The Potential of High-Fluence Ion Irradiation for Processing and Recovery of Diamond Tools
The graphitization and surface growth of synthetic diamonds by high-fluence irradiation with 30 keV argon and carbon ions have been experimentally studied. scanning electron microscope (SEM) and atomic force microscope (AFM) show removal of traces of mechanical polishing. The ion-induced roughness d...
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Veröffentlicht in: | Coatings (Basel) 2020, Vol.10 (12), p.1243 |
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description | The graphitization and surface growth of synthetic diamonds by high-fluence irradiation with 30 keV argon and carbon ions have been experimentally studied. scanning electron microscope (SEM) and atomic force microscope (AFM) show removal of traces of mechanical polishing. The ion-induced roughness does not exceed 20 nm. Raman spectroscopy and the measurement of electrical conductivity confirm the graphitization of the surface layer when irradiated with argon ions at the temperature of 230 °C and the diamond structure of the synthesized layer when irradiated with carbon ions at the temperature of 650 °C. |
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Raman spectroscopy and the measurement of electrical conductivity confirm the graphitization of the surface layer when irradiated with argon ions at the temperature of 230 °C and the diamond structure of the synthesized layer when irradiated with carbon ions at the temperature of 650 °C.</description><subject>Argon</subject><subject>Argon ions</subject><subject>Atomic force microscopes</subject><subject>Atomic force microscopy</subject><subject>Carbon</subject><subject>Computer simulation</subject><subject>Diamond tools</subject><subject>Diamonds</subject><subject>Electrical resistivity</subject><subject>Fluence</subject><subject>Graphite</subject><subject>Graphitization</subject><subject>Ion implantation</subject><subject>Ion irradiation</subject><subject>Mechanical polishing</subject><subject>Raman spectroscopy</subject><subject>Single crystals</subject><subject>Spectrum analysis</subject><subject>Surface layers</subject><issn>2079-6412</issn><issn>2079-6412</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNpdUE1Lw0AUXETBUnv3uOA5ul_ZuEep1gYKFokXL2GzH21Kmld3E6H_3i31IL7LG4Z5b5hB6JaSe84VeTCgh7bfREooo0zwCzRhpFCZFJRd_sHXaBbjjqRRlD9SNUGf1dbhNQyuH1rdYfB42W622aIbXW8cLqHHZQjatskgYQ8BrwMYF2Pyw7q3-N0Z-HbheLp9bvUeElcBdPEGXXndRTf73VP0sXip5sts9fZazp9WmWFSDlkunBCNZ9IWmrDGS6tyYURjtU1ZmPTaUJZ771XOcllIKwopjRIkl0w3wvIpujv_PQT4Gl0c6h2MoU-WNRMFTUkLRZKKnFUmQIzB-foQ2r0Ox5qS-lRi_b9E_gMR2WYj</recordid><startdate>2020</startdate><enddate>2020</enddate><creator>Borisov, Anatoly M.</creator><creator>Kazakov, Valery A.</creator><creator>Mashkova, Eugenia S.</creator><creator>Ovchinnikov, Mikhail A.</creator><creator>Grigoriev, Sergey N.</creator><creator>Suminov, Igor V.</creator><general>MDPI AG</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><orcidid>https://orcid.org/0000-0002-1163-5170</orcidid><orcidid>https://orcid.org/0000-0002-8239-5354</orcidid></search><sort><creationdate>2020</creationdate><title>The Potential of High-Fluence Ion Irradiation for Processing and Recovery of Diamond Tools</title><author>Borisov, Anatoly M. ; 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subjects | Argon Argon ions Atomic force microscopes Atomic force microscopy Carbon Computer simulation Diamond tools Diamonds Electrical resistivity Fluence Graphite Graphitization Ion implantation Ion irradiation Mechanical polishing Raman spectroscopy Single crystals Spectrum analysis Surface layers |
title | The Potential of High-Fluence Ion Irradiation for Processing and Recovery of Diamond Tools |
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