Suppression of Shot Noise During the Soft Reset by Cascaded Transitions on a Potential Ladder With Single-Carrier Charging Steps

A shot noise suppression process of the emission-limited or the "soft" reset in an image sensor is investigated by analytically solving a master (Kolmogorov-Bateman) equation for a continuous-time Markov chain with correlated carrier emission rates. An explicit form of the probability dist...

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Veröffentlicht in:	IEEE transactions on electron devices 2021-04, Vol.68 (4), p.1723-1729
1. Verfasser:	Hirose, Yutaka
Format:	Artikel
Sprache:	eng
Schlagworte:	Charge coupled device (CCD) Charging CMOS image sensor (CIS) Distribution functions Electric potential Electron emission Emission analysis Emissions control hard reset (HR) hypoexponential distribution image sensor Kolmogorov–Bateman equation kTC noise Markov chain Markov chains Markov processes Mathematical model MOSFET Noise Noise reduction potential ladder Probability distribution functions Shot noise soft reset (SR) Time dependence Variance
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