller, J.</creatorcontrib><creatorcontrib>Hepp, M.</creatorcontrib><creatorcontrib>Schmuki, P.</creatorcontrib><creatorcontrib>Killian, M.S.</creatorcontrib><creatorcontrib>Lagomarsino, S.</creatorcontrib><creatorcontrib>Gelli, N.</creatorcontrib><creatorcontrib>Sciortino, S.</creatorcontrib><creatorcontrib>Giuntini, L.</creatorcontrib><creatorcontrib>Wörner, E.</creatorcontrib><creatorcontrib>Wild, C.</creatorcontrib><creatorcontrib>Butz, B.</creatorcontrib><creatorcontrib>Agio, M.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Carbon (New York)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kambalathmana, H.</au><au>Flatae, A.M.</au><au>Hunold, L.</au><au>Sledz, F.</au><au>Müller, J.</au><au>Hepp, M.</au><au>Schmuki, P.</au><au>Killian, M.S.</au><au>Lagomarsino, S.</au><au>Gelli, N.</au><au>Sciortino, S.</au><au>Giuntini, L.</au><au>Wörner, E.</au><au>Wild, C.</au><au>Butz, B.</au><au>Agio, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical properties of silicon-implanted polycrystalline diamond membranes</atitle><jtitle>Carbon (New York)</jtitle><date>2021-04-15</date><risdate>2021</risdate><volume>174</volume><spage>295</spage><epage>304</epage><pages>295-304</pages><issn>0008-6223</issn><eissn>1873-3891</eissn><abstract>We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline grains and in the grain boundaries, identifying conditions for the addressability of single SiV centers. Moreover, we perform a scanning transmission electron microscopy (STEM) analysis, which associates the microscopic structure of the membranes and the evolution of the diamond crystals along the growth direction with the photoluminescence properties, as well as a time-of-flight secondary ion mass spectrometry (ToF-SIMS) to address the distribution of Si in implanted and un-implanted membranes. The results of the STEM and ToF-SIMS studies are consistent with the outcome of the optical measurements and provide useful insight into the preparation of polycrystalline samples for quantum nano-optics.
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| subjects | Color centers Correlation analysis Crystal growth Crystal structure CVD diamond Films Diamonds Emission analysis Grain boundaries Ion implantation Luminescence Membranes Nano-optics Optical measurement Optical properties Photoluminescence Polycrystalline diamond Polycrystals Scanning electron microscopy Scanning transmission electron microscopy Secondary ion mass spectrometry Silicon Silicon-vacancy center Spectroscopy and confocal mapping STEM analysis ToF-SIMS analysis |
| title | Optical properties of silicon-implanted polycrystalline diamond membranes |
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