An in situ microtomography apparatus with a laboratory x-ray source for elevated temperatures of up to 1000 °C

An elevated-temperature in situ microtomography apparatus that can measure internal damage parameters under tensile loads at high temperatures up to 1000 °C is developed using a laboratory x-ray source. The maximum resolution of the apparatus can reach 3 µm by a reasonable design. A high-temperature...

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Veröffentlicht in:	Review of scientific instruments 2021-03, Vol.92 (3), p.033704-033704
Hauptverfasser:	Zhu, Rongqi, Qu, Zhaoliang, Yang, Shuo, Fang, Daining
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Chambers Crack propagation Fiber reinforced materials High resolution High temperature environments Laboratories Reflectors Scientific apparatus & instruments Tensile stress Tensile tests Thermomechanical properties X ray microtomography X ray sources X-rays
Online-Zugang:	Volltext
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