High energy storage of La-doped PbZrO3 thin films using LaNiO3/Pt composite electrodes with wide temperature range
With the evolution of power electronic system to miniaturization and integration, dielectric capacitors are extensively studied in electric power systems such as electron beam and direction energy weapons owing to outstanding energy storage density and low loss. In this work, Pb 0.97 La 0.02 ZrO 3 (...
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Veröffentlicht in: | Journal of sol-gel science and technology 2021-04, Vol.98 (1), p.264-270 |
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creator | Zheng, Dongwan Geng, Wenping Qiao, Xiaojun Zhang, Le Mu, Jiliang Li, Yaqing Bi, Kaixi Nian, Fushun He, Jian Chou, Xiujian |
description | With the evolution of power electronic system to miniaturization and integration, dielectric capacitors are extensively studied in electric power systems such as electron beam and direction energy weapons owing to outstanding energy storage density and low loss. In this work, Pb
0.97
La
0.02
ZrO
3
(PLZ) films were deposited on LaNiO
3
(LNO)/Pt and LNO electrodes using sol-gel method, respectively. High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained from PLZ/LNO/Pt/TiO
2
/SiO
2
/Si with energy storage density up to 25.4 J cm
−3
, which could be explained by good ohmic contact between films and composite electrodes. Besides, recoverable energy storage of films exhibits outstanding temperature stability (25.9–25.3 J cm
−3
) over -60 - 20 °C. These results suggest that LNO/Pt composite electrodes can be used to optimize PLZ films properties, which could be considered as a valid way for developing wide temperature range energy-storage capacitors.
Highlights
High quality PbLaZrO
3
(PLZ) films could be obtained by LaNiO
3
(LNO)/Pt electrode owing to good ohmic contact and lattice matching between films and composite electrode.
High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained in PLZ/LNO/Pt/TiO
2
/SiO
2
/Si.
Excellent energy storage could be obtained in PLZ films within wide temperature range (−60–200 °C). Especially, recoverable energy storage of films exhibits outstanding temperature endurance (25.9–25.3 J cm
−3
) over −60–20 °C. |
doi_str_mv | 10.1007/s10971-021-05485-2 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2505799787</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2505799787</sourcerecordid><originalsourceid>FETCH-LOGICAL-c356t-1e393be3effd3651542a458dbd76e4a372e39b08a801b9edb6ad018d7afe1b943</originalsourceid><addsrcrecordid>eNp9kE9LxDAQxYMouK5-AU8Bz9X8aZr2KIu6wuLuQS9eQtpMu1m2TU1SZL-90RW8eZgZGH7vDfMQuqbklhIi7wIllaQZYalEXoqMnaAZFZJneZkXp2hGKlZmRBJ5ji5C2BGSMCpnyC9tt8UwgO8OOETndQfYtXilM-NGMHhTv_s1x3FrB9zafR_wFOzQJeDFrvndJuLG9aMLNgKGPTTROwMBf9q4Tc0AjtCP4HWcPGCvhw4u0Vmr9wGufuccvT0-vC6W2Wr99Ly4X2UNF0XMKPCK18ChbQ0vBBU507koTW1kAbnmkiWgJqUuCa0rMHWhDaGlkbqFtMj5HN0cfUfvPiYIUe3c5Id0UjFBhKwqWcpEsSPVeBeCh1aN3vbaHxQl6jtbdcxWpWzVT7aKJRE_ikKC00v-z_of1Rfso307</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2505799787</pqid></control><display><type>article</type><title>High energy storage of La-doped PbZrO3 thin films using LaNiO3/Pt composite electrodes with wide temperature range</title><source>Springer Nature - Complete Springer Journals</source><creator>Zheng, Dongwan ; Geng, Wenping ; Qiao, Xiaojun ; Zhang, Le ; Mu, Jiliang ; Li, Yaqing ; Bi, Kaixi ; Nian, Fushun ; He, Jian ; Chou, Xiujian</creator><creatorcontrib>Zheng, Dongwan ; Geng, Wenping ; Qiao, Xiaojun ; Zhang, Le ; Mu, Jiliang ; Li, Yaqing ; Bi, Kaixi ; Nian, Fushun ; He, Jian ; Chou, Xiujian</creatorcontrib><description>With the evolution of power electronic system to miniaturization and integration, dielectric capacitors are extensively studied in electric power systems such as electron beam and direction energy weapons owing to outstanding energy storage density and low loss. In this work, Pb
0.97
La
0.02
ZrO
3
(PLZ) films were deposited on LaNiO
3
(LNO)/Pt and LNO electrodes using sol-gel method, respectively. High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained from PLZ/LNO/Pt/TiO
2
/SiO
2
/Si with energy storage density up to 25.4 J cm
−3
, which could be explained by good ohmic contact between films and composite electrodes. Besides, recoverable energy storage of films exhibits outstanding temperature stability (25.9–25.3 J cm
−3
) over -60 - 20 °C. These results suggest that LNO/Pt composite electrodes can be used to optimize PLZ films properties, which could be considered as a valid way for developing wide temperature range energy-storage capacitors.
