Precise control of Jeff = 1/2 magnetic properties in Sr2 IrO4 epitaxial thin films by variation of strain and thin film thickness
We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff = 1/2 compound Sr2 IrO4 by advanced x-ray scattering. We find that the Sr2 IrO4 thin films can be grown fully strained up to...
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container_title | Physical review. B |
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creator | Geprägs, Stephan Skovdal, Björn Erik Scheufele, Monika Opel, Matthias Wermeille, Didier Thompson, Paul Bombardi, Alessandro Simonet, Virginie Grenier, Stéphane Lejay, Pascal Chahine, Gilbert Andre Quintero-Castro, Diana Lucia Gross, Rudolf Mannix, Danny |
description | We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff = 1/2 compound Sr2 IrO4 by advanced x-ray scattering. We find that the Sr2 IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2 IrO4 and bring to light the potential for a rich playground to explore the physics of 5 d transition-metal compounds. |
doi_str_mv | 10.1103/PhysRevB.102.214402 |
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We find that the Sr2 IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. 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These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2 IrO4 and bring to light the potential for a rich playground to explore the physics of 5 d transition-metal compounds.</description><subject>Epitaxy</subject><subject>Film thickness</subject><subject>Magnetic anisotropy</subject><subject>Magnetic properties</subject><subject>Magnetism</subject><subject>Metal compounds</subject><subject>Playgrounds</subject><subject>Thin films</subject><subject>Transition metal compounds</subject><subject>X-ray scattering</subject><issn>2469-9950</issn><issn>2469-9969</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNqNjUFPAjEUhBuCiQT4BV5e4pnltZSFHrxoNOJFgt5JXV-luLRrXyFy9J-7JEavnmYy32RGiAuJhZQ4GS83R17R4bqQqAoltUbVET2lSzMypjTdXz_FczFk3iKiLNHM0PTE1zJR5ZmgiiGnWEN08EDOwRXIsYKdfQuUfQVNig2l7InBB3hKChbpUQM1PttPb2vImzZ3vt4xvBzhYJO32cdw2uOcbAtteP1rnVz1Hoh5IM6crZmGP9oXl3e3zzf3o_byY0-c19u4T6FFa6XnODOl1NPJ_1rfsKJYVw</recordid><startdate>20201201</startdate><enddate>20201201</enddate><creator>Geprägs, Stephan</creator><creator>Skovdal, Björn Erik</creator><creator>Scheufele, Monika</creator><creator>Opel, Matthias</creator><creator>Wermeille, Didier</creator><creator>Thompson, Paul</creator><creator>Bombardi, Alessandro</creator><creator>Simonet, Virginie</creator><creator>Grenier, Stéphane</creator><creator>Lejay, Pascal</creator><creator>Chahine, Gilbert Andre</creator><creator>Quintero-Castro, Diana Lucia</creator><creator>Gross, Rudolf</creator><creator>Mannix, Danny</creator><general>American Physical Society</general><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20201201</creationdate><title>Precise control of Jeff = 1/2 magnetic properties in Sr2 IrO4 epitaxial thin films by variation of strain and thin film thickness</title><author>Geprägs, Stephan ; Skovdal, Björn Erik ; Scheufele, Monika ; Opel, Matthias ; Wermeille, Didier ; Thompson, Paul ; Bombardi, Alessandro ; Simonet, Virginie ; Grenier, Stéphane ; Lejay, Pascal ; Chahine, Gilbert Andre ; Quintero-Castro, Diana Lucia ; Gross, Rudolf ; Mannix, Danny</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_24807961453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Epitaxy</topic><topic>Film thickness</topic><topic>Magnetic anisotropy</topic><topic>Magnetic properties</topic><topic>Magnetism</topic><topic>Metal compounds</topic><topic>Playgrounds</topic><topic>Thin films</topic><topic>Transition metal compounds</topic><topic>X-ray scattering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Geprägs, Stephan</creatorcontrib><creatorcontrib>Skovdal, Björn Erik</creatorcontrib><creatorcontrib>Scheufele, Monika</creatorcontrib><creatorcontrib>Opel, Matthias</creatorcontrib><creatorcontrib>Wermeille, Didier</creatorcontrib><creatorcontrib>Thompson, Paul</creatorcontrib><creatorcontrib>Bombardi, Alessandro</creatorcontrib><creatorcontrib>Simonet, Virginie</creatorcontrib><creatorcontrib>Grenier, Stéphane</creatorcontrib><creatorcontrib>Lejay, Pascal</creatorcontrib><creatorcontrib>Chahine, Gilbert Andre</creatorcontrib><creatorcontrib>Quintero-Castro, Diana Lucia</creatorcontrib><creatorcontrib>Gross, Rudolf</creatorcontrib><creatorcontrib>Mannix, Danny</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physical review. B</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Geprägs, Stephan</au><au>Skovdal, Björn Erik</au><au>Scheufele, Monika</au><au>Opel, Matthias</au><au>Wermeille, Didier</au><au>Thompson, Paul</au><au>Bombardi, Alessandro</au><au>Simonet, Virginie</au><au>Grenier, Stéphane</au><au>Lejay, Pascal</au><au>Chahine, Gilbert Andre</au><au>Quintero-Castro, Diana Lucia</au><au>Gross, Rudolf</au><au>Mannix, Danny</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Precise control of Jeff = 1/2 magnetic properties in Sr2 IrO4 epitaxial thin films by variation of strain and thin film thickness</atitle><jtitle>Physical review. B</jtitle><date>2020-12-01</date><risdate>2020</risdate><volume>102</volume><issue>21</issue><spage>1</spage><pages>1-</pages><issn>2469-9950</issn><eissn>2469-9969</eissn><abstract>We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff = 1/2 compound Sr2 IrO4 by advanced x-ray scattering. We find that the Sr2 IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2 IrO4 and bring to light the potential for a rich playground to explore the physics of 5 d transition-metal compounds.</abstract><cop>College Park</cop><pub>American Physical Society</pub><doi>10.1103/PhysRevB.102.214402</doi></addata></record> |
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subjects | Epitaxy Film thickness Magnetic anisotropy Magnetic properties Magnetism Metal compounds Playgrounds Thin films Transition metal compounds X-ray scattering |
title | Precise control of Jeff = 1/2 magnetic properties in Sr2 IrO4 epitaxial thin films by variation of strain and thin film thickness |
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