Lattice vibrational characteristics and dielectric properties of pure phase CaTiO3 ceramic
CaTiO 3 microwave dielectric ceramic was fabricated utilizing traditional two-step sintering process. XRD pattern analysis after Rietveld refinement indicated a pure phase CaTiO 3 sample. SEM image illustrated well-crystallized sample with uniform grain sizes and clear grain boundaries. The lattice...
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| Veröffentlicht in: | Journal of materials science. Materials in electronics 2020-10, Vol.31 (20), p.18070-18076 |
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| container_issue | 20 |
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| container_title | Journal of materials science. Materials in electronics |
| container_volume | 31 |
| creator | Shi, Feng Fu, Guang-en Xiao, En-Cai Li, Jianzhu |
| description | CaTiO
3
microwave dielectric ceramic was fabricated utilizing traditional two-step sintering process. XRD pattern analysis after Rietveld refinement indicated a pure phase CaTiO
3
sample. SEM image illustrated well-crystallized sample with uniform grain sizes and clear grain boundaries. The lattice vibrational characteristics were analyzed by Raman and IR spectroscopy, and the intrinsic properties were calculated in conjunction with the semi-quantum four-parameter (FPSQ) model, which turned out that the low-frequency vibrational modes contribute the most to the dielectric properties. Besides, the real and imaginary parts of the dielectric function were drawn from the FPSQ model. The intrinsic property results fitted from the FPSQ model agree well with the measured values. |
| doi_str_mv | 10.1007/s10854-020-04357-9 |
| format | Article |
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3
microwave dielectric ceramic was fabricated utilizing traditional two-step sintering process. XRD pattern analysis after Rietveld refinement indicated a pure phase CaTiO
3
sample. SEM image illustrated well-crystallized sample with uniform grain sizes and clear grain boundaries. The lattice vibrational characteristics were analyzed by Raman and IR spectroscopy, and the intrinsic properties were calculated in conjunction with the semi-quantum four-parameter (FPSQ) model, which turned out that the low-frequency vibrational modes contribute the most to the dielectric properties. Besides, the real and imaginary parts of the dielectric function were drawn from the FPSQ model. The intrinsic property results fitted from the FPSQ model agree well with the measured values.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-020-04357-9</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Crystallization ; Dielectric properties ; Drawing dies ; Grain boundaries ; Grain size ; Infrared spectroscopy ; Lattice vibration ; Materials Science ; Optical and Electronic Materials ; Pattern analysis</subject><ispartof>Journal of materials science. Materials in electronics, 2020-10, Vol.31 (20), p.18070-18076</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020</rights><rights>Springer Science+Business Media, LLC, part of Springer Nature 2020.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2349-8a3cb28bf10a1de248bf23e27db282a6460c74979b74207d250f13668820ba213</citedby><cites>FETCH-LOGICAL-c2349-8a3cb28bf10a1de248bf23e27db282a6460c74979b74207d250f13668820ba213</cites><orcidid>0000-0003-1043-2838</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-020-04357-9$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-020-04357-9$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Shi, Feng</creatorcontrib><creatorcontrib>Fu, Guang-en</creatorcontrib><creatorcontrib>Xiao, En-Cai</creatorcontrib><creatorcontrib>Li, Jianzhu</creatorcontrib><title>Lattice vibrational characteristics and dielectric properties of pure phase CaTiO3 ceramic</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>CaTiO
3
microwave dielectric ceramic was fabricated utilizing traditional two-step sintering process. XRD pattern analysis after Rietveld refinement indicated a pure phase CaTiO
3