Highlights
High quality PbLaZrO
3
(PLZ) films could be obtained by LaNiO
3
(LNO)/Pt electrode owing to good ohmic contact and lattice matching between films and composite electrode.
High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained in PLZ/LNO/Pt/TiO
2
/SiO
2
/Si.
Excellent energy storage could be obtained in PLZ films within wide temperature range (−60–200 °C). Especially, recoverable energy storage of films exhibits outstanding temperature endurance (25.9–25.3 J cm
−3
) over −60–20 °C.</description><identifier>ISSN: 0928-0707</identifier><identifier>EISSN: 1573-4846</identifier><identifier>DOI: 10.1007/s10971-021-05485-2</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Capacitors ; Ceramics ; Chemistry and Materials Science ; Composites ; Contact resistance ; Density ; Electric contacts ; Electric power systems ; Electrode polarization ; Electrodes ; Electron beams ; Electronic systems ; Energy storage ; Glass ; hybrids and solution chemistries ; Inorganic Chemistry ; Lanthanum oxides ; Lattice matching ; Materials Science ; Miniaturization ; Nanotechnology ; Natural Materials ; Optical and Electronic Materials ; Original Paper: Sol-gel ; Silicon dioxide ; Sol-gel processes ; Thin films ; Titanium dioxide</subject><ispartof>Journal of sol-gel science and technology, 2021-04, Vol.98 (1), p.264-270</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature 2021</rights><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature 2021.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c356t-1e393be3effd3651542a458dbd76e4a372e39b08a801b9edb6ad018d7afe1b943</citedby><cites>FETCH-LOGICAL-c356t-1e393be3effd3651542a458dbd76e4a372e39b08a801b9edb6ad018d7afe1b943</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10971-021-05485-2$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10971-021-05485-2$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51298</link.rule.ids></links><search><creatorcontrib>Zheng, Dongwan</creatorcontrib><creatorcontrib>Geng, Wenping</creatorcontrib><creatorcontrib>Qiao, Xiaojun</creatorcontrib><creatorcontrib>Zhang, Le</creatorcontrib><creatorcontrib>Mu, Jiliang</creatorcontrib><creatorcontrib>Li, Yaqing</creatorcontrib><creatorcontrib>Bi, Kaixi</creatorcontrib><creatorcontrib>Nian, Fushun</creatorcontrib><creatorcontrib>He, Jian</creatorcontrib><creatorcontrib>Chou, Xiujian</creatorcontrib><title>High energy storage of La-doped PbZrO3 thin films using LaNiO3/Pt composite electrodes with wide temperature range</title><title>Journal of sol-gel science and technology</title><addtitle>J Sol-Gel Sci Technol</addtitle><description>With the evolution of power electronic system to miniaturization and integration, dielectric capacitors are extensively studied in electric power systems such as electron beam and direction energy weapons owing to outstanding energy storage density and low loss. In this work, Pb
0.97
La
0.02
ZrO
3
(PLZ) films were deposited on LaNiO
3
(LNO)/Pt and LNO electrodes using sol-gel method, respectively. High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained from PLZ/LNO/Pt/TiO
2
/SiO
2
/Si with energy storage density up to 25.4 J cm
−3
, which could be explained by good ohmic contact between films and composite electrodes. Besides, recoverable energy storage of films exhibits outstanding temperature stability (25.9–25.3 J cm
−3
) over -60 - 20 °C. These results suggest that LNO/Pt composite electrodes can be used to optimize PLZ films properties, which could be considered as a valid way for developing wide temperature range energy-storage capacitors.
