Pressureless Cu–Cu bonding using hybrid Cu–epoxy paste and its reliability
Cu sintering bonding has been considered a promising interconnection method for high-temperature applications like power electronics because of the low cost, low electrical resistivity, and high heat endurance of copper. However, Cu sintering bonding requires high bonding temperature and pressure as...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2021-02, Vol.32 (3), p.3054-3065 |
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creator | Hwang, Byeong-Uk Jung, Kwang-Ho Min, Kyung Deuk Lee, Choong-Jae Jung, Seung-Boo |
description | Cu sintering bonding has been considered a promising interconnection method for high-temperature applications like power electronics because of the low cost, low electrical resistivity, and high heat endurance of copper. However, Cu sintering bonding requires high bonding temperature and pressure as well as Cu oxidation prevention. To overcome these problems, we fabricated a hybrid Cu paste consisting of sub-micron and flake fillers, mechanically mixed with various epoxy contents (0, 5, 10, or 15 wt%). Cu–Cu bonding with printed hybrid Cu–epoxy paste was performed in N
2
at 250 °C for 30 min without pressure. The process temperature and pressure could be lowered to these levels because the mechanical reinforcing effect of the epoxy supplemented the weak bonding between Cu fillers. When 10 wt% epoxy was added, the shear strength of joint increased remarkably to 12.1 MPa, whereas electrical resistance was maintained at 1.8 Ω. The joint with 15 wt% epoxy was further strengthened, but electrical resistance increased drastically. A high-temperature storage test was then performed at 175 °C for 72 h to investigate the bonding reliability. Since Cu fillers were encapsulated in epoxy to prevent oxidation, the bonding shear strength of the Cu–Cu joint with hybrid Cu–epoxy remained robust even after thermal aging. |
doi_str_mv | 10.1007/s10854-020-05055-2 |
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2
at 250 °C for 30 min without pressure. The process temperature and pressure could be lowered to these levels because the mechanical reinforcing effect of the epoxy supplemented the weak bonding between Cu fillers. When 10 wt% epoxy was added, the shear strength of joint increased remarkably to 12.1 MPa, whereas electrical resistance was maintained at 1.8 Ω. The joint with 15 wt% epoxy was further strengthened, but electrical resistance increased drastically. A high-temperature storage test was then performed at 175 °C for 72 h to investigate the bonding reliability. Since Cu fillers were encapsulated in epoxy to prevent oxidation, the bonding shear strength of the Cu–Cu joint with hybrid Cu–epoxy remained robust even after thermal aging.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-020-05055-2</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Bonded joints ; Bonding strength ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Copper ; Electrical resistance ; Fillers ; High temperature ; Materials Science ; Optical and Electronic Materials ; Oxidation resistance ; Reliability ; Shear strength ; Sintering</subject><ispartof>Journal of materials science. Materials in electronics, 2021-02, Vol.32 (3), p.3054-3065</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature 2021</rights><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature 2021.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-d5c91b013b6ae8d9f9238f6fa3af781a7418a9d0f9e3ff5a7567198478b2ca1f3</citedby><cites>FETCH-LOGICAL-c319t-d5c91b013b6ae8d9f9238f6fa3af781a7418a9d0f9e3ff5a7567198478b2ca1f3</cites><orcidid>0000-0002-7360-9859</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-020-05055-2$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-020-05055-2$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Hwang, Byeong-Uk</creatorcontrib><creatorcontrib>Jung, Kwang-Ho</creatorcontrib><creatorcontrib>Min, Kyung Deuk</creatorcontrib><creatorcontrib>Lee, Choong-Jae</creatorcontrib><creatorcontrib>Jung, Seung-Boo</creatorcontrib><title>Pressureless Cu–Cu bonding using hybrid Cu–epoxy paste and its reliability</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Cu sintering bonding has been considered a promising interconnection method for high-temperature applications like power electronics because of the low cost, low electrical resistivity, and high heat endurance of copper. However, Cu sintering bonding requires high bonding temperature and pressure as well as Cu oxidation prevention. To overcome these problems, we fabricated a hybrid Cu paste consisting of sub-micron and flake fillers, mechanically mixed with various epoxy contents (0, 5, 10, or 15 wt%). Cu–Cu bonding with printed hybrid Cu–epoxy paste was performed in N
2
