The Coupled Wave Thickness Method as a Universal Method for Synthesizing Interference Antireflection Coatings (-Structures)

A method is proposed and a universal algorithm is constructed on its basis. The algorithm includes a complete set of all structural solutions encountered in the synthesis of antireflection multilayer structures. Exact analytical relations are obtained that make it possible to synthesize antireflection structures with the minimum possible number of layers for any real values of the refractive indices of both matched media and materials of layers of such structures. Their structural and matching properties are analyzed and generalized. The correctness of the obtained exact solutions and the efficiency of the method are confirmed by a numerical experiment. Keywords : multilayer structures, interference