Highlights
High quality PbLaZrO
3
(PLZ) films could be obtained by LaNiO
3
(LNO)/Pt electrode owing to good ohmic contact and lattice matching between films and composite electrode.
High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained in PLZ/LNO/Pt/TiO
2
/SiO
2
/Si.
Excellent energy storage could be obtained in PLZ films within wide temperature range (−60–200 °C). Especially, recoverable energy storage of films exhibits outstanding temperature endurance (25.9–25.3 J cm
−3
) over −60–20 °C.</description><subject>Capacitors</subject><subject>Ceramics</subject><subject>Chemistry and Materials Science</subject><subject>Composites</subject><subject>Contact resistance</subject><subject>Density</subject><subject>Electric contacts</subject><subject>Electric power systems</subject><subject>Electrode polarization</subject><subject>Electrodes</subject><subject>Electron beams</subject><subject>Electronic systems</subject><subject>Energy storage</subject><subject>Glass</subject><subject>hybrids and solution chemistries</subject><subject>Inorganic Chemistry</subject><subject>Lanthanum oxides</subject><subject>Lattice matching</subject><subject>Materials Science</subject><subject>Miniaturization</subject><subject>Nanotechnology</subject><subject>Natural Materials</subject><subject>Optical and Electronic Materials</subject><subject>Original Paper: Sol-gel</subject><subject>Silicon dioxide</subject><subject>Sol-gel processes</subject><subject>Thin films</subject><subject>Titanium dioxide</subject><issn>0928-0707</issn><issn>1573-4846</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kE9LxDAQxYMouK5-AU8Bz9X8aZr2KIu6wuLuQS9eQtpMu1m2TU1SZL-90RW8eZgZGH7vDfMQuqbklhIi7wIllaQZYalEXoqMnaAZFZJneZkXp2hGKlZmRBJ5ji5C2BGSMCpnyC9tt8UwgO8OOETndQfYtXilM-NGMHhTv_s1x3FrB9zafR_wFOzQJeDFrvndJuLG9aMLNgKGPTTROwMBf9q4Tc0AjtCP4HWcPGCvhw4u0Vmr9wGufuccvT0-vC6W2Wr99Ly4X2UNF0XMKPCK18ChbQ0vBBU507koTW1kAbnmkiWgJqUuCa0rMHWhDaGlkbqFtMj5HN0cfUfvPiYIUe3c5Id0UjFBhKwqWcpEsSPVeBeCh1aN3vbaHxQl6jtbdcxWpWzVT7aKJRE_ikKC00v-z_of1Rfso307</recordid><startdate>20210401</startdate><enddate>20210401</enddate><creator>Zheng, Dongwan</creator><creator>Geng, Wenping</creator><creator>Qiao, Xiaojun</creator><creator>Zhang, Le</creator><creator>Mu, Jiliang</creator><creator>Li, Yaqing</creator><creator>Bi, Kaixi</creator><creator>Nian, Fushun</creator><creator>He, Jian</creator><creator>Chou, Xiujian</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20210401</creationdate><title>High energy storage of La-doped PbZrO3 thin films using LaNiO3/Pt composite electrodes with wide temperature range</title><author>Zheng, Dongwan ; Geng, Wenping ; Qiao, Xiaojun ; Zhang, Le ; Mu, Jiliang ; Li, Yaqing ; Bi, Kaixi ; Nian, Fushun ; He, Jian ; Chou, Xiujian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c356t-1e393be3effd3651542a458dbd76e4a372e39b08a801b9edb6ad018d7afe1b943</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Capacitors</topic><topic>Ceramics</topic><topic>Chemistry and Materials Science</topic><topic>Composites</topic><topic>Contact resistance</topic><topic>Density</topic><topic>Electric contacts</topic><topic>Electric power systems</topic><topic>Electrode polarization</topic><topic>Electrodes</topic><topic>Electron beams</topic><topic>Electronic systems</topic><topic>Energy storage</topic><topic>Glass</topic><topic>hybrids and solution chemistries</topic><topic>Inorganic Chemistry</topic><topic>Lanthanum oxides</topic><topic>Lattice matching</topic><topic>Materials Science</topic><topic>Miniaturization</topic><topic>Nanotechnology</topic><topic>Natural Materials</topic><topic>Optical and Electronic Materials</topic><topic>Original Paper: Sol-gel</topic><topic>Silicon dioxide</topic><topic>Sol-gel processes</topic><topic>Thin