sample. SEM image illustrated well-crystallized sample with uniform grain sizes and clear grain boundaries. The lattice vibrational characteristics were analyzed by Raman and IR spectroscopy, and the intrinsic properties were calculated in conjunction with the semi-quantum four-parameter (FPSQ) model, which turned out that the low-frequency vibrational modes contribute the most to the dielectric properties. Besides, the real and imaginary parts of the dielectric function were drawn from the FPSQ model. The intrinsic property results fitted from the FPSQ model agree well with the measured values.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Crystallization</subject><subject>Dielectric properties</subject><subject>Drawing dies</subject><subject>Grain boundaries</subject><subject>Grain size</subject><subject>Infrared spectroscopy</subject><subject>Lattice vibration</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Pattern analysis</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp9kEFLAzEQhYMoWKt_wFPA8-pkkt3sHqWoFQq9VBAvIZudtSltd022gv_e1BW8eZph5r3HzMfYtYBbAaDvooAyVxkgZKBkrrPqhE1ErmWmSnw9ZROo0lDliOfsIsYNABRKlhP2trDD4B3xT18HO_hub7fcrW2wbqDgY9pFbvcNbzxtyQ3BO96HrqcweIq8a3l_CMT7tY3EZ3bll5I7Cnbn3SU7a-020tVvnbKXx4fVbJ4tlk_Ps_tF5lCqKiutdDWWdSvAioZQpRYloW7SFG2hCnBaVbqqtULQDebQClkUZYlQWxRyym7G3HTXx4HiYDbdIaQ_okGlJSKI_KjCUeVCF2Og1vTB72z4MgLMkaEZGZrE0PwwNFUyydEUk3j_TuEv-h_XN0Bfc9k</recordid><startdate>20201001</startdate><enddate>20201001</enddate><creator>Shi, Feng</creator><creator>Fu, Guang-en</creator><creator>Xiao, En-Cai</creator><creator>Li, Jianzhu</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0003-1043-2838</orcidid></search><sort><creationdate>20201001</creationdate><title>Lattice vibrational characteristics and dielectric properties of pure phase CaTiO3 ceramic</title><author>Shi, Feng ; Fu, Guang-en ; Xiao, En-Cai ; Li, Jianzhu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2349-8a3cb28bf10a1de248bf23e27db282a6460c74979b74207d250f13668820ba213</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Crystallization</topic><topic>Dielectric properties</topic><topic>Drawing dies</topic><topic>Grain boundaries</topic><topic>Grain size</topic><topic>Infrared spectroscopy</topic><topic>Lattice vibration</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Pattern analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shi, Feng</creatorcontrib><creatorcontrib>Fu, Guang-en</creatorcontrib><creatorcontrib>Xiao, En-Cai</creatorcontrib><creatorcontrib>Li, Jianzhu</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shi, Feng</au><au>Fu, Guang-en</au><au>Xiao, En-Cai</au><au>Li, Jianzhu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Lattice vibrational characteristics and dielectric properties of pure phase CaTiO3 ceramic</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2020-10-01</date><risdate>2020</risdate><volume>31</volume><issue>20</issue><spage>18070</spage><epage>18076</epage><pages>18070-18076</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>CaTiO
3
microwave dielectric ceramic was fabricated utilizing traditional two-step sintering process. XRD pattern analysis after Rietveld refinement indicated a pure phase CaTiO
3
sample. SEM image illustrated well-crystallized sample with uniform grain sizes and clear grain boundaries. The lattice vibrational characteristics were analyzed by Raman and IR spectroscopy, and the intrinsic properties were calculated in conjunction with the semi-quantum four-parameter (FPSQ) model, which turned out that the low-frequency vibrational modes contribute the most to the dielectric properties. Besides, the real and imaginary parts of the dielectric function were drawn from the FPSQ model. The intrinsic property results fitted from the FPSQ model agree well with the measured values.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-020-04357-9</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0003-1043-2838</orcidid></addata></record> |
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| subjects | Characterization and Evaluation of Materials Chemistry and Materials Science Crystallization Dielectric properties Drawing dies Grain boundaries Grain size Infrared spectroscopy Lattice vibration Materials Science Optical and Electronic Materials Pattern analysis |
| title | Lattice vibrational characteristics and dielectric properties of pure phase CaTiO3 ceramic |
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