at 250 °C for 30 min without pressure. The process temperature and pressure could be lowered to these levels because the mechanical reinforcing effect of the epoxy supplemented the weak bonding between Cu fillers. When 10 wt% epoxy was added, the shear strength of joint increased remarkably to 12.1 MPa, whereas electrical resistance was maintained at 1.8 Ω. The joint with 15 wt% epoxy was further strengthened, but electrical resistance increased drastically. A high-temperature storage test was then performed at 175 °C for 72 h to investigate the bonding reliability. Since Cu fillers were encapsulated in epoxy to prevent oxidation, the bonding shear strength of the Cu–Cu joint with hybrid Cu–epoxy remained robust even after thermal aging.</description><subject>Bonded joints</subject><subject>Bonding strength</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Copper</subject><subject>Electrical resistance</subject><subject>Fillers</subject><subject>High temperature</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Oxidation resistance</subject><subject>Reliability</subject><subject>Shear strength</subject><subject>Sintering</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kM1KxDAURoMoOI6-gKuC6-hN0jTJUop_MKgLBXchbZMxw9jWpAW78x18Q5_EaAV3bu63uN-5Fw5CxwROCYA4iwQkzzFQwMCBc0x30IJwwXAu6dMuWoDiAuec0n10EOMGAIqcyQW6vQ82xjHYbYqsHD_fP8oxq7q28e06G-P3fJ6q4Jt5afvubcp6EwebmbbJ_BCzBHtT-a0fpkO058w22qPfXKLHy4uH8hqv7q5uyvMVrhlRA254rUgFhFWFsbJRTlEmXeEMM05IYkROpFENOGWZc9wIXgiiZC5kRWtDHFuik_luH7rX0cZBb7oxtOmlprmiQinJeWrRuVWHLsZgne6DfzFh0gT0tzc9e9PJm_7xpmmC2AzFVG7XNvyd_of6Arsacpg</recordid><startdate>20210201</startdate><enddate>20210201</enddate><creator>Hwang, Byeong-Uk</creator><creator>Jung, Kwang-Ho</creator><creator>Min, Kyung Deuk</creator><creator>Lee, Choong-Jae</creator><creator>Jung, Seung-Boo</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-7360-9859</orcidid></search><sort><creationdate>20210201</creationdate><title>Pressureless Cu–Cu bonding using hybrid Cu–epoxy paste and its reliability</title><author>Hwang, Byeong-Uk ; Jung, Kwang-Ho ; Min, Kyung Deuk ; Lee, Choong-Jae ; Jung, Seung-Boo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-d5c91b013b6ae8d9f9238f6fa3af781a7418a9d0f9e3ff5a7567198478b2ca1f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Bonded joints</topic><topic>Bonding strength</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Copper</topic><topic>Electrical resistance</topic><topic>Fillers</topic><topic>High temperature</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Oxidation resistance</topic><topic>Reliability</topic><topic>Shear strength</topic><topic>Sintering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hwang, Byeong-Uk</creatorcontrib><creatorcontrib>Jung, Kwang-Ho</creatorcontrib><creatorcontrib>Min, Kyung Deuk</creatorcontrib><creatorcontrib>Lee, Choong-Jae</creatorcontrib><creatorcontrib>Jung, Seung-Boo</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hwang, Byeong-Uk</au><au>Jung, Kwang-Ho</au><au>Min, Kyung Deuk</au><au>Lee, Choong-Jae</au><au>Jung, Seung-Boo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Pressureless Cu–Cu bonding using hybrid Cu–epoxy paste and its reliability</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2021-02-01</date><risdate>2021</risdate><volume>32</volume><issue>3</issue><spage>3054</spage><epage>3065</epage><pages>3054-3065</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Cu sintering bonding has been considered a promising interconnection method for high-temperature applications like power electronics because of the low cost, low electrical resistivity, and high heat endurance of copper. However, Cu sintering bonding requires high bonding temperature and pressure as well as Cu oxidation prevention. To overcome these problems, we fabricated a hybrid Cu paste consisting of sub-micron and flake fillers, mechanically mixed with various epoxy contents (0, 5, 10, or 15 wt%). Cu–Cu bonding with printed hybrid Cu–epoxy paste was performed in N
2
at 250 °C for 30 min without pressure. The process temperature and pressure could be lowered to these levels because the mechanical reinforcing effect of the epoxy supplemented the weak bonding between Cu fillers. When 10 wt% epoxy was added, the shear strength of joint increased remarkably to 12.1 MPa, whereas electrical resistance was maintained at 1.8 Ω. The joint with 15 wt% epoxy was further strengthened, but electrical resistance increased drastically. A high-temperature storage test was then performed at 175 °C for 72 h to investigate the bonding reliability. Since Cu fillers were encapsulated in epoxy to prevent oxidation, the bonding shear strength of the Cu–Cu joint with hybrid Cu–epoxy remained robust even after thermal aging.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-020-05055-2</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-7360-9859</orcidid></addata></record> |
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subjects | Bonded joints Bonding strength Characterization and Evaluation of Materials Chemistry and Materials Science Copper Electrical resistance Fillers High temperature Materials Science Optical and Electronic Materials Oxidation resistance Reliability Shear strength Sintering |
title | Pressureless Cu–Cu bonding using hybrid Cu–epoxy paste and its reliability |
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