films</topic><topic>Titanium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zheng, Dongwan</creatorcontrib><creatorcontrib>Geng, Wenping</creatorcontrib><creatorcontrib>Qiao, Xiaojun</creatorcontrib><creatorcontrib>Zhang, Le</creatorcontrib><creatorcontrib>Mu, Jiliang</creatorcontrib><creatorcontrib>Li, Yaqing</creatorcontrib><creatorcontrib>Bi, Kaixi</creatorcontrib><creatorcontrib>Nian, Fushun</creatorcontrib><creatorcontrib>He, Jian</creatorcontrib><creatorcontrib>Chou, Xiujian</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>Journal of sol-gel science and technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zheng, Dongwan</au><au>Geng, Wenping</au><au>Qiao, Xiaojun</au><au>Zhang, Le</au><au>Mu, Jiliang</au><au>Li, Yaqing</au><au>Bi, Kaixi</au><au>Nian, Fushun</au><au>He, Jian</au><au>Chou, Xiujian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High energy storage of La-doped PbZrO3 thin films using LaNiO3/Pt composite electrodes with wide temperature range</atitle><jtitle>Journal of sol-gel science and technology</jtitle><stitle>J Sol-Gel Sci Technol</stitle><date>2021-04-01</date><risdate>2021</risdate><volume>98</volume><issue>1</issue><spage>264</spage><epage>270</epage><pages>264-270</pages><issn>0928-0707</issn><eissn>1573-4846</eissn><abstract>With the evolution of power electronic system to miniaturization and integration, dielectric capacitors are extensively studied in electric power systems such as electron beam and direction energy weapons owing to outstanding energy storage density and low loss. In this work, Pb
0.97
La
0.02
ZrO
3
(PLZ) films were deposited on LaNiO
3
(LNO)/Pt and LNO electrodes using sol-gel method, respectively. High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained from PLZ/LNO/Pt/TiO
2
/SiO
2
/Si with energy storage density up to 25.4 J cm
−3
, which could be explained by good ohmic contact between films and composite electrodes. Besides, recoverable energy storage of films exhibits outstanding temperature stability (25.9–25.3 J cm
−3
) over -60 - 20 °C. These results suggest that LNO/Pt composite electrodes can be used to optimize PLZ films properties, which could be considered as a valid way for developing wide temperature range energy-storage capacitors.
Highlights
High quality PbLaZrO
3
(PLZ) films could be obtained by LaNiO
3
(LNO)/Pt electrode owing to good ohmic contact and lattice matching between films and composite electrode.
High spontaneous polarization (
P
s
~ 91.3 μC cm
−2
) and low remanent polarization (
P
r
~ 7.3 μC cm
−2
) can be obtained in PLZ/LNO/Pt/TiO
2
/SiO
2
/Si.
Excellent energy storage could be obtained in PLZ films within wide temperature range (−60–200 °C). Especially, recoverable energy storage of films exhibits outstanding temperature endurance (25.9–25.3 J cm
−3
) over −60–20 °C.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10971-021-05485-2</doi><tpages>7</tpages></addata></record> |
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source | Springer Nature - Complete Springer Journals |
subjects | Capacitors Ceramics Chemistry and Materials Science Composites Contact resistance Density Electric contacts Electric power systems Electrode polarization Electrodes Electron beams Electronic systems Energy storage Glass hybrids and solution chemistries Inorganic Chemistry Lanthanum oxides Lattice matching Materials Science Miniaturization Nanotechnology Natural Materials Optical and Electronic Materials Original Paper: Sol-gel Silicon dioxide Sol-gel processes Thin films Titanium dioxide |
title | High energy storage of La-doped PbZrO3 thin films using LaNiO3/Pt composite electrodes with wide temperature range |
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