Controlled oxidation of Ni for stress-free hole transport layer of large-scale perovskite solar cells

The effect of the residual thermal stress of NiO films on the performance of an inverted type perovskite solar cell was studied. In this study, NiO films were grown on fluorine doped tin oxide (FTO) substrates of different surface roughness by thermally oxidizing Ni film and were tested as a hole tr...

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Veröffentlicht in:Nano research 2019-12, Vol.12 (12), p.3089-3094
Hauptverfasser: Lee, Seongha, Roh, Hee-Suk, Han, Gill Sang, Lee, Jung-Kun
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Sprache:eng
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